APA (7th ed.) Citation

Sachdev, M. (1998). Defect oriented testing for CMOS analog and digital circuits. Kluwer.

Chicago Style (17th ed.) Citation

Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Boston [u.a.]: Kluwer, 1998.

MLA (9th ed.) Citation

Sachdev, Manoj. Defect Oriented Testing for CMOS Analog and Digital Circuits. Kluwer, 1998.

Warning: These citations may not always be 100% accurate.