Elektronenmikroskopie: Grundlagen, Methoden, Anwendungen
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | German |
| Veröffentlicht: |
Heidelberg [u.a.]
Spektrum, Akad. Verl.
1995
|
| Schlagworte: | |
| Beschreibung: | VIII, 279 S. Ill., graph. Darst. |
| ISBN: | 3860253417 |
Internformat
MARC
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| 100 | 1 | |a Flegler, Stanley L. |e Verfasser |4 aut | |
| 240 | 1 | 0 | |a Scanning and transmission electron microscopy |
| 245 | 1 | 0 | |a Elektronenmikroskopie |b Grundlagen, Methoden, Anwendungen |c Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens. Aus dem Amerikan... |
| 264 | 1 | |a Heidelberg [u.a.] |b Spektrum, Akad. Verl. |c 1995 | |
| 300 | |a VIII, 279 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Heckman, John W. |e Verfasser |4 aut | |
| 700 | 1 | |a Klomparens, Karen L. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019114844 | ||
Datensatz im Suchindex
| _version_ | 1804141321591455744 |
|---|---|
| any_adam_object | |
| author | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. |
| author_facet | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. |
| author_role | aut aut aut |
| author_sort | Flegler, Stanley L. |
| author_variant | s l f sl slf j w h jw jwh k l k kl klk |
| building | Verbundindex |
| bvnumber | BV025867382 |
| classification_rvk | UH 6300 VG 9900 WC 3100 ZM 3700 ZM 8150 |
| ctrlnum | (OCoLC)64525494 (DE-599)BVBBV025867382 |
| discipline | Chemie / Pharmazie Physik Biologie Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| id | DE-604.BV025867382 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:14:01Z |
| institution | BVB |
| isbn | 3860253417 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019114844 |
| oclc_num | 64525494 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | VIII, 279 S. Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
| publishDateSort | 1995 |
| publisher | Spektrum, Akad. Verl. |
| record_format | marc |
| spelling | Flegler, Stanley L. Verfasser aut Scanning and transmission electron microscopy Elektronenmikroskopie Grundlagen, Methoden, Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens. Aus dem Amerikan... Heidelberg [u.a.] Spektrum, Akad. Verl. 1995 VIII, 279 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Heckman, John W. Verfasser aut Klomparens, Karen L. Verfasser aut |
| spellingShingle | Flegler, Stanley L. Heckman, John W. Klomparens, Karen L. Elektronenmikroskopie Grundlagen, Methoden, Anwendungen Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 |
| title | Elektronenmikroskopie Grundlagen, Methoden, Anwendungen |
| title_alt | Scanning and transmission electron microscopy |
| title_auth | Elektronenmikroskopie Grundlagen, Methoden, Anwendungen |
| title_exact_search | Elektronenmikroskopie Grundlagen, Methoden, Anwendungen |
| title_full | Elektronenmikroskopie Grundlagen, Methoden, Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens. Aus dem Amerikan... |
| title_fullStr | Elektronenmikroskopie Grundlagen, Methoden, Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens. Aus dem Amerikan... |
| title_full_unstemmed | Elektronenmikroskopie Grundlagen, Methoden, Anwendungen Stanley L. Flegler ; John W. Heckman ; Karen L. Klomparens. Aus dem Amerikan... |
| title_short | Elektronenmikroskopie |
| title_sort | elektronenmikroskopie grundlagen methoden anwendungen |
| title_sub | Grundlagen, Methoden, Anwendungen |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Elektronenmikroskopie |
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