APA-Zitierstil (7. Ausg.)

Cressler, J. D. (2008). Measurement and modeling of silicon heterostructure devices. CRC Press.

Chicago-Zitierstil (17. Ausg.)

Cressler, John D. Measurement and Modeling of Silicon Heterostructure Devices. Boca Raton, Fla. [u.a.]: CRC Press, 2008.

MLA-Zitierstil (9. Ausg.)

Cressler, John D. Measurement and Modeling of Silicon Heterostructure Devices. CRC Press, 2008.