Defect oriented testing for CMOS analog and digital circuits:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Boston [u.a.]
Kluwer
1998
|
| Series: | Frontiers in electronic testing
10 |
| Subjects: | |
| Physical Description: | XIV, 308 S. graph. Darst. |
| ISBN: | 0792380835 |
Staff View
MARC
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| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Testing | |
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Record in the Search Index
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| author | Sachdev, Manoj |
| author_facet | Sachdev, Manoj |
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| dewey-full | 621.3815 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV012669837 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:31:38Z |
| institution | BVB |
| isbn | 0792380835 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008610334 |
| oclc_num | 37862692 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XIV, 308 S. graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Kluwer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Sachdev, Manoj Verfasser aut Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev Boston [u.a.] Kluwer 1998 XIV, 308 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 10 Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen (DE-588)4367264-4 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 s Testen (DE-588)4367264-4 s DE-604 Frontiers in electronic testing 10 (DE-604)BV010836129 10 |
| spellingShingle | Sachdev, Manoj Defect oriented testing for CMOS analog and digital circuits Frontiers in electronic testing Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen (DE-588)4367264-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4148111-2 |
| title | Defect oriented testing for CMOS analog and digital circuits |
| title_auth | Defect oriented testing for CMOS analog and digital circuits |
| title_exact_search | Defect oriented testing for CMOS analog and digital circuits |
| title_full | Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev |
| title_fullStr | Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev |
| title_full_unstemmed | Defect oriented testing for CMOS analog and digital circuits by Manoj Sachdev |
| title_short | Defect oriented testing for CMOS analog and digital circuits |
| title_sort | defect oriented testing for cmos analog and digital circuits |
| topic | Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen (DE-588)4367264-4 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| topic_facet | Digital integrated circuits Testing Linear integrated circuits Testing Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Testing Testen CMOS-Schaltung |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT sachdevmanoj defectorientedtestingforcmosanaloganddigitalcircuits |