Measurement and modeling of silicon heterostructure devices:
Gespeichert in:
Weitere Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Boca Raton, Fla. [u.a.]
CRC Press
2008
|
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | Getr. Zählung |
ISBN: | 9781420066920 1420066927 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV035110682 | ||
003 | DE-604 | ||
005 | 20090409 | ||
007 | t | ||
008 | 081021s2008 |||| 00||| eng d | ||
020 | |a 9781420066920 |9 978-1-420-06692-0 | ||
020 | |a 1420066927 |c (hbk.) : £39.99 hbk. : £39.99 |9 1-420-06692-7 | ||
024 | 3 | |a 9781420066920 | |
035 | |a (OCoLC)159822421 | ||
035 | |a (DE-599)BSZ277978238 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-703 | ||
050 | 0 | |a TK7871.96.B55 | |
082 | 0 | |a 621.3815/2 |2 22 | |
084 | |a ZN 4850 |0 (DE-625)157413: |2 rvk | ||
245 | 1 | 0 | |a Measurement and modeling of silicon heterostructure devices |c ed. by John D. Cressler |
264 | 1 | |a Boca Raton, Fla. [u.a.] |b CRC Press |c 2008 | |
300 | |a Getr. Zählung | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Mathematisches Modell | |
650 | 4 | |a Bipolar transistors / Mathematical models | |
650 | 4 | |a Bipolar transistors | |
650 | 4 | |a Heterostructures | |
650 | 4 | |a Integrated circuits / Design and construction | |
700 | 1 | |a Cressler, John D. |d 1961- |0 (DE-588)140008055 |4 edt | |
856 | 4 | 2 | |m Digitalisierung UB Bayreuth |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016778511&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
999 | |a oai:aleph.bib-bvb.de:BVB01-016778511 |
Datensatz im Suchindex
_version_ | 1804138083148365824 |
---|---|
adam_text | Contents
1 The Big
Picture
............................................................................................................................1-І
John
D. Cressler
2
A Brief History of the Field
........................................................................................................2-1
John D. Cressler
3
Overview: Measurement and Modeling
.....................................................................................3-1
John D. Cressler
4
Best-Practice AC Measurement Techniques
...............................................................................4-1
Robert A. Groves
5
Industrial Application of TCAD for SiGe Development
..........................................................5-1
David C. Sheridan, Jeffrey B. Johnson, and Rajendran Krishnasamy
6
Compact Modeling of SiGe HBTs: HICUM
...............................................................................6-1
Michael
Schröter
7
Compact Modeling of SiGe HBTs: Mextram
.............................................................................7-1
Slobodan
Mijalković
8
CAD Tools and Design Kits
........................................................................................................8-1
Sue E.
Strang
9
Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs
....9-1
Raminderpal Singh
10
Transmission lines on Si
...........................................................................................................10-1
Youri
V. Tretiakov
11
Improved De-Embedding Techniques
......................................................................................11-1
Qingqing Liang
A.I Properties of Silicon and Germanium
...................................................................................
АЛ-І
John D. Cressler
A.2 The Generalized Moll-Ross Relations
....................................................................................
АЛ-І
John D. Cressler
A.3 Integral Charge-Control Relations
.........................................................................................
A.3-1
Michael
Schröter
A.4 Sample SiGe HBT Compact Model Parameters
.....................................................................
A.4-1
Ramana
M. Malladi
Index
.......................................................................................................................................................
II
|
adam_txt |
Contents
1 The Big
Picture
.1-І
John
D. Cressler
2
A Brief History of the Field
.2-1
John D. Cressler
3
Overview: Measurement and Modeling
.3-1
John D. Cressler
4
Best-Practice AC Measurement Techniques
.4-1
Robert A. Groves
5
Industrial Application of TCAD for SiGe Development
.5-1
David C. Sheridan, Jeffrey B. Johnson, and Rajendran Krishnasamy
6
Compact Modeling of SiGe HBTs: HICUM
.6-1
Michael
Schröter
7
Compact Modeling of SiGe HBTs: Mextram
.7-1
Slobodan
Mijalković
8
CAD Tools and Design Kits
.8-1
Sue E.
Strang
9
Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs
.9-1
Raminderpal Singh
10
Transmission lines on Si
.10-1
Youri
V. Tretiakov
11
Improved De-Embedding Techniques
.11-1
Qingqing Liang
A.I Properties of Silicon and Germanium
.
АЛ-І
John D. Cressler
A.2 The Generalized Moll-Ross Relations
.
АЛ-І
John D. Cressler
A.3 Integral Charge-Control Relations
.
A.3-1
Michael
Schröter
A.4 Sample SiGe HBT Compact Model Parameters
.
A.4-1
Ramana
M. Malladi
Index
.
II |
any_adam_object | 1 |
any_adam_object_boolean | 1 |
author2 | Cressler, John D. 1961- |
author2_role | edt |
author2_variant | j d c jd jdc |
author_GND | (DE-588)140008055 |
author_facet | Cressler, John D. 1961- |
building | Verbundindex |
bvnumber | BV035110682 |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871.96.B55 |
callnumber-search | TK7871.96.B55 |
callnumber-sort | TK 47871.96 B55 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ZN 4850 |
ctrlnum | (OCoLC)159822421 (DE-599)BSZ277978238 |
dewey-full | 621.3815/2 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815/2 |
dewey-search | 621.3815/2 |
dewey-sort | 3621.3815 12 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01446nam a2200385 c 4500</leader><controlfield tag="001">BV035110682</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090409 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">081021s2008 |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781420066920</subfield><subfield code="9">978-1-420-06692-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1420066927</subfield><subfield code="c">(hbk.) : £39.99 hbk. : £39.99</subfield><subfield code="9">1-420-06692-7</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9781420066920</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)159822421</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BSZ277978238</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.96.B55</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4850</subfield><subfield code="0">(DE-625)157413:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Measurement and modeling of silicon heterostructure devices</subfield><subfield code="c">ed. by John D. Cressler</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton, Fla. [u.a.]</subfield><subfield code="b">CRC Press</subfield><subfield code="c">2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">Getr. Zählung</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mathematisches Modell</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Bipolar transistors / Mathematical models</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Bipolar transistors</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Heterostructures</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits / Design and construction</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Cressler, John D.</subfield><subfield code="d">1961-</subfield><subfield code="0">(DE-588)140008055</subfield><subfield code="4">edt</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bayreuth</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016778511&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-016778511</subfield></datafield></record></collection> |
id | DE-604.BV035110682 |
illustrated | Not Illustrated |
index_date | 2024-07-02T22:17:22Z |
indexdate | 2024-07-09T21:22:33Z |
institution | BVB |
isbn | 9781420066920 1420066927 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-016778511 |
oclc_num | 159822421 |
open_access_boolean | |
owner | DE-703 |
owner_facet | DE-703 |
physical | Getr. Zählung |
publishDate | 2008 |
publishDateSearch | 2008 |
publishDateSort | 2008 |
publisher | CRC Press |
record_format | marc |
spelling | Measurement and modeling of silicon heterostructure devices ed. by John D. Cressler Boca Raton, Fla. [u.a.] CRC Press 2008 Getr. Zählung txt rdacontent n rdamedia nc rdacarrier Mathematisches Modell Bipolar transistors / Mathematical models Bipolar transistors Heterostructures Integrated circuits / Design and construction Cressler, John D. 1961- (DE-588)140008055 edt Digitalisierung UB Bayreuth application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016778511&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Measurement and modeling of silicon heterostructure devices Mathematisches Modell Bipolar transistors / Mathematical models Bipolar transistors Heterostructures Integrated circuits / Design and construction |
title | Measurement and modeling of silicon heterostructure devices |
title_auth | Measurement and modeling of silicon heterostructure devices |
title_exact_search | Measurement and modeling of silicon heterostructure devices |
title_exact_search_txtP | Measurement and modeling of silicon heterostructure devices |
title_full | Measurement and modeling of silicon heterostructure devices ed. by John D. Cressler |
title_fullStr | Measurement and modeling of silicon heterostructure devices ed. by John D. Cressler |
title_full_unstemmed | Measurement and modeling of silicon heterostructure devices ed. by John D. Cressler |
title_short | Measurement and modeling of silicon heterostructure devices |
title_sort | measurement and modeling of silicon heterostructure devices |
topic | Mathematisches Modell Bipolar transistors / Mathematical models Bipolar transistors Heterostructures Integrated circuits / Design and construction |
topic_facet | Mathematisches Modell Bipolar transistors / Mathematical models Bipolar transistors Heterostructures Integrated circuits / Design and construction |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=016778511&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT cresslerjohnd measurementandmodelingofsiliconheterostructuredevices |