Structural and chemical analysis of materials: X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Chichester [u.a.]
Wiley
1991
|
| Schlagworte: | |
| Beschreibung: | XXX, 545 S. Ill. |
| ISBN: | 0471929778 |
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| 100 | 1 | |a Eberhart, Jean P. |e Verfasser |4 aut | |
| 240 | 1 | 0 | |a Analyse structurale et chimique des materiaux |
| 245 | 1 | 0 | |a Structural and chemical analysis of materials |b X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |c J. P. Eberhart |
| 264 | 1 | |a Chichester [u.a.] |b Wiley |c 1991 | |
| 300 | |a XXX, 545 S. |b Ill. | ||
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Datensatz im Suchindex
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| author | Eberhart, Jean P. |
| author_facet | Eberhart, Jean P. |
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| building | Verbundindex |
| bvnumber | BV025921672 |
| classification_rvk | UP 9000 VE 9500 VG 8900 |
| ctrlnum | (OCoLC)636208790 (DE-599)BVBBV025921672 |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV025921672 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:15:00Z |
| institution | BVB |
| isbn | 0471929778 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019166626 |
| oclc_num | 636208790 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | XXX, 545 S. Ill. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Wiley |
| record_format | marc |
| spelling | Eberhart, Jean P. Verfasser aut Analyse structurale et chimique des materiaux Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy J. P. Eberhart Chichester [u.a.] Wiley 1991 XXX, 545 S. Ill. txt rdacontent n rdamedia nc rdacarrier Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Festkörperspektroskopie (DE-588)4226322-0 gnd rswk-swf Festkörperspektroskopie (DE-588)4226322-0 s Werkstoffprüfung (DE-588)4037934-6 s DE-604 |
| spellingShingle | Eberhart, Jean P. Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy Werkstoffprüfung (DE-588)4037934-6 gnd Festkörperspektroskopie (DE-588)4226322-0 gnd |
| subject_GND | (DE-588)4037934-6 (DE-588)4226322-0 |
| title | Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_alt | Analyse structurale et chimique des materiaux |
| title_auth | Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_exact_search | Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| title_full | Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy J. P. Eberhart |
| title_fullStr | Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy J. P. Eberhart |
| title_full_unstemmed | Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy J. P. Eberhart |
| title_short | Structural and chemical analysis of materials |
| title_sort | structural and chemical analysis of materials x ray electron and neutron diffraction x ray electron and ion spectrometry electron microscopy |
| title_sub | X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy |
| topic | Werkstoffprüfung (DE-588)4037934-6 gnd Festkörperspektroskopie (DE-588)4226322-0 gnd |
| topic_facet | Werkstoffprüfung Festkörperspektroskopie |
| work_keys_str_mv | AT eberhartjeanp analysestructuraleetchimiquedesmateriaux AT eberhartjeanp structuralandchemicalanalysisofmaterialsxrayelectronandneutrondiffractionxrayelectronandionspectrometryelectronmicroscopy |