Conference proceedings: Oct. 26 - 31, 2008, Santa Clara, California
Saved in:
| Format: | Electronic Conference Proceeding Software eBook |
|---|---|
| Language: | English |
| Published: |
[Piscataway, NJ]
IEEE
2008
|
| Subjects: | |
| Physical Description: | 1 CD-ROM 12 cm |
| ISBN: | 9781424424030 |
Staff View
MARC
| LEADER | 00000nmm a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV035230125 | ||
| 003 | DE-604 | ||
| 005 | 20090109 | ||
| 006 | a |||| 10||| | ||
| 007 | co|uuu---uuuuu | ||
| 008 | 081230s2008 |||| q||u| ||||||eng d | ||
| 020 | |a 9781424424030 |9 978-1-4244-2403-0 | ||
| 035 | |a (OCoLC)634485368 | ||
| 035 | |a (DE-599)BVBBV035230125 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 245 | 1 | 0 | |a Conference proceedings |b Oct. 26 - 31, 2008, Santa Clara, California |c ITC, International Test Conference 2008, the cornerstone of Test Week |
| 264 | 1 | |a [Piscataway, NJ] |b IEEE |c 2008 | |
| 300 | |a 1 CD-ROM |c 12 cm | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cd |2 rdacarrier | ||
| 650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 2008 |z Santa Clara Calif. |2 gnd-content | |
| 655 | 7 | |0 (DE-588)4139307-7 |a CD-ROM |2 gnd-carrier | |
| 689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 0 | 1 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 711 | 2 | |a International Test Conference |d 2008 |c Santa Clara, Calif. |j Sonstige |0 (DE-588)16008090-3 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-017036090 | ||
Record in the Search Index
| _version_ | 1804138497197473792 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV035230125 |
| ctrlnum | (OCoLC)634485368 (DE-599)BVBBV035230125 |
| format | Electronic Conference Proceeding Software eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01264nmm a2200337 c 4500</leader><controlfield tag="001">BV035230125</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20090109 </controlfield><controlfield tag="006">a |||| 10||| </controlfield><controlfield tag="007">co|uuu---uuuuu</controlfield><controlfield tag="008">081230s2008 |||| q||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781424424030</subfield><subfield code="9">978-1-4244-2403-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634485368</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV035230125</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Conference proceedings</subfield><subfield code="b">Oct. 26 - 31, 2008, Santa Clara, California</subfield><subfield code="c">ITC, International Test Conference 2008, the cornerstone of Test Week</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[Piscataway, NJ]</subfield><subfield code="b">IEEE</subfield><subfield code="c">2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 CD-ROM</subfield><subfield code="c">12 cm</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cd</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">2008</subfield><subfield code="z">Santa Clara Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4139307-7</subfield><subfield code="a">CD-ROM</subfield><subfield code="2">gnd-carrier</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Test Conference</subfield><subfield code="d">2008</subfield><subfield code="c">Santa Clara, Calif.</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)16008090-3</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017036090</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 2008 Santa Clara Calif. gnd-content (DE-588)4139307-7 CD-ROM gnd-carrier |
| genre_facet | Konferenzschrift 2008 Santa Clara Calif. CD-ROM |
| id | DE-604.BV035230125 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T21:29:07Z |
| institution | BVB |
| institution_GND | (DE-588)16008090-3 |
| isbn | 9781424424030 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017036090 |
| oclc_num | 634485368 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | 1 CD-ROM 12 cm |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | IEEE |
| record_format | marc |
| spelling | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week [Piscataway, NJ] IEEE 2008 1 CD-ROM 12 cm c rdamedia cd rdacarrier Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2008 Santa Clara Calif. gnd-content (DE-588)4139307-7 CD-ROM gnd-carrier Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 International Test Conference 2008 Santa Clara, Calif. Sonstige (DE-588)16008090-3 oth |
| spellingShingle | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417 (DE-588)4139307-7 |
| title | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_auth | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_exact_search | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_full | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_fullStr | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_full_unstemmed | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_short | Conference proceedings |
| title_sort | conference proceedings oct 26 31 2008 santa clara california |
| title_sub | Oct. 26 - 31, 2008, Santa Clara, California |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Konferenzschrift 2008 Santa Clara Calif. CD-ROM |
| work_keys_str_mv | AT internationaltestconferencesantaclaracalif conferenceproceedingsoct26312008santaclaracalifornia |