Semiconductor memories: technology, testing, and reliability
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Piscataway, New Jersey
IEEE Press
c1997
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| Subjects: | |
| Online Access: | FHI01 FHN01 Volltext |
| Item Description: | "IEEE order number: PC3491"--P. [4] cover. - "IEEE Solid-State Circuits Council, sponsor." Description based on PDF viewed 12/21/2015 |
| Physical Description: | 1 Online-Resource (xii, 462 pages) illustrations |
| ISBN: | 9780470546406 |
Staff View
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Record in the Search Index
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV046418251 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:44:05Z |
| institution | BVB |
| isbn | 9780470546406 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031830723 |
| oclc_num | 1141158399 |
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| physical | 1 Online-Resource (xii, 462 pages) illustrations |
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| publishDate | 1997 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | IEEE Press |
| record_format | marc |
| spelling | Sharma, Ashok K. Verfasser aut Semiconductor memories technology, testing, and reliability Ashok K. Sharma Piscataway, New Jersey IEEE Press c1997 1 Online-Resource (xii, 462 pages) illustrations txt rdacontent c rdamedia cr rdacarrier "IEEE order number: PC3491"--P. [4] cover. - "IEEE Solid-State Circuits Council, sponsor." Description based on PDF viewed 12/21/2015 Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd rswk-swf Halbleiterspeicher (DE-588)4120419-0 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 9780780310001 https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189 Aggregator URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Sharma, Ashok K. Semiconductor memories technology, testing, and reliability Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd |
| subject_GND | (DE-588)4120419-0 |
| title | Semiconductor memories technology, testing, and reliability |
| title_auth | Semiconductor memories technology, testing, and reliability |
| title_exact_search | Semiconductor memories technology, testing, and reliability |
| title_full | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_fullStr | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_full_unstemmed | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_short | Semiconductor memories |
| title_sort | semiconductor memories technology testing and reliability |
| title_sub | technology, testing, and reliability |
| topic | Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd |
| topic_facet | Semiconductor storage devices Halbleiterspeicher |
| url | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189 |
| work_keys_str_mv | AT sharmaashokk semiconductormemoriestechnologytestingandreliability |