Conference proceedings: Oct. 26 - 31, 2008, Santa Clara, California
Gespeichert in:
| Format: | Elektronisch Tagungsbericht Software E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
[Piscataway, NJ]
IEEE
2008
|
| Schlagworte: | |
| Beschreibung: | 1 CD-ROM 12 cm |
| ISBN: | 9781424424030 |
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| indexdate | 2024-07-09T21:29:07Z |
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| isbn | 9781424424030 |
| language | English |
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| physical | 1 CD-ROM 12 cm |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | IEEE |
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| spelling | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week [Piscataway, NJ] IEEE 2008 1 CD-ROM 12 cm c rdamedia cd rdacarrier Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 2008 Santa Clara Calif. gnd-content (DE-588)4139307-7 CD-ROM gnd-carrier Mikroelektronik (DE-588)4039207-7 s Prüftechnik (DE-588)4047610-8 s DE-604 International Test Conference 2008 Santa Clara, Calif. Sonstige (DE-588)16008090-3 oth |
| spellingShingle | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4039207-7 (DE-588)4047610-8 (DE-588)1071861417 (DE-588)4139307-7 |
| title | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_auth | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_exact_search | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California |
| title_full | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_fullStr | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_full_unstemmed | Conference proceedings Oct. 26 - 31, 2008, Santa Clara, California ITC, International Test Conference 2008, the cornerstone of Test Week |
| title_short | Conference proceedings |
| title_sort | conference proceedings oct 26 31 2008 santa clara california |
| title_sub | Oct. 26 - 31, 2008, Santa Clara, California |
| topic | Mikroelektronik (DE-588)4039207-7 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Mikroelektronik Prüftechnik Konferenzschrift 2008 Santa Clara Calif. CD-ROM |
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