Modern optical characterization techniques for semiconductors and semiconductor devices: 26 - 27 March 1987, Bay Point, Florida
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
Bellingham, Wash.
Internat. Soc. for Optical Engineering
1987
|
| Series: | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE
794 |
| Subjects: | |
| Item Description: | Literaturangaben |
| Physical Description: | VI, 282 S. Ill., graph. Darst. |
| ISBN: | 089252829X |
Staff View
MARC
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| genre | (DE-588)1071861417 Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. gnd-content |
| genre_facet | Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. |
| id | DE-604.BV004160115 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:09:14Z |
| institution | BVB |
| isbn | 089252829X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002594310 |
| oclc_num | 506124326 |
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| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | VI, 282 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Internat. Soc. for Optical Engineering |
| record_format | marc |
| series | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| series2 | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| spelling | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) Bellingham, Wash. Internat. Soc. for Optical Engineering 1987 VI, 282 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 794 Literaturangaben Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter (DE-588)4022993-2 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. gnd-content Halbleiter (DE-588)4022993-2 s Spektroskopie (DE-588)4056138-0 s DE-604 Glembocki, O. J. Sonstige oth Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 794 (DE-604)BV000010887 794 |
| spellingShingle | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4056138-0 (DE-588)1071861417 |
| title | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida |
| title_auth | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida |
| title_exact_search | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida |
| title_full | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) |
| title_fullStr | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) |
| title_full_unstemmed | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) |
| title_short | Modern optical characterization techniques for semiconductors and semiconductor devices |
| title_sort | modern optical characterization techniques for semiconductors and semiconductor devices 26 27 march 1987 bay point florida |
| title_sub | 26 - 27 March 1987, Bay Point, Florida |
| topic | Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| topic_facet | Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter Spektroskopie Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT glembockioj modernopticalcharacterizationtechniquesforsemiconductorsandsemiconductordevices2627march1987baypointflorida |