Analyse und Modellierung des Alterungsverhaltens Lateraler DMOS-Transistoren bei Belastung durch heiße Ladungsträger:
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Bibliographic Details
Main Author: Riedlberger, Eva 1981- (Author)
Format: Thesis Book
Language:German
Published: 2011
Subjects:
Online Access:https://nbn-resolving.org/urn:nbn:de:bvb:706-2600
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Physical Description:IX, 132 S. zahlr. Ill., graph. Darst.

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