Three-dimensional imaging, optical metrology, and inspection IV:
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash. SPIE 1998
Series:Proceedings of SPIE / Society of Photo-Optical Instrumentation Engineers 3520
Subjects:
Physical Description:IX, 304 S. Ill., graph. Darst.
ISBN:0819429813

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