Semiconductor memories: technology, testing, and reliability
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Piscataway, New Jersey
IEEE Press
c1997
|
| Schlagworte: | |
| Online-Zugang: | FHI01 FHN01 Volltext |
| Beschreibung: | "IEEE order number: PC3491"--P. [4] cover. - "IEEE Solid-State Circuits Council, sponsor." Description based on PDF viewed 12/21/2015 |
| Beschreibung: | 1 Online-Resource (xii, 462 pages) illustrations |
| ISBN: | 9780470546406 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV046418251 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 200211s2002 |||| o||u| ||||||eng d | ||
| 020 | |a 9780470546406 |9 978-0-470-54640-6 | ||
| 024 | 7 | |a 10.1109/9780470546406 |2 doi | |
| 035 | |a (ZDB-35-WEL)5264189 | ||
| 035 | |a (OCoLC)1141158399 | ||
| 035 | |a (DE-599)BVBBV046418251 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-573 |a DE-92 | ||
| 082 | 0 | |a 621.39/732 |2 22 | |
| 084 | |a ZN 5640 |0 (DE-625)157473: |2 rvk | ||
| 100 | 1 | |a Sharma, Ashok K. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Semiconductor memories |b technology, testing, and reliability |c Ashok K. Sharma |
| 264 | 1 | |a Piscataway, New Jersey |b IEEE Press |c c1997 | |
| 300 | |a 1 Online-Resource (xii, 462 pages) |b illustrations | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a "IEEE order number: PC3491"--P. [4] cover. - "IEEE Solid-State Circuits Council, sponsor." | ||
| 500 | |a Description based on PDF viewed 12/21/2015 | ||
| 650 | 4 | |a Semiconductor storage devices | |
| 650 | 0 | 7 | |a Halbleiterspeicher |0 (DE-588)4120419-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterspeicher |0 (DE-588)4120419-0 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9780780310001 |
| 856 | 4 | 0 | |u https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189 |x Aggregator |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-35-WEL | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-031830723 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189 |l FHI01 |p ZDB-35-WEL |x Aggregator |3 Volltext | |
| 966 | e | |u https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189 |l FHN01 |p ZDB-35-WEL |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804180961475166208 |
|---|---|
| any_adam_object | |
| author | Sharma, Ashok K. |
| author_facet | Sharma, Ashok K. |
| author_role | aut |
| author_sort | Sharma, Ashok K. |
| author_variant | a k s ak aks |
| building | Verbundindex |
| bvnumber | BV046418251 |
| classification_rvk | ZN 5640 |
| collection | ZDB-35-WEL |
| ctrlnum | (ZDB-35-WEL)5264189 (OCoLC)1141158399 (DE-599)BVBBV046418251 |
| dewey-full | 621.39/732 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/732 |
| dewey-search | 621.39/732 |
| dewey-sort | 3621.39 3732 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01866nmm a2200445zc 4500</leader><controlfield tag="001">BV046418251</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">200211s2002 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780470546406</subfield><subfield code="9">978-0-470-54640-6</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/9780470546406</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-35-WEL)5264189</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1141158399</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV046418251</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-573</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/732</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5640</subfield><subfield code="0">(DE-625)157473:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sharma, Ashok K.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Semiconductor memories</subfield><subfield code="b">technology, testing, and reliability</subfield><subfield code="c">Ashok K. Sharma</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Piscataway, New Jersey</subfield><subfield code="b">IEEE Press</subfield><subfield code="c">c1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Resource (xii, 462 pages)</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">"IEEE order number: PC3491"--P. [4] cover. - "IEEE Solid-State Circuits Council, sponsor."</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on PDF viewed 12/21/2015</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor storage devices</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterspeicher</subfield><subfield code="0">(DE-588)4120419-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterspeicher</subfield><subfield code="0">(DE-588)4120419-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9780780310001</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</subfield><subfield code="x">Aggregator</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-35-WEL</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-031830723</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-35-WEL</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-35-WEL</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV046418251 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T08:44:05Z |
| institution | BVB |
| isbn | 9780470546406 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-031830723 |
| oclc_num | 1141158399 |
| open_access_boolean | |
| owner | DE-573 DE-92 |
| owner_facet | DE-573 DE-92 |
| physical | 1 Online-Resource (xii, 462 pages) illustrations |
| psigel | ZDB-35-WEL |
| publishDate | 1997 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | IEEE Press |
| record_format | marc |
| spelling | Sharma, Ashok K. Verfasser aut Semiconductor memories technology, testing, and reliability Ashok K. Sharma Piscataway, New Jersey IEEE Press c1997 1 Online-Resource (xii, 462 pages) illustrations txt rdacontent c rdamedia cr rdacarrier "IEEE order number: PC3491"--P. [4] cover. - "IEEE Solid-State Circuits Council, sponsor." Description based on PDF viewed 12/21/2015 Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd rswk-swf Halbleiterspeicher (DE-588)4120419-0 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 9780780310001 https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189 Aggregator URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Sharma, Ashok K. Semiconductor memories technology, testing, and reliability Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd |
| subject_GND | (DE-588)4120419-0 |
| title | Semiconductor memories technology, testing, and reliability |
| title_auth | Semiconductor memories technology, testing, and reliability |
| title_exact_search | Semiconductor memories technology, testing, and reliability |
| title_full | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_fullStr | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_full_unstemmed | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_short | Semiconductor memories |
| title_sort | semiconductor memories technology testing and reliability |
| title_sub | technology, testing, and reliability |
| topic | Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd |
| topic_facet | Semiconductor storage devices Halbleiterspeicher |
| url | https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189 |
| work_keys_str_mv | AT sharmaashokk semiconductormemoriestechnologytestingandreliability |