High-power radio frequency effects on electronic systems:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Norwood, MA
Artech House
[2020]
|
| Schriftenreihe: | Artech House electromagnetic analysis series.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | 1 online resource |
| Bibliographie: | Includes bibliographical references and index |
| ISBN: | 9781630815899 1630815896 |
Internformat
MARC
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| 245 | 1 | 0 | |a High-power radio frequency effects on electronic systems |c D.V. Giri, Richard Hoad, Frank Sabath. |
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| 588 | |a Description based on online resource; title from PDF title page (viewed on June 12, 2020) | ||
| 504 | |a Includes bibliographical references and index | ||
| 505 | 0 | |a High-Power Electromagnetic Effects on Electronic Systems -- Contents -- Foreword -- Acknowledgments -- 1 Introduction -- 1.1 Reliance on Electronics -- 1.2 HPEM Environment Overview -- 1.3 HPEM Effects Overview -- 1.4 A Brief History of EM Interference and Effects -- 1.5 A Systems-of-Systems Hierarchy -- 1.5.1 Device -- 1.5.2 Circuit -- 1.5.3 Equipment -- 1.5.4 System -- 1.5.5 Network -- 1.5.6 Infrastructure -- 1.6 Summary -- References -- 2 HPEM Environments -- 2.1 Introduction -- 2.2 Lightning -- 2.2.1 Overview -- 2.2.2 Lightning-Radiated Environment -- 2.3 Nuclear EM Pulse | |
| 505 | 8 | |a 2.3.1 HEMP-Radiated Environment -- 2.3.2 HEMP-Conducted Environment -- 2.3.3 Open-Source Accounts of HEMP Disturbances -- 2.3.4 HEMP Environment Summary -- 2.4 High-Power RF Directed Energy Environments -- 2.4.1 The Status of HPRF DE Systems Today -- 2.5 Intentional EM Interference Environments -- 2.5.1 IEMI Technical Capability Groups -- 2.5.2 IEMI Environment Summary -- 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action -- 2.6 Classification of HPRF DE and IEMI Environments -- 2.6.1 Hypoband -- 2.6.2 Mesoband -- 2.6.3 Hyperband -- 2.7 Summary -- References -- 3 HPEM Coupling and Interaction | |
| 505 | 8 | |a 3.1 EM Interaction Coupling Model -- 3.2 Topological Concept -- 3.3 Transfer Functions -- 3.3.1 Antenna Transfer Function -- 3.3.2 Free-Space Wave Propagation -- 3.3.3 Coupling/Radiation Efficiency -- 3.3.4 Diffusion Penetration -- 3.3.5 Aperture Penetration -- 3.3.6 Conducted Propagation -- 3.3.7 Galvanic, Capacitive, and Magnetic Coupling -- 3.3.8 Capacitive Coupling -- 3.3.9 Inductive Coupling -- 3.4 Field Variation Inside System Enclosure -- 3.5 Overall Response -- 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure -- 3.5.2 Coupling as a Function of HPEM Environment Type | |
| 505 | 8 | |a References -- 4 Overview of HPEM Test Facilities and Techniques -- 4.1 Introduction -- 4.1.1 General Considerations for the Scenario -- 4.1.2 General Considerations for HPEM Environment Simulation -- 4.1.3 General Considerations of the SUT -- 4.1.4 Summary -- 4.2 Uncertainty in Effects Testing -- 4.3 HPEM Effects Test Methods and Facilities -- 4.3.1 HPEM-Radiated Testing -- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation -- 4.3.3 Measuring the Radiated HPEM Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM Conducted Testing | |
| 505 | 8 | |a 4.3.6 Measuring the Conducted HPEM Environment -- 4.4 Exercising and Observing the SUT -- 4.5 Effects Data Presentation -- 4.6 Other Practical Considerations for HPEM Effects Testing -- 4.7 Summary -- References -- 5 HPEM Effects Mechanisms -- 5.1 Introduction -- 5.2 Terminology -- 5.2.1 About This Chapter -- 5.3 Device and Circuit-Level Effects -- 5.3.1 Rectification -- 5.3.2 Noise -- 5.3.3 Interference or Jamming -- 5.3.4 Saturation -- 5.3.5 Shift in Operating Point -- 5.3.6 False Information -- 5.3.7 Transient Upset -- 5.3.8 Chaotic Effects -- 5.3.9 Damage and Destruction | |
| 505 | 8 | |a 5.3.10 Published Device and Circuit-Level Effects Data | |
| 650 | 0 | |a Electromagnetic compatibility. |0 http://id.loc.gov/authorities/subjects/sh85042167 | |
| 650 | 6 | |a Compatibilité électromagnétique. | |
| 650 | 7 | |a Electromagnetic compatibility |2 fast | |
| 700 | 1 | |a Hoad, Richard |e author | |
| 700 | 1 | |a Sabath, Frank |e author | |
| 776 | 0 | 8 | |i Print version: |a Giri, D. V. |t High-Power Electromagnetic Effects on Electronic Systems |d Norwood : Artech House, c2020 |z 9781630815882 |
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| adam_text | |
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| author | Giri, D. V. Hoad, Richard Sabath, Frank |
| author_facet | Giri, D. V. Hoad, Richard Sabath, Frank |
| author_role | aut aut aut |
| author_sort | Giri, D. V. |
| author_variant | d v g dv dvg r h rh f s fs |
| building | Verbundindex |
| bvnumber | localFWS |
| callnumber-first | T - Technology |
| callnumber-label | TK7867 |
| callnumber-raw | TK7867.2 .G57 2020 |
| callnumber-search | TK7867.2 .G57 2020 |
| callnumber-sort | TK 47867.2 G57 42020 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | ZDB-4-EBA |
| contents | High-Power Electromagnetic Effects on Electronic Systems -- Contents -- Foreword -- Acknowledgments -- 1 Introduction -- 1.1 Reliance on Electronics -- 1.2 HPEM Environment Overview -- 1.3 HPEM Effects Overview -- 1.4 A Brief History of EM Interference and Effects -- 1.5 A Systems-of-Systems Hierarchy -- 1.5.1 Device -- 1.5.2 Circuit -- 1.5.3 Equipment -- 1.5.4 System -- 1.5.5 Network -- 1.5.6 Infrastructure -- 1.6 Summary -- References -- 2 HPEM Environments -- 2.1 Introduction -- 2.2 Lightning -- 2.2.1 Overview -- 2.2.2 Lightning-Radiated Environment -- 2.3 Nuclear EM Pulse 2.3.1 HEMP-Radiated Environment -- 2.3.2 HEMP-Conducted Environment -- 2.3.3 Open-Source Accounts of HEMP Disturbances -- 2.3.4 HEMP Environment Summary -- 2.4 High-Power RF Directed Energy Environments -- 2.4.1 The Status of HPRF DE Systems Today -- 2.5 Intentional EM Interference Environments -- 2.5.1 IEMI Technical Capability Groups -- 2.5.2 IEMI Environment Summary -- 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action -- 2.6 Classification of HPRF DE and IEMI Environments -- 2.6.1 Hypoband -- 2.6.2 Mesoband -- 2.6.3 Hyperband -- 2.7 Summary -- References -- 3 HPEM Coupling and Interaction 3.1 EM Interaction Coupling Model -- 3.2 Topological Concept -- 3.3 Transfer Functions -- 3.3.1 Antenna Transfer Function -- 3.3.2 Free-Space Wave Propagation -- 3.3.3 Coupling/Radiation Efficiency -- 3.3.4 Diffusion Penetration -- 3.3.5 Aperture Penetration -- 3.3.6 Conducted Propagation -- 3.3.7 Galvanic, Capacitive, and Magnetic Coupling -- 3.3.8 Capacitive Coupling -- 3.3.9 Inductive Coupling -- 3.4 Field Variation Inside System Enclosure -- 3.5 Overall Response -- 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure -- 3.5.2 Coupling as a Function of HPEM Environment Type References -- 4 Overview of HPEM Test Facilities and Techniques -- 4.1 Introduction -- 4.1.1 General Considerations for the Scenario -- 4.1.2 General Considerations for HPEM Environment Simulation -- 4.1.3 General Considerations of the SUT -- 4.1.4 Summary -- 4.2 Uncertainty in Effects Testing -- 4.3 HPEM Effects Test Methods and Facilities -- 4.3.1 HPEM-Radiated Testing -- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation -- 4.3.3 Measuring the Radiated HPEM Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM Conducted Testing 4.3.6 Measuring the Conducted HPEM Environment -- 4.4 Exercising and Observing the SUT -- 4.5 Effects Data Presentation -- 4.6 Other Practical Considerations for HPEM Effects Testing -- 4.7 Summary -- References -- 5 HPEM Effects Mechanisms -- 5.1 Introduction -- 5.2 Terminology -- 5.2.1 About This Chapter -- 5.3 Device and Circuit-Level Effects -- 5.3.1 Rectification -- 5.3.2 Noise -- 5.3.3 Interference or Jamming -- 5.3.4 Saturation -- 5.3.5 Shift in Operating Point -- 5.3.6 False Information -- 5.3.7 Transient Upset -- 5.3.8 Chaotic Effects -- 5.3.9 Damage and Destruction 5.3.10 Published Device and Circuit-Level Effects Data |
| ctrlnum | (OCoLC)1151184663 |
| dewey-full | 621.382/24 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.382/24 |
| dewey-search | 621.382/24 |
| dewey-sort | 3621.382 224 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | ZDB-4-EBA-on1151184663 |
| illustrated | Not Illustrated |
| indexdate | 2024-11-27T13:29:51Z |
| institution | BVB |
| isbn | 9781630815899 1630815896 |
| language | English |
| oclc_num | 1151184663 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource |
| psigel | ZDB-4-EBA |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Artech House |
| record_format | marc |
| series | Artech House electromagnetic analysis series. |
| series2 | Artech House electromagnetics series |
| spelling | Giri, D. V. author High-power radio frequency effects on electronic systems D.V. Giri, Richard Hoad, Frank Sabath. Norwood, MA Artech House [2020] 1 online resource text txt rdacontent computer c rdamedia online resource cr rdacarrier Artech House electromagnetics series Description based on online resource; title from PDF title page (viewed on June 12, 2020) Includes bibliographical references and index High-Power Electromagnetic Effects on Electronic Systems -- Contents -- Foreword -- Acknowledgments -- 1 Introduction -- 1.1 Reliance on Electronics -- 1.2 HPEM Environment Overview -- 1.3 HPEM Effects Overview -- 1.4 A Brief History of EM Interference and Effects -- 1.5 A Systems-of-Systems Hierarchy -- 1.5.1 Device -- 1.5.2 Circuit -- 1.5.3 Equipment -- 1.5.4 System -- 1.5.5 Network -- 1.5.6 Infrastructure -- 1.6 Summary -- References -- 2 HPEM Environments -- 2.1 Introduction -- 2.2 Lightning -- 2.2.1 Overview -- 2.2.2 Lightning-Radiated Environment -- 2.3 Nuclear EM Pulse 2.3.1 HEMP-Radiated Environment -- 2.3.2 HEMP-Conducted Environment -- 2.3.3 Open-Source Accounts of HEMP Disturbances -- 2.3.4 HEMP Environment Summary -- 2.4 High-Power RF Directed Energy Environments -- 2.4.1 The Status of HPRF DE Systems Today -- 2.5 Intentional EM Interference Environments -- 2.5.1 IEMI Technical Capability Groups -- 2.5.2 IEMI Environment Summary -- 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action -- 2.6 Classification of HPRF DE and IEMI Environments -- 2.6.1 Hypoband -- 2.6.2 Mesoband -- 2.6.3 Hyperband -- 2.7 Summary -- References -- 3 HPEM Coupling and Interaction 3.1 EM Interaction Coupling Model -- 3.2 Topological Concept -- 3.3 Transfer Functions -- 3.3.1 Antenna Transfer Function -- 3.3.2 Free-Space Wave Propagation -- 3.3.3 Coupling/Radiation Efficiency -- 3.3.4 Diffusion Penetration -- 3.3.5 Aperture Penetration -- 3.3.6 Conducted Propagation -- 3.3.7 Galvanic, Capacitive, and Magnetic Coupling -- 3.3.8 Capacitive Coupling -- 3.3.9 Inductive Coupling -- 3.4 Field Variation Inside System Enclosure -- 3.5 Overall Response -- 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure -- 3.5.2 Coupling as a Function of HPEM Environment Type References -- 4 Overview of HPEM Test Facilities and Techniques -- 4.1 Introduction -- 4.1.1 General Considerations for the Scenario -- 4.1.2 General Considerations for HPEM Environment Simulation -- 4.1.3 General Considerations of the SUT -- 4.1.4 Summary -- 4.2 Uncertainty in Effects Testing -- 4.3 HPEM Effects Test Methods and Facilities -- 4.3.1 HPEM-Radiated Testing -- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation -- 4.3.3 Measuring the Radiated HPEM Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM Conducted Testing 4.3.6 Measuring the Conducted HPEM Environment -- 4.4 Exercising and Observing the SUT -- 4.5 Effects Data Presentation -- 4.6 Other Practical Considerations for HPEM Effects Testing -- 4.7 Summary -- References -- 5 HPEM Effects Mechanisms -- 5.1 Introduction -- 5.2 Terminology -- 5.2.1 About This Chapter -- 5.3 Device and Circuit-Level Effects -- 5.3.1 Rectification -- 5.3.2 Noise -- 5.3.3 Interference or Jamming -- 5.3.4 Saturation -- 5.3.5 Shift in Operating Point -- 5.3.6 False Information -- 5.3.7 Transient Upset -- 5.3.8 Chaotic Effects -- 5.3.9 Damage and Destruction 5.3.10 Published Device and Circuit-Level Effects Data Electromagnetic compatibility. http://id.loc.gov/authorities/subjects/sh85042167 Compatibilité électromagnétique. Electromagnetic compatibility fast Hoad, Richard author Sabath, Frank author Print version: Giri, D. V. High-Power Electromagnetic Effects on Electronic Systems Norwood : Artech House, c2020 9781630815882 Artech House electromagnetic analysis series. http://id.loc.gov/authorities/names/n2002010185 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2450271 Volltext |
| spellingShingle | Giri, D. V. Hoad, Richard Sabath, Frank High-power radio frequency effects on electronic systems Artech House electromagnetic analysis series. High-Power Electromagnetic Effects on Electronic Systems -- Contents -- Foreword -- Acknowledgments -- 1 Introduction -- 1.1 Reliance on Electronics -- 1.2 HPEM Environment Overview -- 1.3 HPEM Effects Overview -- 1.4 A Brief History of EM Interference and Effects -- 1.5 A Systems-of-Systems Hierarchy -- 1.5.1 Device -- 1.5.2 Circuit -- 1.5.3 Equipment -- 1.5.4 System -- 1.5.5 Network -- 1.5.6 Infrastructure -- 1.6 Summary -- References -- 2 HPEM Environments -- 2.1 Introduction -- 2.2 Lightning -- 2.2.1 Overview -- 2.2.2 Lightning-Radiated Environment -- 2.3 Nuclear EM Pulse 2.3.1 HEMP-Radiated Environment -- 2.3.2 HEMP-Conducted Environment -- 2.3.3 Open-Source Accounts of HEMP Disturbances -- 2.3.4 HEMP Environment Summary -- 2.4 High-Power RF Directed Energy Environments -- 2.4.1 The Status of HPRF DE Systems Today -- 2.5 Intentional EM Interference Environments -- 2.5.1 IEMI Technical Capability Groups -- 2.5.2 IEMI Environment Summary -- 2.5.3 Open-Source Accounts of HPRF DE and IEMI Action -- 2.6 Classification of HPRF DE and IEMI Environments -- 2.6.1 Hypoband -- 2.6.2 Mesoband -- 2.6.3 Hyperband -- 2.7 Summary -- References -- 3 HPEM Coupling and Interaction 3.1 EM Interaction Coupling Model -- 3.2 Topological Concept -- 3.3 Transfer Functions -- 3.3.1 Antenna Transfer Function -- 3.3.2 Free-Space Wave Propagation -- 3.3.3 Coupling/Radiation Efficiency -- 3.3.4 Diffusion Penetration -- 3.3.5 Aperture Penetration -- 3.3.6 Conducted Propagation -- 3.3.7 Galvanic, Capacitive, and Magnetic Coupling -- 3.3.8 Capacitive Coupling -- 3.3.9 Inductive Coupling -- 3.4 Field Variation Inside System Enclosure -- 3.5 Overall Response -- 3.5.1 Devices, Equipment, Systems, Networks, and Infrastructure -- 3.5.2 Coupling as a Function of HPEM Environment Type References -- 4 Overview of HPEM Test Facilities and Techniques -- 4.1 Introduction -- 4.1.1 General Considerations for the Scenario -- 4.1.2 General Considerations for HPEM Environment Simulation -- 4.1.3 General Considerations of the SUT -- 4.1.4 Summary -- 4.2 Uncertainty in Effects Testing -- 4.3 HPEM Effects Test Methods and Facilities -- 4.3.1 HPEM-Radiated Testing -- 4.3.2 HPEM-Radiated Test Facilities and HPEM Environment Simulation -- 4.3.3 Measuring the Radiated HPEM Environment -- 4.3.4 The Measurement Chain -- 4.3.5 HPEM Conducted Testing 4.3.6 Measuring the Conducted HPEM Environment -- 4.4 Exercising and Observing the SUT -- 4.5 Effects Data Presentation -- 4.6 Other Practical Considerations for HPEM Effects Testing -- 4.7 Summary -- References -- 5 HPEM Effects Mechanisms -- 5.1 Introduction -- 5.2 Terminology -- 5.2.1 About This Chapter -- 5.3 Device and Circuit-Level Effects -- 5.3.1 Rectification -- 5.3.2 Noise -- 5.3.3 Interference or Jamming -- 5.3.4 Saturation -- 5.3.5 Shift in Operating Point -- 5.3.6 False Information -- 5.3.7 Transient Upset -- 5.3.8 Chaotic Effects -- 5.3.9 Damage and Destruction 5.3.10 Published Device and Circuit-Level Effects Data Electromagnetic compatibility. http://id.loc.gov/authorities/subjects/sh85042167 Compatibilité électromagnétique. Electromagnetic compatibility fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh85042167 |
| title | High-power radio frequency effects on electronic systems |
| title_auth | High-power radio frequency effects on electronic systems |
| title_exact_search | High-power radio frequency effects on electronic systems |
| title_full | High-power radio frequency effects on electronic systems D.V. Giri, Richard Hoad, Frank Sabath. |
| title_fullStr | High-power radio frequency effects on electronic systems D.V. Giri, Richard Hoad, Frank Sabath. |
| title_full_unstemmed | High-power radio frequency effects on electronic systems D.V. Giri, Richard Hoad, Frank Sabath. |
| title_short | High-power radio frequency effects on electronic systems |
| title_sort | high power radio frequency effects on electronic systems |
| topic | Electromagnetic compatibility. http://id.loc.gov/authorities/subjects/sh85042167 Compatibilité électromagnétique. Electromagnetic compatibility fast |
| topic_facet | Electromagnetic compatibility. Compatibilité électromagnétique. Electromagnetic compatibility |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2450271 |
| work_keys_str_mv | AT giridv highpowerradiofrequencyeffectsonelectronicsystems AT hoadrichard highpowerradiofrequencyeffectsonelectronicsystems AT sabathfrank highpowerradiofrequencyeffectsonelectronicsystems |