Scanning electron microscopy and x-ray microanalysis:
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Springer
[2018]
|
| Ausgabe: | Forth edition |
| Schlagworte: | |
| Online-Zugang: | BTU01 TUM01 UBM01 Volltext |
| Beschreibung: | 1 Online-Ressource (XXIII, 550 Seiten) Illustrationen, Diagramme (überwiegend farbig) |
| ISBN: | 9781493966769 |
| DOI: | 10.1007/978-1-4939-6676-9 |
Internformat
MARC
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| 100 | 1 | |a Goldstein, Joseph |d 1939-2015 |e Verfasser |0 (DE-588)1023852381 |4 aut | |
| 245 | 1 | 0 | |a Scanning electron microscopy and x-ray microanalysis |c Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
| 250 | |a Forth edition | ||
| 264 | 1 | |a New York |b Springer |c [2018] | |
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| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Physical measurements | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Materials Science | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Biological Microscopy | |
| 650 | 4 | |a Spectroscopy/Spectrometry | |
| 650 | 4 | |a Measurement Science and Instrumentation | |
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| 700 | 1 | |a Newbury, Dale E. |4 aut | |
| 700 | 1 | |a Michael, Joseph R. |4 aut | |
| 700 | 1 | |a Ritchie, Nicholas W. M. |4 aut | |
| 700 | 1 | |a Scott, John Henry J. |4 aut | |
| 700 | 1 | |a Joy, David C. |d 1943- |e Verfasser |0 (DE-588)17217242X |4 aut | |
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Datensatz im Suchindex
| _version_ | 1804178176098697216 |
|---|---|
| any_adam_object | |
| author | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- |
| author_GND | (DE-588)1023852381 (DE-588)17217242X |
| author_facet | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- |
| author_role | aut aut aut aut aut aut |
| author_sort | Goldstein, Joseph 1939-2015 |
| author_variant | j g jg d e n de den j r m jr jrm n w m r nwm nwmr j h j s jhj jhjs d c j dc dcj |
| building | Verbundindex |
| bvnumber | BV044703143 |
| classification_rvk | UH 6310 UH 6320 VG 9900 |
| classification_tum | PHY 135f CHE 264f CHE 000 |
| collection | ZDB-2-CMS ZDB-30-PQE |
| ctrlnum | (ZDB-2-CMS)9781493966769 (OCoLC)1018460912 (DE-599)BVBBV044703143 |
| dewey-full | 620.11 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.11 |
| dewey-search | 620.11 |
| dewey-sort | 3620.11 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie / Pharmazie Physik Chemie |
| doi_str_mv | 10.1007/978-1-4939-6676-9 |
| edition | Forth edition |
| format | Electronic eBook |
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| id | DE-604.BV044703143 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:59:48Z |
| institution | BVB |
| isbn | 9781493966769 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030099815 |
| oclc_num | 1018460912 |
| open_access_boolean | |
| owner | DE-634 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-11 DE-83 |
| owner_facet | DE-634 DE-91 DE-BY-TUM DE-19 DE-BY-UBM DE-11 DE-83 |
| physical | 1 Online-Ressource (XXIII, 550 Seiten) Illustrationen, Diagramme (überwiegend farbig) |
| psigel | ZDB-2-CMS ZDB-30-PQE ZDB-2-CMS_2018 ZDB-30-PQE UBM_Einzelkauf20 |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| spelling | Goldstein, Joseph 1939-2015 Verfasser (DE-588)1023852381 aut Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy Forth edition New York Springer [2018] © 2018 1 Online-Ressource (XXIII, 550 Seiten) Illustrationen, Diagramme (überwiegend farbig) txt rdacontent c rdamedia cr rdacarrier Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Werkstoff (DE-588)4065579-9 s 1\p DE-604 Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 s 2\p DE-604 Newbury, Dale E. aut Michael, Joseph R. aut Ritchie, Nicholas W. M. aut Scott, John Henry J. aut Joy, David C. 1943- Verfasser (DE-588)17217242X aut Erscheint auch als Druck-Ausgabe 978-1-4939-6674-5 https://doi.org/10.1007/978-1-4939-6676-9 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Goldstein, Joseph 1939-2015 Newbury, Dale E. Michael, Joseph R. Ritchie, Nicholas W. M. Scott, John Henry J. Joy, David C. 1943- Scanning electron microscopy and x-ray microanalysis Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd |
| subject_GND | (DE-588)4065579-9 (DE-588)4048455-5 (DE-588)4151898-6 (DE-588)4320991-9 |
| title | Scanning electron microscopy and x-ray microanalysis |
| title_auth | Scanning electron microscopy and x-ray microanalysis |
| title_exact_search | Scanning electron microscopy and x-ray microanalysis |
| title_full | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
| title_fullStr | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
| title_full_unstemmed | Scanning electron microscopy and x-ray microanalysis Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W. M. Ritchie, John Henry J. Scott, David C. Joy |
| title_short | Scanning electron microscopy and x-ray microanalysis |
| title_sort | scanning electron microscopy and x ray microanalysis |
| topic | Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff (DE-588)4065579-9 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Raster-Transmissions-Elektronenmikroskopie (DE-588)4320991-9 gnd |
| topic_facet | Materials science Spectroscopy Microscopy Physical measurements Measurement Materials Science Characterization and Evaluation of Materials Spectroscopy and Microscopy Biological Microscopy Spectroscopy/Spectrometry Measurement Science and Instrumentation Werkstoff Rasterelektronenmikroskopie Elektronenstrahlmikroanalyse Raster-Transmissions-Elektronenmikroskopie |
| url | https://doi.org/10.1007/978-1-4939-6676-9 |
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