Modern optical characterization techniques for semiconductors and semiconductor devices: 26 - 27 March 1987, Bay Point, Florida
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Wash.
Internat. Soc. for Optical Engineering
1987
|
| Schriftenreihe: | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE
794 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | VI, 282 S. Ill., graph. Darst. |
| ISBN: | 089252829X |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV004160115 | ||
| 003 | DE-604 | ||
| 005 | 20220411 | ||
| 007 | t | ||
| 008 | 901119s1987 ad|| |||| 10||| eng d | ||
| 020 | |a 089252829X |9 0-89252-829-X | ||
| 035 | |a (OCoLC)506124326 | ||
| 035 | |a (DE-599)BVBBV004160115 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 |a DE-83 | ||
| 050 | 0 | |a TK7871.85 | |
| 084 | |a PHY 685f |2 stub | ||
| 084 | |a PHY 770f |2 stub | ||
| 245 | 1 | 0 | |a Modern optical characterization techniques for semiconductors and semiconductor devices |b 26 - 27 March 1987, Bay Point, Florida |c O. J. Glembocki ... (eds.) |
| 264 | 1 | |a Bellingham, Wash. |b Internat. Soc. for Optical Engineering |c 1987 | |
| 300 | |a VI, 282 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |v 794 | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Semiconductors |x Optical properties |v Congresses | |
| 650 | 4 | |a Semiconductors |x Testing |x Optical methods |v Congresses | |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Spektroskopie |0 (DE-588)4056138-0 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 26.03.1987-27.03.1987 |z Bay Point Fla. |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Spektroskopie |0 (DE-588)4056138-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Glembocki, O. J. |e Sonstige |4 oth | |
| 830 | 0 | |a Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |v 794 |w (DE-604)BV000010887 |9 794 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-002594310 | ||
Datensatz im Suchindex
| _version_ | 1804118371690610688 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV004160115 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | PHY 685f PHY 770f |
| ctrlnum | (OCoLC)506124326 (DE-599)BVBBV004160115 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01675nam a2200421 cb4500</leader><controlfield tag="001">BV004160115</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20220411 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">901119s1987 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">089252829X</subfield><subfield code="9">0-89252-829-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)506124326</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV004160115</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.85</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 685f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 770f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Modern optical characterization techniques for semiconductors and semiconductor devices</subfield><subfield code="b">26 - 27 March 1987, Bay Point, Florida</subfield><subfield code="c">O. J. Glembocki ... (eds.)</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bellingham, Wash.</subfield><subfield code="b">Internat. Soc. for Optical Engineering</subfield><subfield code="c">1987</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 282 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE</subfield><subfield code="v">794</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Optical properties</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield><subfield code="x">Optical methods</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">26.03.1987-27.03.1987</subfield><subfield code="z">Bay Point Fla.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Glembocki, O. J.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE</subfield><subfield code="v">794</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">794</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-002594310</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. gnd-content |
| genre_facet | Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. |
| id | DE-604.BV004160115 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:09:14Z |
| institution | BVB |
| isbn | 089252829X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-002594310 |
| oclc_num | 506124326 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | VI, 282 S. Ill., graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| publisher | Internat. Soc. for Optical Engineering |
| record_format | marc |
| series | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| series2 | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| spelling | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) Bellingham, Wash. Internat. Soc. for Optical Engineering 1987 VI, 282 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 794 Literaturangaben Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter (DE-588)4022993-2 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. gnd-content Halbleiter (DE-588)4022993-2 s Spektroskopie (DE-588)4056138-0 s DE-604 Glembocki, O. J. Sonstige oth Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 794 (DE-604)BV000010887 794 |
| spellingShingle | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4056138-0 (DE-588)1071861417 |
| title | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida |
| title_auth | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida |
| title_exact_search | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida |
| title_full | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) |
| title_fullStr | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) |
| title_full_unstemmed | Modern optical characterization techniques for semiconductors and semiconductor devices 26 - 27 March 1987, Bay Point, Florida O. J. Glembocki ... (eds.) |
| title_short | Modern optical characterization techniques for semiconductors and semiconductor devices |
| title_sort | modern optical characterization techniques for semiconductors and semiconductor devices 26 27 march 1987 bay point florida |
| title_sub | 26 - 27 March 1987, Bay Point, Florida |
| topic | Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter (DE-588)4022993-2 gnd Spektroskopie (DE-588)4056138-0 gnd |
| topic_facet | Semiconductors Optical properties Congresses Semiconductors Testing Optical methods Congresses Halbleiter Spektroskopie Konferenzschrift 26.03.1987-27.03.1987 Bay Point Fla. |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT glembockioj modernopticalcharacterizationtechniquesforsemiconductorsandsemiconductordevices2627march1987baypointflorida |