Testability concepts for digital ICs: the macro test approach
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Dordrecht [u.a.]
Kluwer
1995
|
| Schriftenreihe: | Frontiers in electronic testing
3 |
| Schlagworte: | |
| Beschreibung: | IX, 212 S. graph. Darst. |
| ISBN: | 0792396588 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV010836140 | ||
| 003 | DE-604 | ||
| 005 | 19970218 | ||
| 007 | t | ||
| 008 | 960708s1995 d||| |||| 00||| eng d | ||
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| 035 | |a (OCoLC)33244425 | ||
| 035 | |a (DE-599)BVBBV010836140 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-91 | ||
| 050 | 0 | |a TK7874.65 | |
| 082 | 0 | |a 621.3815/48 |2 20 | |
| 084 | |a ELT 359f |2 stub | ||
| 100 | 1 | |a Beenker, Frans P. M. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Testability concepts for digital ICs |b the macro test approach |c by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| 264 | 1 | |a Dordrecht [u.a.] |b Kluwer |c 1995 | |
| 300 | |a IX, 212 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Frontiers in electronic testing |v 3 | |
| 650 | 4 | |a Automatic test equipment | |
| 650 | 4 | |a Digital integrated circuits |x Testing | |
| 650 | 0 | 7 | |a Testbarkeit |0 (DE-588)4271826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |a Digitaler integrierter Schaltkreis |2 gnd |9 rswk-swf | |
| 689 | 0 | 0 | |a Digitaler integrierter Schaltkreis |A f |
| 689 | 0 | 1 | |a Testbarkeit |0 (DE-588)4271826-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |D s |
| 689 | 1 | 1 | |a Testbarkeit |0 (DE-588)4271826-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Bennetts, R. G. |e Verfasser |4 aut | |
| 700 | 1 | |a Thijssen, A. P. |e Verfasser |4 aut | |
| 830 | 0 | |a Frontiers in electronic testing |v 3 |w (DE-604)BV010836129 |9 3 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007243086 | ||
Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Beenker, Frans P. M. Bennetts, R. G. Thijssen, A. P. |
| author_facet | Beenker, Frans P. M. Bennetts, R. G. Thijssen, A. P. |
| author_role | aut aut aut |
| author_sort | Beenker, Frans P. M. |
| author_variant | f p m b fpm fpmb r g b rg rgb a p t ap apt |
| building | Verbundindex |
| bvnumber | BV010836140 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874.65 |
| callnumber-search | TK7874.65 |
| callnumber-sort | TK 47874.65 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 359f |
| ctrlnum | (OCoLC)33244425 (DE-599)BVBBV010836140 |
| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| genre | Digitaler integrierter Schaltkreis gnd |
| genre_facet | Digitaler integrierter Schaltkreis |
| id | DE-604.BV010836140 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:59:44Z |
| institution | BVB |
| isbn | 0792396588 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007243086 |
| oclc_num | 33244425 |
| open_access_boolean | |
| owner | DE-29T DE-91 DE-BY-TUM |
| owner_facet | DE-29T DE-91 DE-BY-TUM |
| physical | IX, 212 S. graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Kluwer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Beenker, Frans P. M. Verfasser aut Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen Dordrecht [u.a.] Kluwer 1995 IX, 212 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 3 Automatic test equipment Digital integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf Digitaler integrierter Schaltkreis gnd rswk-swf Digitaler integrierter Schaltkreis f Testbarkeit (DE-588)4271826-0 s DE-604 Digitale integrierte Schaltung (DE-588)4113313-4 s Bennetts, R. G. Verfasser aut Thijssen, A. P. Verfasser aut Frontiers in electronic testing 3 (DE-604)BV010836129 3 |
| spellingShingle | Beenker, Frans P. M. Bennetts, R. G. Thijssen, A. P. Testability concepts for digital ICs the macro test approach Frontiers in electronic testing Automatic test equipment Digital integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| subject_GND | (DE-588)4271826-0 (DE-588)4113313-4 |
| title | Testability concepts for digital ICs the macro test approach |
| title_auth | Testability concepts for digital ICs the macro test approach |
| title_exact_search | Testability concepts for digital ICs the macro test approach |
| title_full | Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| title_fullStr | Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| title_full_unstemmed | Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| title_short | Testability concepts for digital ICs |
| title_sort | testability concepts for digital ics the macro test approach |
| title_sub | the macro test approach |
| topic | Automatic test equipment Digital integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| topic_facet | Automatic test equipment Digital integrated circuits Testing Testbarkeit Digitale integrierte Schaltung Digitaler integrierter Schaltkreis |
| volume_link | (DE-604)BV010836129 |
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