Holdings: Scanning electron microscopy and x-ray microanalysis

Scanning electron microscopy and x-ray microanalysis:

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Bibliographic Details
Main Authors:	Goldstein, Joseph 1939-2015 (Author), Newbury, Dale E. (Author), Michael, Joseph R. (Author), Ritchie, Nicholas W. M. (Author), Scott, John Henry J. (Author), Joy, David C. 1943- (Author)
Format:	Electronic eBook
Language:	English
Published:	New York Springer [2018]
Edition:	Forth edition
Subjects:	Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie Rasterelektronenmikroskopie
Online Access:	DE-634 DE-91 DE-19 Volltext
Physical Description:	1 Online-Ressource (XXIII, 550 Seiten) Illustrationen, Diagramme (überwiegend farbig)
ISBN:	9781493966769
DOI:	10.1007/978-1-4939-6676-9

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MARC


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author	Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943-
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discipline	Chemie / Pharmazie Physik Chemie Medizin
doi_str_mv	10.1007/978-1-4939-6676-9
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spelling	Goldstein, Joseph 1939-2015 Verfasser (DE-588)1023852381 aut Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy Forth edition New York Springer [2018] © 2018 1 Online-Ressource (XXIII, 550 Seiten) Illustrationen, Diagramme (überwiegend farbig) txt rdacontent c rdamedia cr rdacarrier Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s 1\p DE-604 Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s 2\p DE-604 Newbury, Dale E. aut Michael, Joseph R. aut Ritchie, Nicholas W. M. aut Scott, John Henry J. aut Joy, David C. 1943- Verfasser (DE-588)17217242X aut Erscheint auch als Druck-Ausgabe 978-1-4939-6674-5 https://doi.org/10.1007/978-1-4939-6676-9 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- Scanning electron microscopy and x-ray microanalysis Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd
subject_GND	(DE-588)4065579-9 (DE-588)4151898-6 (DE-588)4320991-9 (DE-588)4048455-5
title	Scanning electron microscopy and x-ray microanalysis
title_auth	Scanning electron microscopy and x-ray microanalysis
title_exact_search	Scanning electron microscopy and x-ray microanalysis
title_full	Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy
title_fullStr	Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy
title_full_unstemmed	Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy
title_short	Scanning electron microscopy and x-ray microanalysis
title_sort	scanning electron microscopy and x ray microanalysis
topic	Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd
topic_facet	Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie Rasterelektronenmikroskopie
url	https://doi.org/10.1007/978-1-4939-6676-9
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