Elektronenmikroskopie: Grundlagen, Methoden, Anwendungen
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Bibliographic Details
Main Authors: Flegler, Stanley L. (Author), Heckman, John W. (Author), Klomparens, Karen L. (Author)
Format: Book
Language:German
Published: Heidelberg [u.a.] Spektrum, Akad. Verl. 1995
Subjects:
Physical Description:VIII, 279 S. Ill., graph. Darst.
ISBN:3860253417

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