Fakebusters II :: scientific detection of fakery in art and philately /
Now that the sale of a Picasso painting has exceeded US $100 million at auction, the forgers are extricating their bag of tricks. This fascinating collection of papers provides an eclectic coverage of the art and philatelic concerns in safeguarding the integrity of creative artists. It paints a broa...
Gespeichert in:
Körperschaften: | , , |
---|---|
Weitere Verfasser: | , |
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore ; Hackensack, N.J. :
World Scientific,
©2004.
|
Schriftenreihe: | Series in popular science ;
v. 4. |
Schlagworte: | |
Online-Zugang: | Volltext |
Zusammenfassung: | Now that the sale of a Picasso painting has exceeded US $100 million at auction, the forgers are extricating their bag of tricks. This fascinating collection of papers provides an eclectic coverage of the art and philatelic concerns in safeguarding the integrity of creative artists. It paints a broader swath of the problems in art authentication, including philatelic fraud. The articles represent 24 expert contributions on relevant topics pertaining to the scientific detection of forgery in art and philately. |
Beschreibung: | "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." |
Beschreibung: | 1 online resource (x, 317 pages) : illustrations (some color) |
Bibliographie: | Includes bibliographical references. |
ISBN: | 9812701370 9789812701374 9789812560254 9812560254 1281897094 9781281897091 9786611897093 6611897097 |
Internformat
MARC
LEADER | 00000cam a2200000 a 4500 | ||
---|---|---|---|
001 | ZDB-4-EBU-ocn191945165 | ||
003 | OCoLC | ||
005 | 20240405112445.0 | ||
006 | m o d | ||
007 | cr cn||||||||| | ||
008 | 050128s2004 njuaf ob 000 0 eng d | ||
040 | |a COO |b eng |e pn |c COO |d OCLCG |d OCLCQ |d N$T |d YDXCP |d IDEBK |d OCLCQ |d DKDLA |d ADU |d E7B |d OCLCQ |d MERUC |d OCLCQ |d OCLCF |d OCLCQ |d OCLCO |d OCLCQ |d OCLCO |d OCL |d OCLCO |d OCLCQ |d AZK |d MOR |d PIFBR |d OCLCQ |d STF |d WRM |d REC |d OCLCA |d OCLCQ |d LEAUB |d UKCRE |d M8D |d OCLCO |d OCLCA |d OCLCQ |d EBLCP |d MHW |d UMR |d QGK |d TXI |d OCLCO |d OCLCL | ||
019 | |a 71296637 |a 476063490 |a 482796448 |a 488561948 |a 614968917 |a 648233341 |a 722568376 |a 888605706 |a 961520482 |a 962619978 |a 988501439 |a 992103523 |a 1037754826 |a 1038650902 |a 1054122840 |a 1086568243 |a 1153464872 |a 1259121698 | ||
020 | |a 9812701370 |q (electronic bk.) | ||
020 | |a 9789812701374 |q (electronic bk.) | ||
020 | |a 9789812560254 |q (pbk.) | ||
020 | |a 9812560254 |q (pbk.) | ||
020 | |z 9812560254 |q (pbk.) | ||
020 | |a 1281897094 | ||
020 | |a 9781281897091 | ||
020 | |a 9786611897093 | ||
020 | |a 6611897097 | ||
035 | |a (OCoLC)191945165 |z (OCoLC)71296637 |z (OCoLC)476063490 |z (OCoLC)482796448 |z (OCoLC)488561948 |z (OCoLC)614968917 |z (OCoLC)648233341 |z (OCoLC)722568376 |z (OCoLC)888605706 |z (OCoLC)961520482 |z (OCoLC)962619978 |z (OCoLC)988501439 |z (OCoLC)992103523 |z (OCoLC)1037754826 |z (OCoLC)1038650902 |z (OCoLC)1054122840 |z (OCoLC)1086568243 |z (OCoLC)1153464872 |z (OCoLC)1259121698 | ||
050 | 4 | |a N8790 |b .F35 2004eb | |
072 | 7 | |a TRV |x 016000 |2 bisacsh | |
072 | 7 | |a BUS |x 100000 |2 bisacsh | |
072 | 7 | |a REF |x 000000 |2 bisacsh | |
082 | 7 | |a 069/.54 |2 22 | |
084 | |a 30.30 |2 bcl | ||
049 | |a MAIN | ||
245 | 0 | 0 | |a Fakebusters II : |b scientific detection of fakery in art and philately / |c edited by Richard J. Weiss and Duane Chartier. |
246 | 3 | |a Scientific detection of fakery in art and philately | |
260 | |a Singapore ; |a Hackensack, N.J. : |b World Scientific, |c ©2004. | ||
300 | |a 1 online resource (x, 317 pages) : |b illustrations (some color) | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
347 | |a data file | ||
490 | 1 | |a Series in popular science ; |v v. 4 | |
500 | |a "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." | ||
504 | |a Includes bibliographical references. | ||
588 | 0 | |a Print version record. | |
505 | 0 | |a Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX. | |
520 | |a Now that the sale of a Picasso painting has exceeded US $100 million at auction, the forgers are extricating their bag of tricks. This fascinating collection of papers provides an eclectic coverage of the art and philatelic concerns in safeguarding the integrity of creative artists. It paints a broader swath of the problems in art authentication, including philatelic fraud. The articles represent 24 expert contributions on relevant topics pertaining to the scientific detection of forgery in art and philately. | ||
546 | |a English. | ||
650 | 0 | |a Art |x Forgeries |v Congresses. | |
650 | 0 | |a Art |x Radiography |v Congresses. | |
650 | 0 | |a Art |x Expertising |v Congresses. | |
650 | 0 | |a Expertising, X-ray |v Congresses. | |
650 | 0 | |a Science and the arts |v Congresses. | |
650 | 0 | |a Art and science |v Congresses. | |
650 | 6 | |a Art |x Faux |v Congrès. | |
650 | 6 | |a Art |x Radiographie |v Congrès. | |
650 | 6 | |a Art |x Expertise |v Congrès. | |
650 | 6 | |a Expertise par rayons X |v Congrès. | |
650 | 6 | |a Sciences et arts |v Congrès. | |
650 | 6 | |a Art et sciences |v Congrès. | |
650 | 7 | |a TRAVEL |x Museums, Tours, Points of Interest. |2 bisacsh | |
650 | 7 | |a BUSINESS & ECONOMICS |x Museum Administration & Museology. |2 bisacsh | |
650 | 7 | |a REFERENCE |x General. |2 bisacsh | |
650 | 7 | |a Art and science |2 fast | |
650 | 7 | |a Art |x Expertising |2 fast | |
650 | 7 | |a Art |x Forgeries |2 fast | |
650 | 7 | |a Art |x Radiography |2 fast | |
650 | 7 | |a Expertising, X-ray |2 fast | |
650 | 7 | |a Science and the arts |2 fast | |
650 | 1 | 7 | |a Vervalsing. |2 gtt |
650 | 1 | 7 | |a Detectie. |2 gtt |
650 | 1 | 7 | |a Wetenschappelijke technieken. |2 gtt |
655 | 7 | |a proceedings (reports) |2 aat | |
655 | 7 | |a Conference papers and proceedings |2 fast | |
655 | 7 | |a Conference papers and proceedings. |2 lcgft |0 http://id.loc.gov/authorities/genreForms/gf2014026068 | |
655 | 7 | |a Actes de congrès. |2 rvmgf | |
700 | 1 | |a Weiss, Richard J. |q (Richard Jerome), |d 1923- |1 https://id.oclc.org/worldcat/entity/E39PBJtX7G6mwQq9qHQjx3myBP |0 http://id.loc.gov/authorities/names/n85800667 | |
700 | 1 | |a Chartier, Duane R. | |
710 | 2 | |a Society of Photo-Optical Instrumentation Engineers. | |
710 | 2 | |a International Center for Art Intelligence. |0 http://id.loc.gov/authorities/names/no2005070485 | |
710 | 2 | |a Philatelic Fakes Forgeries and Experts. | |
758 | |i has work: |a Fakebusters II (Text) |1 https://id.oclc.org/worldcat/entity/E39PCFXjkqD6hTwYddwG6GCKbb |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
776 | 0 | 8 | |i Print version: |t Fakebusters II. |d Singapore ; Hackensack, N.J. : World Scientific, ©2004 |z 9812560254 |w (OCoLC)57515896 |
830 | 0 | |a Series in popular science ; |v v. 4. |0 http://id.loc.gov/authorities/names/n96115337 | |
856 | 4 | 0 | |l FWS01 |p ZDB-4-EBU |q FWS_PDA_EBU |u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306 |3 Volltext |
936 | |a BATCHLOAD | ||
938 | |a ebrary |b EBRY |n ebr10174034 | ||
938 | |a EBSCOhost |b EBSC |n 167306 | ||
938 | |a YBP Library Services |b YANK |n 2470486 | ||
938 | |a ProQuest Ebook Central |b EBLB |n EBL296120 | ||
994 | |a 92 |b GEBAY | ||
912 | |a ZDB-4-EBU | ||
049 | |a DE-863 |
Datensatz im Suchindex
DE-BY-FWS_katkey | ZDB-4-EBU-ocn191945165 |
---|---|
_version_ | 1804748425275637760 |
adam_text | |
any_adam_object | |
author2 | Weiss, Richard J. (Richard Jerome), 1923- Chartier, Duane R. |
author2_role | |
author2_variant | r j w rj rjw d r c dr drc |
author_GND | http://id.loc.gov/authorities/names/n85800667 |
author_corporate | Society of Photo-Optical Instrumentation Engineers International Center for Art Intelligence Philatelic Fakes Forgeries and Experts |
author_corporate_role | |
author_facet | Weiss, Richard J. (Richard Jerome), 1923- Chartier, Duane R. Society of Photo-Optical Instrumentation Engineers International Center for Art Intelligence Philatelic Fakes Forgeries and Experts |
author_sort | Weiss, Richard J. 1923- |
building | Verbundindex |
bvnumber | localFWS |
callnumber-first | N - Fine Arts |
callnumber-label | N8790 |
callnumber-raw | N8790 .F35 2004eb |
callnumber-search | N8790 .F35 2004eb |
callnumber-sort | N 48790 F35 42004EB |
callnumber-subject | N - Visual Arts |
collection | ZDB-4-EBU |
contents | Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX. |
ctrlnum | (OCoLC)191945165 |
dewey-full | 069/.54 |
dewey-hundreds | 000 - Computer science, information, general works |
dewey-ones | 069 - Museology (Museum science) |
dewey-raw | 069/.54 |
dewey-search | 069/.54 |
dewey-sort | 269 254 |
dewey-tens | 060 - General organizations and museology |
discipline | Allgemeines |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>06333cam a2201021 a 4500</leader><controlfield tag="001">ZDB-4-EBU-ocn191945165</controlfield><controlfield tag="003">OCoLC</controlfield><controlfield tag="005">20240405112445.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">050128s2004 njuaf ob 000 0 eng d</controlfield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">COO</subfield><subfield code="b">eng</subfield><subfield code="e">pn</subfield><subfield code="c">COO</subfield><subfield code="d">OCLCG</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">N$T</subfield><subfield code="d">YDXCP</subfield><subfield code="d">IDEBK</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">DKDLA</subfield><subfield code="d">ADU</subfield><subfield code="d">E7B</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">MERUC</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCF</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCL</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">AZK</subfield><subfield code="d">MOR</subfield><subfield code="d">PIFBR</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">STF</subfield><subfield code="d">WRM</subfield><subfield code="d">REC</subfield><subfield code="d">OCLCA</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">LEAUB</subfield><subfield code="d">UKCRE</subfield><subfield code="d">M8D</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCA</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">EBLCP</subfield><subfield code="d">MHW</subfield><subfield code="d">UMR</subfield><subfield code="d">QGK</subfield><subfield code="d">TXI</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCL</subfield></datafield><datafield tag="019" ind1=" " ind2=" "><subfield code="a">71296637</subfield><subfield code="a">476063490</subfield><subfield code="a">482796448</subfield><subfield code="a">488561948</subfield><subfield code="a">614968917</subfield><subfield code="a">648233341</subfield><subfield code="a">722568376</subfield><subfield code="a">888605706</subfield><subfield code="a">961520482</subfield><subfield code="a">962619978</subfield><subfield code="a">988501439</subfield><subfield code="a">992103523</subfield><subfield code="a">1037754826</subfield><subfield code="a">1038650902</subfield><subfield code="a">1054122840</subfield><subfield code="a">1086568243</subfield><subfield code="a">1153464872</subfield><subfield code="a">1259121698</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9812701370</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812701374</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812560254</subfield><subfield code="q">(pbk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9812560254</subfield><subfield code="q">(pbk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9812560254</subfield><subfield code="q">(pbk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1281897094</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781281897091</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9786611897093</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">6611897097</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)191945165</subfield><subfield code="z">(OCoLC)71296637</subfield><subfield code="z">(OCoLC)476063490</subfield><subfield code="z">(OCoLC)482796448</subfield><subfield code="z">(OCoLC)488561948</subfield><subfield code="z">(OCoLC)614968917</subfield><subfield code="z">(OCoLC)648233341</subfield><subfield code="z">(OCoLC)722568376</subfield><subfield code="z">(OCoLC)888605706</subfield><subfield code="z">(OCoLC)961520482</subfield><subfield code="z">(OCoLC)962619978</subfield><subfield code="z">(OCoLC)988501439</subfield><subfield code="z">(OCoLC)992103523</subfield><subfield code="z">(OCoLC)1037754826</subfield><subfield code="z">(OCoLC)1038650902</subfield><subfield code="z">(OCoLC)1054122840</subfield><subfield code="z">(OCoLC)1086568243</subfield><subfield code="z">(OCoLC)1153464872</subfield><subfield code="z">(OCoLC)1259121698</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">N8790</subfield><subfield code="b">.F35 2004eb</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">TRV</subfield><subfield code="x">016000</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">BUS</subfield><subfield code="x">100000</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">REF</subfield><subfield code="x">000000</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="082" ind1="7" ind2=" "><subfield code="a">069/.54</subfield><subfield code="2">22</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">30.30</subfield><subfield code="2">bcl</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">MAIN</subfield></datafield><datafield tag="245" ind1="0" ind2="0"><subfield code="a">Fakebusters II :</subfield><subfield code="b">scientific detection of fakery in art and philately /</subfield><subfield code="c">edited by Richard J. Weiss and Duane Chartier.</subfield></datafield><datafield tag="246" ind1="3" ind2=" "><subfield code="a">Scientific detection of fakery in art and philately</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Singapore ;</subfield><subfield code="a">Hackensack, N.J. :</subfield><subfield code="b">World Scientific,</subfield><subfield code="c">©2004.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (x, 317 pages) :</subfield><subfield code="b">illustrations (some color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="347" ind1=" " ind2=" "><subfield code="a">data file</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Series in popular science ;</subfield><subfield code="v">v. 4</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">"Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references.</subfield></datafield><datafield tag="588" ind1="0" ind2=" "><subfield code="a">Print version record.</subfield></datafield><datafield tag="505" ind1="0" ind2=" "><subfield code="a">Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Now that the sale of a Picasso painting has exceeded US $100 million at auction, the forgers are extricating their bag of tricks. This fascinating collection of papers provides an eclectic coverage of the art and philatelic concerns in safeguarding the integrity of creative artists. It paints a broader swath of the problems in art authentication, including philatelic fraud. The articles represent 24 expert contributions on relevant topics pertaining to the scientific detection of forgery in art and philately.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">English.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Art</subfield><subfield code="x">Forgeries</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Art</subfield><subfield code="x">Radiography</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Art</subfield><subfield code="x">Expertising</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Expertising, X-ray</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Science and the arts</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Art and science</subfield><subfield code="v">Congresses.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Art</subfield><subfield code="x">Faux</subfield><subfield code="v">Congrès.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Art</subfield><subfield code="x">Radiographie</subfield><subfield code="v">Congrès.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Art</subfield><subfield code="x">Expertise</subfield><subfield code="v">Congrès.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Expertise par rayons X</subfield><subfield code="v">Congrès.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Sciences et arts</subfield><subfield code="v">Congrès.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Art et sciences</subfield><subfield code="v">Congrès.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TRAVEL</subfield><subfield code="x">Museums, Tours, Points of Interest.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">BUSINESS & ECONOMICS</subfield><subfield code="x">Museum Administration & Museology.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">REFERENCE</subfield><subfield code="x">General.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Art and science</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Art</subfield><subfield code="x">Expertising</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Art</subfield><subfield code="x">Forgeries</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Art</subfield><subfield code="x">Radiography</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Expertising, X-ray</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Science and the arts</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1="1" ind2="7"><subfield code="a">Vervalsing.</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1="1" ind2="7"><subfield code="a">Detectie.</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="650" ind1="1" ind2="7"><subfield code="a">Wetenschappelijke technieken.</subfield><subfield code="2">gtt</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="a">proceedings (reports)</subfield><subfield code="2">aat</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="a">Conference papers and proceedings</subfield><subfield code="2">fast</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="a">Conference papers and proceedings.</subfield><subfield code="2">lcgft</subfield><subfield code="0">http://id.loc.gov/authorities/genreForms/gf2014026068</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="a">Actes de congrès.</subfield><subfield code="2">rvmgf</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Weiss, Richard J.</subfield><subfield code="q">(Richard Jerome),</subfield><subfield code="d">1923-</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PBJtX7G6mwQq9qHQjx3myBP</subfield><subfield code="0">http://id.loc.gov/authorities/names/n85800667</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chartier, Duane R.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Society of Photo-Optical Instrumentation Engineers.</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">International Center for Art Intelligence.</subfield><subfield code="0">http://id.loc.gov/authorities/names/no2005070485</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Philatelic Fakes Forgeries and Experts.</subfield></datafield><datafield tag="758" ind1=" " ind2=" "><subfield code="i">has work:</subfield><subfield code="a">Fakebusters II (Text)</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PCFXjkqD6hTwYddwG6GCKbb</subfield><subfield code="4">https://id.oclc.org/worldcat/ontology/hasWork</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="t">Fakebusters II.</subfield><subfield code="d">Singapore ; Hackensack, N.J. : World Scientific, ©2004</subfield><subfield code="z">9812560254</subfield><subfield code="w">(OCoLC)57515896</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Series in popular science ;</subfield><subfield code="v">v. 4.</subfield><subfield code="0">http://id.loc.gov/authorities/names/n96115337</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="l">FWS01</subfield><subfield code="p">ZDB-4-EBU</subfield><subfield code="q">FWS_PDA_EBU</subfield><subfield code="u">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="936" ind1=" " ind2=" "><subfield code="a">BATCHLOAD</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">ebrary</subfield><subfield code="b">EBRY</subfield><subfield code="n">ebr10174034</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBSCOhost</subfield><subfield code="b">EBSC</subfield><subfield code="n">167306</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">2470486</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">ProQuest Ebook Central</subfield><subfield code="b">EBLB</subfield><subfield code="n">EBL296120</subfield></datafield><datafield tag="994" ind1=" " ind2=" "><subfield code="a">92</subfield><subfield code="b">GEBAY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBU</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-863</subfield></datafield></record></collection> |
genre | proceedings (reports) aat Conference papers and proceedings fast Conference papers and proceedings. lcgft http://id.loc.gov/authorities/genreForms/gf2014026068 Actes de congrès. rvmgf |
genre_facet | proceedings (reports) Conference papers and proceedings Conference papers and proceedings. Actes de congrès. |
id | ZDB-4-EBU-ocn191945165 |
illustrated | Illustrated |
indexdate | 2024-07-16T15:03:40Z |
institution | BVB |
institution_GND | http://id.loc.gov/authorities/names/no2005070485 |
isbn | 9812701370 9789812701374 9789812560254 9812560254 1281897094 9781281897091 9786611897093 6611897097 |
language | English |
oclc_num | 191945165 |
open_access_boolean | |
owner | MAIN DE-863 DE-BY-FWS |
owner_facet | MAIN DE-863 DE-BY-FWS |
physical | 1 online resource (x, 317 pages) : illustrations (some color) |
psigel | ZDB-4-EBU |
publishDate | 2004 |
publishDateSearch | 2004 |
publishDateSort | 2004 |
publisher | World Scientific, |
record_format | marc |
series | Series in popular science ; |
series2 | Series in popular science ; |
spelling | Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier. Scientific detection of fakery in art and philately Singapore ; Hackensack, N.J. : World Scientific, ©2004. 1 online resource (x, 317 pages) : illustrations (some color) text txt rdacontent computer c rdamedia online resource cr rdacarrier data file Series in popular science ; v. 4 "Based on the proceedings of the symposium held at Photonics East 1999 [in Boston on September 20-21, 1999], sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." Includes bibliographical references. Print version record. Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX. Now that the sale of a Picasso painting has exceeded US $100 million at auction, the forgers are extricating their bag of tricks. This fascinating collection of papers provides an eclectic coverage of the art and philatelic concerns in safeguarding the integrity of creative artists. It paints a broader swath of the problems in art authentication, including philatelic fraud. The articles represent 24 expert contributions on relevant topics pertaining to the scientific detection of forgery in art and philately. English. Art Forgeries Congresses. Art Radiography Congresses. Art Expertising Congresses. Expertising, X-ray Congresses. Science and the arts Congresses. Art and science Congresses. Art Faux Congrès. Art Radiographie Congrès. Art Expertise Congrès. Expertise par rayons X Congrès. Sciences et arts Congrès. Art et sciences Congrès. TRAVEL Museums, Tours, Points of Interest. bisacsh BUSINESS & ECONOMICS Museum Administration & Museology. bisacsh REFERENCE General. bisacsh Art and science fast Art Expertising fast Art Forgeries fast Art Radiography fast Expertising, X-ray fast Science and the arts fast Vervalsing. gtt Detectie. gtt Wetenschappelijke technieken. gtt proceedings (reports) aat Conference papers and proceedings fast Conference papers and proceedings. lcgft http://id.loc.gov/authorities/genreForms/gf2014026068 Actes de congrès. rvmgf Weiss, Richard J. (Richard Jerome), 1923- https://id.oclc.org/worldcat/entity/E39PBJtX7G6mwQq9qHQjx3myBP http://id.loc.gov/authorities/names/n85800667 Chartier, Duane R. Society of Photo-Optical Instrumentation Engineers. International Center for Art Intelligence. http://id.loc.gov/authorities/names/no2005070485 Philatelic Fakes Forgeries and Experts. has work: Fakebusters II (Text) https://id.oclc.org/worldcat/entity/E39PCFXjkqD6hTwYddwG6GCKbb https://id.oclc.org/worldcat/ontology/hasWork Print version: Fakebusters II. Singapore ; Hackensack, N.J. : World Scientific, ©2004 9812560254 (OCoLC)57515896 Series in popular science ; v. 4. http://id.loc.gov/authorities/names/n96115337 FWS01 ZDB-4-EBU FWS_PDA_EBU https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306 Volltext |
spellingShingle | Fakebusters II : scientific detection of fakery in art and philately / Series in popular science ; Table of Contents; 1. Preface; 2. R.W. WOOD: FAKEBUSTER EXTRAORDINAIRE; 3. Art Fakes and the Statue of Limitations; 4. Determination of Authenticity of Engraved Scrimshaw; 5. SCIENTIFIC DETECTION OF PHILATELIC FORGERIES; 6. Insurability of Art; 7. DNA as a Security Marker; 8. Authentication at a Small Museum: the Kindness of Strangers; 9. ART IN TRANSIT: INTERNATIONAL TRANSPORTATION OF FINE ART; 10. The Use of Raman Spectroscopy in the Art World; 11. Fakes, Forgeries, and Experts (FFE); 12. Madame Curie; 13. Non-Destructive Analysis of Artifacts by Using XRF, FTIR, and SEM/EDX. Art Forgeries Congresses. Art Radiography Congresses. Art Expertising Congresses. Expertising, X-ray Congresses. Science and the arts Congresses. Art and science Congresses. Art Faux Congrès. Art Radiographie Congrès. Art Expertise Congrès. Expertise par rayons X Congrès. Sciences et arts Congrès. Art et sciences Congrès. TRAVEL Museums, Tours, Points of Interest. bisacsh BUSINESS & ECONOMICS Museum Administration & Museology. bisacsh REFERENCE General. bisacsh Art and science fast Art Expertising fast Art Forgeries fast Art Radiography fast Expertising, X-ray fast Science and the arts fast Vervalsing. gtt Detectie. gtt Wetenschappelijke technieken. gtt |
subject_GND | http://id.loc.gov/authorities/genreForms/gf2014026068 |
title | Fakebusters II : scientific detection of fakery in art and philately / |
title_alt | Scientific detection of fakery in art and philately |
title_auth | Fakebusters II : scientific detection of fakery in art and philately / |
title_exact_search | Fakebusters II : scientific detection of fakery in art and philately / |
title_full | Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier. |
title_fullStr | Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier. |
title_full_unstemmed | Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier. |
title_short | Fakebusters II : |
title_sort | fakebusters ii scientific detection of fakery in art and philately |
title_sub | scientific detection of fakery in art and philately / |
topic | Art Forgeries Congresses. Art Radiography Congresses. Art Expertising Congresses. Expertising, X-ray Congresses. Science and the arts Congresses. Art and science Congresses. Art Faux Congrès. Art Radiographie Congrès. Art Expertise Congrès. Expertise par rayons X Congrès. Sciences et arts Congrès. Art et sciences Congrès. TRAVEL Museums, Tours, Points of Interest. bisacsh BUSINESS & ECONOMICS Museum Administration & Museology. bisacsh REFERENCE General. bisacsh Art and science fast Art Expertising fast Art Forgeries fast Art Radiography fast Expertising, X-ray fast Science and the arts fast Vervalsing. gtt Detectie. gtt Wetenschappelijke technieken. gtt |
topic_facet | Art Forgeries Congresses. Art Radiography Congresses. Art Expertising Congresses. Expertising, X-ray Congresses. Science and the arts Congresses. Art and science Congresses. Art Faux Congrès. Art Radiographie Congrès. Art Expertise Congrès. Expertise par rayons X Congrès. Sciences et arts Congrès. Art et sciences Congrès. TRAVEL Museums, Tours, Points of Interest. BUSINESS & ECONOMICS Museum Administration & Museology. REFERENCE General. Art and science Art Expertising Art Forgeries Art Radiography Expertising, X-ray Science and the arts Vervalsing. Detectie. Wetenschappelijke technieken. proceedings (reports) Conference papers and proceedings Conference papers and proceedings. Actes de congrès. |
url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=167306 |
work_keys_str_mv | AT weissrichardj fakebustersiiscientificdetectionoffakeryinartandphilately AT chartierduaner fakebustersiiscientificdetectionoffakeryinartandphilately AT societyofphotoopticalinstrumentationengineers fakebustersiiscientificdetectionoffakeryinartandphilately AT internationalcenterforartintelligence fakebustersiiscientificdetectionoffakeryinartandphilately AT philatelicfakesforgeriesandexperts fakebustersiiscientificdetectionoffakeryinartandphilately AT weissrichardj scientificdetectionoffakeryinartandphilately AT chartierduaner scientificdetectionoffakeryinartandphilately AT societyofphotoopticalinstrumentationengineers scientificdetectionoffakeryinartandphilately AT internationalcenterforartintelligence scientificdetectionoffakeryinartandphilately AT philatelicfakesforgeriesandexperts scientificdetectionoffakeryinartandphilately |