Defect oriented testing for CMOS analog and digital circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston [u.a.]
Kluwer
1998
|
| Schriftenreihe: | Frontiers in electronic testing
10 |
| Schlagworte: | |
| Beschreibung: | XIV, 308 S. graph. Darst. |
| ISBN: | 0792380835 |
Internformat
MARC
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| 008 | 990720s1998 d||| |||| 00||| eng d | ||
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| 035 | |a (OCoLC)37862692 | ||
| 035 | |a (DE-599)BVBBV012669837 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
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| 100 | 1 | |a Sachdev, Manoj |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Defect oriented testing for CMOS analog and digital circuits |c by Manoj Sachdev |
| 264 | 1 | |a Boston [u.a.] |b Kluwer |c 1998 | |
| 300 | |a XIV, 308 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Frontiers in electronic testing |v 10 | |
| 650 | 4 | |a Digital integrated circuits |x Testing | |
| 650 | 4 | |a Linear integrated circuits |x Testing | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Defects | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Testing | |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a CMOS-Schaltung |0 (DE-588)4148111-2 |D s |
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| 830 | 0 | |a Frontiers in electronic testing |v 10 |w (DE-604)BV010836129 |9 10 | |
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Datensatz im Suchindex
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| author | Sachdev, Manoj |
| author_facet | Sachdev, Manoj |
| author_role | aut |
| author_sort | Sachdev, Manoj |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)37862692 (DE-599)BVBBV012669837 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV012669837 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:31:38Z |
| institution | BVB |
| isbn | 0792380835 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008610334 |
| oclc_num | 37862692 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XIV, 308 S. graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Kluwer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Sachdev, Manoj Verfasser aut Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev Boston [u.a.] Kluwer 1998 XIV, 308 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 10 Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen (DE-588)4367264-4 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 s Testen (DE-588)4367264-4 s DE-604 Frontiers in electronic testing 10 (DE-604)BV010836129 10 |
| spellingShingle | Sachdev, Manoj Defect oriented testing for CMOS analog and digital circuits Frontiers in electronic testing Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen (DE-588)4367264-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4148111-2 |
| title | Defect oriented testing for CMOS analog and digital circuits |
| title_auth | Defect oriented testing for CMOS analog and digital circuits |
| title_exact_search | Defect oriented testing for CMOS analog and digital circuits |
| title_full | Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev |
| title_fullStr | Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev |
| title_full_unstemmed | Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev |
| title_short | Defect oriented testing for CMOS analog and digital circuits |
| title_sort | defect oriented testing for cmos analog and digital circuits |
| topic | Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen (DE-588)4367264-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| topic_facet | Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen CMOS-Schaltung |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT sachdevmanoj defectorientedtestingforcmosanaloganddigitalcircuits |