Testability concepts for digital ICs: the macro test approach
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| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Dordrecht [u.a.]
Kluwer
1995
|
| Series: | Frontiers in electronic testing
3 |
| Subjects: | |
| Physical Description: | IX, 212 S. graph. Darst. |
| ISBN: | 0792396588 |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV010836140 | ||
| 003 | DE-604 | ||
| 005 | 19970218 | ||
| 007 | t | ||
| 008 | 960708s1995 d||| |||| 00||| eng d | ||
| 020 | |a 0792396588 |9 0-7923-9658-8 | ||
| 035 | |a (OCoLC)33244425 | ||
| 035 | |a (DE-599)BVBBV010836140 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-91 | ||
| 050 | 0 | |a TK7874.65 | |
| 082 | 0 | |a 621.3815/48 |2 20 | |
| 084 | |a ELT 359f |2 stub | ||
| 100 | 1 | |a Beenker, Frans P. M. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Testability concepts for digital ICs |b the macro test approach |c by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| 264 | 1 | |a Dordrecht [u.a.] |b Kluwer |c 1995 | |
| 300 | |a IX, 212 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Frontiers in electronic testing |v 3 | |
| 650 | 4 | |a Automatic test equipment | |
| 650 | 4 | |a Digital integrated circuits |x Testing | |
| 650 | 0 | 7 | |a Testbarkeit |0 (DE-588)4271826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |a Digitaler integrierter Schaltkreis |2 gnd |9 rswk-swf | |
| 689 | 0 | 0 | |a Digitaler integrierter Schaltkreis |A f |
| 689 | 0 | 1 | |a Testbarkeit |0 (DE-588)4271826-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |D s |
| 689 | 1 | 1 | |a Testbarkeit |0 (DE-588)4271826-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Bennetts, R. G. |e Verfasser |4 aut | |
| 700 | 1 | |a Thijssen, A. P. |e Verfasser |4 aut | |
| 830 | 0 | |a Frontiers in electronic testing |v 3 |w (DE-604)BV010836129 |9 3 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007243086 | ||
Record in the Search Index
| _version_ | 1804125323118247936 |
|---|---|
| any_adam_object | |
| author | Beenker, Frans P. M. Bennetts, R. G. Thijssen, A. P. |
| author_facet | Beenker, Frans P. M. Bennetts, R. G. Thijssen, A. P. |
| author_role | aut aut aut |
| author_sort | Beenker, Frans P. M. |
| author_variant | f p m b fpm fpmb r g b rg rgb a p t ap apt |
| building | Verbundindex |
| bvnumber | BV010836140 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874.65 |
| callnumber-search | TK7874.65 |
| callnumber-sort | TK 47874.65 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 359f |
| ctrlnum | (OCoLC)33244425 (DE-599)BVBBV010836140 |
| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01667nam a2200469 cb4500</leader><controlfield tag="001">BV010836140</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19970218 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">960708s1995 d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0792396588</subfield><subfield code="9">0-7923-9658-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)33244425</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV010836140</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-91</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874.65</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/48</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 359f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Beenker, Frans P. M.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Testability concepts for digital ICs</subfield><subfield code="b">the macro test approach</subfield><subfield code="c">by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Dordrecht [u.a.]</subfield><subfield code="b">Kluwer</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 212 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">3</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Automatic test equipment</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Digital integrated circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testbarkeit</subfield><subfield code="0">(DE-588)4271826-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Digitale integrierte Schaltung</subfield><subfield code="0">(DE-588)4113313-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="a">Digitaler integrierter Schaltkreis</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Digitaler integrierter Schaltkreis</subfield><subfield code="A">f</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testbarkeit</subfield><subfield code="0">(DE-588)4271826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Digitale integrierte Schaltung</subfield><subfield code="0">(DE-588)4113313-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Testbarkeit</subfield><subfield code="0">(DE-588)4271826-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bennetts, R. G.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Thijssen, A. P.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Frontiers in electronic testing</subfield><subfield code="v">3</subfield><subfield code="w">(DE-604)BV010836129</subfield><subfield code="9">3</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007243086</subfield></datafield></record></collection> |
| genre | Digitaler integrierter Schaltkreis gnd |
| genre_facet | Digitaler integrierter Schaltkreis |
| id | DE-604.BV010836140 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:59:44Z |
| institution | BVB |
| isbn | 0792396588 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007243086 |
| oclc_num | 33244425 |
| open_access_boolean | |
| owner | DE-29T DE-91 DE-BY-TUM |
| owner_facet | DE-29T DE-91 DE-BY-TUM |
| physical | IX, 212 S. graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Kluwer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Beenker, Frans P. M. Verfasser aut Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen Dordrecht [u.a.] Kluwer 1995 IX, 212 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 3 Automatic test equipment Digital integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf Digitaler integrierter Schaltkreis gnd rswk-swf Digitaler integrierter Schaltkreis f Testbarkeit (DE-588)4271826-0 s DE-604 Digitale integrierte Schaltung (DE-588)4113313-4 s Bennetts, R. G. Verfasser aut Thijssen, A. P. Verfasser aut Frontiers in electronic testing 3 (DE-604)BV010836129 3 |
| spellingShingle | Beenker, Frans P. M. Bennetts, R. G. Thijssen, A. P. Testability concepts for digital ICs the macro test approach Frontiers in electronic testing Automatic test equipment Digital integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| subject_GND | (DE-588)4271826-0 (DE-588)4113313-4 |
| title | Testability concepts for digital ICs the macro test approach |
| title_auth | Testability concepts for digital ICs the macro test approach |
| title_exact_search | Testability concepts for digital ICs the macro test approach |
| title_full | Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| title_fullStr | Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| title_full_unstemmed | Testability concepts for digital ICs the macro test approach by F. P. M. Beenker, R. G. Bennetts and A. P. Thijssen |
| title_short | Testability concepts for digital ICs |
| title_sort | testability concepts for digital ics the macro test approach |
| title_sub | the macro test approach |
| topic | Automatic test equipment Digital integrated circuits Testing Testbarkeit (DE-588)4271826-0 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| topic_facet | Automatic test equipment Digital integrated circuits Testing Testbarkeit Digitale integrierte Schaltung Digitaler integrierter Schaltkreis |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT beenkerfranspm testabilityconceptsfordigitalicsthemacrotestapproach AT bennettsrg testabilityconceptsfordigitalicsthemacrotestapproach AT thijssenap testabilityconceptsfordigitalicsthemacrotestapproach |