Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy
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Bibliographic Details
Main Author: Eberhart, Jean P. (Author)
Format: Book
Language:English
Published: Chichester [u.a.] Wiley 1991
Subjects:
Physical Description:XXX, 545 S. Ill.
ISBN:0471929778

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