transmission electron microscopy: physics of image formation and microanalysis
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1989
|
| Ausgabe: | Second Edition |
| Schriftenreihe: | Springer Series in Optical Sciences
36 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy |
| Beschreibung: | 1 Online-Ressource (XIII, 547 p) |
| ISBN: | 9783662215791 9783540504993 |
| DOI: | 10.1007/978-3-662-21579-1 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV042414637 | ||
| 003 | DE-604 | ||
| 005 | 20220121 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 150316s1989 |||| o||u| ||||||eng d | ||
| 020 | |a 9783662215791 |c Online |9 978-3-662-21579-1 | ||
| 020 | |a 9783540504993 |c Print |9 978-3-540-50499-3 | ||
| 024 | 7 | |a 10.1007/978-3-662-21579-1 |2 doi | |
| 035 | |a (OCoLC)860048655 | ||
| 035 | |a (DE-599)BVBBV042414637 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 082 | 0 | |a 530.41 |2 23 | |
| 084 | |a UH 5100 |0 (DE-625)145654: |2 rvk | ||
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 084 | |a PHY 000 |2 stub | ||
| 084 | |a PHY 135f |2 stub | ||
| 100 | 1 | |a Reimer, Ludwig |d 1928- |e Verfasser |0 (DE-588)13230130X |4 aut | |
| 245 | 1 | 0 | |a transmission electron microscopy |b physics of image formation and microanalysis |c Ludwig Reimer |
| 250 | |a Second Edition | ||
| 264 | 1 | |a Berlin, Heidelberg |b Springer Berlin Heidelberg |c 1989 | |
| 300 | |a 1 Online-Ressource (XIII, 547 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a Springer Series in Optical Sciences |v 36 | |
| 500 | |a The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy | ||
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Solid State Physics | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Biophysics and Biological Physics | |
| 650 | 0 | 7 | |a Kristallstruktur |0 (DE-588)4136176-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Beugung |0 (DE-588)4145094-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroanalyse |0 (DE-588)4169804-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektron |0 (DE-588)4125978-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Physik |0 (DE-588)4045956-1 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Elektron |0 (DE-588)4125978-6 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 689 | 2 | 0 | |a Physik |0 (DE-588)4045956-1 |D s |
| 689 | 2 | |8 2\p |5 DE-604 | |
| 689 | 3 | 0 | |a Beugung |0 (DE-588)4145094-2 |D s |
| 689 | 3 | |8 3\p |5 DE-604 | |
| 689 | 4 | 0 | |a Mikroanalyse |0 (DE-588)4169804-6 |D s |
| 689 | 4 | |8 4\p |5 DE-604 | |
| 689 | 5 | 0 | |a Kristallstruktur |0 (DE-588)4136176-3 |D s |
| 689 | 5 | |8 5\p |5 DE-604 | |
| 689 | 6 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 6 | |8 6\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 3-540-50499-0 |
| 830 | 0 | |a Springer Series in Optical Sciences |v 36 |w (DE-604)BV000000237 |9 36 | |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-662-21579-1 |x Verlag |3 Volltext |
| 912 | |a ZDB-2-PHA |a ZDB-2-BAE | ||
| 940 | 1 | |q ZDB-2-PHA_Archive | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-027850130 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 5\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 6\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804153080656166912 |
|---|---|
| any_adam_object | |
| author | Reimer, Ludwig 1928- |
| author_GND | (DE-588)13230130X |
| author_facet | Reimer, Ludwig 1928- |
| author_role | aut |
| author_sort | Reimer, Ludwig 1928- |
| author_variant | l r lr |
| building | Verbundindex |
| bvnumber | BV042414637 |
| classification_rvk | UH 5100 UH 6300 |
| classification_tum | PHY 000 PHY 135f |
| collection | ZDB-2-PHA ZDB-2-BAE |
| ctrlnum | (OCoLC)860048655 (DE-599)BVBBV042414637 |
| dewey-full | 530.41 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.41 |
| dewey-search | 530.41 |
| dewey-sort | 3530.41 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-662-21579-1 |
| edition | Second Edition |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03961nmm a2200805zcb4500</leader><controlfield tag="001">BV042414637</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220121 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">150316s1989 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783662215791</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-662-21579-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783540504993</subfield><subfield code="c">Print</subfield><subfield code="9">978-3-540-50499-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-662-21579-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)860048655</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV042414637</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">530.41</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 5100</subfield><subfield code="0">(DE-625)145654:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 135f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Reimer, Ludwig</subfield><subfield code="d">1928-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)13230130X</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">transmission electron microscopy</subfield><subfield code="b">physics of image formation and microanalysis</subfield><subfield code="c">Ludwig Reimer</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Second Edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin, Heidelberg</subfield><subfield code="b">Springer Berlin Heidelberg</subfield><subfield code="c">1989</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIII, 547 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">36</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy and Microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Biophysics and Biological Physics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kristallstruktur</subfield><subfield code="0">(DE-588)4136176-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Beugung</subfield><subfield code="0">(DE-588)4145094-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektron</subfield><subfield code="0">(DE-588)4125978-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Physik</subfield><subfield code="0">(DE-588)4045956-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektron</subfield><subfield code="0">(DE-588)4125978-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Physik</subfield><subfield code="0">(DE-588)4045956-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Beugung</subfield><subfield code="0">(DE-588)4145094-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Mikroanalyse</subfield><subfield code="0">(DE-588)4169804-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Kristallstruktur</subfield><subfield code="0">(DE-588)4136176-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="6" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="6" ind2=" "><subfield code="8">6\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">3-540-50499-0</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Springer Series in Optical Sciences</subfield><subfield code="v">36</subfield><subfield code="w">(DE-604)BV000000237</subfield><subfield code="9">36</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-662-21579-1</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-PHA</subfield><subfield code="a">ZDB-2-BAE</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-PHA_Archive</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-027850130</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">6\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV042414637 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T01:20:55Z |
| institution | BVB |
| isbn | 9783662215791 9783540504993 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-027850130 |
| oclc_num | 860048655 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIII, 547 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer Second Edition Berlin, Heidelberg Springer Berlin Heidelberg 1989 1 Online-Ressource (XIII, 547 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 36 The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur (DE-588)4136176-3 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Beugung (DE-588)4145094-2 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Elektron (DE-588)4125978-6 gnd rswk-swf Physik (DE-588)4045956-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Elektron (DE-588)4125978-6 s 1\p DE-604 Physik (DE-588)4045956-1 s 2\p DE-604 Beugung (DE-588)4145094-2 s 3\p DE-604 Mikroanalyse (DE-588)4169804-6 s 4\p DE-604 Kristallstruktur (DE-588)4136176-3 s 5\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 6\p DE-604 Erscheint auch als Druck-Ausgabe 3-540-50499-0 Springer Series in Optical Sciences 36 (DE-604)BV000000237 36 https://doi.org/10.1007/978-3-662-21579-1 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Reimer, Ludwig 1928- transmission electron microscopy physics of image formation and microanalysis Springer Series in Optical Sciences Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur (DE-588)4136176-3 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Beugung (DE-588)4145094-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd |
| subject_GND | (DE-588)4136176-3 (DE-588)4014327-2 (DE-588)4145094-2 (DE-588)4215608-7 (DE-588)4169804-6 (DE-588)4125978-6 (DE-588)4045956-1 |
| title | transmission electron microscopy physics of image formation and microanalysis |
| title_auth | transmission electron microscopy physics of image formation and microanalysis |
| title_exact_search | transmission electron microscopy physics of image formation and microanalysis |
| title_full | transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | transmission electron microscopy |
| title_sort | transmission electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur (DE-588)4136176-3 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Beugung (DE-588)4145094-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd |
| topic_facet | Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur Elektronenmikroskopie Beugung Durchstrahlungselektronenmikroskopie Mikroanalyse Elektron Physik |
| url | https://doi.org/10.1007/978-3-662-21579-1 |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig transmissionelectronmicroscopyphysicsofimageformationandmicroanalysis |