transmission electron microscopy: physics of image formation and microanalysis
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1989
|
| Edition: | Second Edition |
| Series: | Springer Series in Optical Sciences
36 |
| Subjects: | |
| Online Access: | Volltext |
| Item Description: | The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy |
| Physical Description: | 1 Online-Ressource (XIII, 547 p) |
| ISBN: | 9783662215791 9783540504993 |
| DOI: | 10.1007/978-3-662-21579-1 |
Staff View
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| indexdate | 2024-07-10T01:20:55Z |
| institution | BVB |
| isbn | 9783662215791 9783540504993 |
| language | English |
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| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | 1 Online-Ressource (XIII, 547 p) |
| psigel | ZDB-2-PHA ZDB-2-BAE ZDB-2-PHA_Archive |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Springer Berlin Heidelberg |
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| series | Springer Series in Optical Sciences |
| series2 | Springer Series in Optical Sciences |
| spelling | Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer Second Edition Berlin, Heidelberg Springer Berlin Heidelberg 1989 1 Online-Ressource (XIII, 547 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Optical Sciences 36 The aim of this book is to present the theory of image and contrast formation and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal structure determination and imaging of lattice defects. X-ray microanalysis and energy-loss spectroscopy are treated as analytical methods. The second edition includes discussion of recent progress, especially in the areas of energy-loss spectroscopy, crystal-lattice imaging and reflection electron microscopy Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur (DE-588)4136176-3 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Beugung (DE-588)4145094-2 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Elektron (DE-588)4125978-6 gnd rswk-swf Physik (DE-588)4045956-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Elektron (DE-588)4125978-6 s 1\p DE-604 Physik (DE-588)4045956-1 s 2\p DE-604 Beugung (DE-588)4145094-2 s 3\p DE-604 Mikroanalyse (DE-588)4169804-6 s 4\p DE-604 Kristallstruktur (DE-588)4136176-3 s 5\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 6\p DE-604 Erscheint auch als Druck-Ausgabe 3-540-50499-0 Springer Series in Optical Sciences 36 (DE-604)BV000000237 36 https://doi.org/10.1007/978-3-662-21579-1 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Reimer, Ludwig 1928- transmission electron microscopy physics of image formation and microanalysis Springer Series in Optical Sciences Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur (DE-588)4136176-3 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Beugung (DE-588)4145094-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd |
| subject_GND | (DE-588)4136176-3 (DE-588)4014327-2 (DE-588)4145094-2 (DE-588)4215608-7 (DE-588)4169804-6 (DE-588)4125978-6 (DE-588)4045956-1 |
| title | transmission electron microscopy physics of image formation and microanalysis |
| title_auth | transmission electron microscopy physics of image formation and microanalysis |
| title_exact_search | transmission electron microscopy physics of image formation and microanalysis |
| title_full | transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_fullStr | transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_full_unstemmed | transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer |
| title_short | transmission electron microscopy |
| title_sort | transmission electron microscopy physics of image formation and microanalysis |
| title_sub | physics of image formation and microanalysis |
| topic | Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur (DE-588)4136176-3 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Beugung (DE-588)4145094-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Mikroanalyse (DE-588)4169804-6 gnd Elektron (DE-588)4125978-6 gnd Physik (DE-588)4045956-1 gnd |
| topic_facet | Physics Solid State Physics Spectroscopy and Microscopy Biophysics and Biological Physics Kristallstruktur Elektronenmikroskopie Beugung Durchstrahlungselektronenmikroskopie Mikroanalyse Elektron Physik |
| url | https://doi.org/10.1007/978-3-662-21579-1 |
| volume_link | (DE-604)BV000000237 |
| work_keys_str_mv | AT reimerludwig transmissionelectronmicroscopyphysicsofimageformationandmicroanalysis |