Proceedings of the ACM SIGSOFT '89 third Symposium on Software Testing, Analysis, and Verification (TAV 3): Key West, Florida, Dec. 13-15, 1989
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Bibliographic Details
Corporate Authors: Symposium on Software Testing, Analysis, and Verification Key West, Fla (Author), Association for Computing Machinery Special Interest Group on Software Engineering (Author)
Format: Conference Proceeding Book
Language:English
Published: New York, NY ACM Press 1989
Series:Software engineering notes 14,8.
Subjects:
Item Description:Einzelaufn. eines Zs.-Heftes
Physical Description:VII, 229 S. graph. Darst.
ISBN:0897913426

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