Microelectronics failure analysis :: desk reference /
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, Ohio :
ASM International,
[2019]
|
| Ausgabe: | Seventh edition. |
| Schlagworte: | |
| Online-Zugang: | DE-862 DE-863 |
| Beschreibung: | "An ASM materials solutions publication." "EDFAS, Electronic Device Failure Analysis Society, ASM International." |
| Beschreibung: | 1 online resource (xi, 705 pages) : illustrations (some color) |
| Bibliographie: | Includes bibliographical references and indexes. |
| ISBN: | 9781627082471 1627082476 9781627082464 1627082468 9781523126323 1523126329 |
Internformat
MARC
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| 245 | 0 | 0 | |a Microelectronics failure analysis : |b desk reference / |c edited by Tejinder Gandhi. |
| 250 | |a Seventh edition. | ||
| 264 | 1 | |a Materials Park, Ohio : |b ASM International, |c [2019] | |
| 264 | 4 | |c ©2019 | |
| 300 | |a 1 online resource (xi, 705 pages) : |b illustrations (some color) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a "An ASM materials solutions publication." | ||
| 500 | |a "EDFAS, Electronic Device Failure Analysis Society, ASM International." | ||
| 504 | |a Includes bibliographical references and indexes. | ||
| 505 | 0 | |a Intro; 01_Overview of Wafer-level Electrical Failure_Pai inputs_addressed; 03_EDFAS Desk Reference Paper -- Susan Li -- 8-5-2019 -- Final; 04_Non-destructive Techniques for Advanced Board Level Failure Analysis; 05_EDFAS Desk Refrence -- FA Lab management article-final; 06_07A Optical Microscopy for Desk Reference 2010_corrected; 07_X-ray imaging tools for electronic device failure analysis_CSFinal_V4; 08_!PUB-2019_EDFAS_SAM_Update_Final-20190731; Acoustic Microscopy of Semiconductor Packages; Cheryl D. Hartfield; Carl Zeiss SMT Inc., Pleasanton, CA, USA; cheryl.hartfield@zeiss.com | |
| 505 | 8 | |a Thomas M. MooreWaviks Inc., Dallas, TX, USA; tom.moore@waviks.com; Sebastian Brand; Fraunhofer IMWS, Halle, Germany; sebastian.brand@imws.fraunhofer.de; Introduction; History; The C-scan; The Stanford SAM; Today's SAM for IC Package Inspection; Early SAM Applications in the IC Industry; An Important Tool for Popcorn Crack Detection; Theoretical Considerations; Overview: Acoustic Microscopy for IC Package Inspection; Types of Reflected Signal Analysis Modes:; Polarity Analysis of Reflected Signals; Time of Flight Imaging Using Reflected Signals; Resolution and Sensitivity of SAM Inspection | |
| 505 | 8 | |a Transducer SelectionContrast mechanisms in acoustic imaging; Focusing of acoustic waves; Practical Applications of Conventional SAM; Plastic Package Inspection; Inspection of Packages Having High Velocity Substrates; Strategies for Inspection of Packages Having Thin Layers; Imaging Flip Chip Devices; Complementary Nondestructive Techniques; Current Challenges and New Developments; Stacked Die Packages and Increasing 3D Structures; Signal Analysis in Acoustic Microscopy for Enhanced Defect Detection Capabilities; Spectral Analysis and Split-Spectrum Imaging (SSP); Automated Bump Inspection | |
| 505 | 8 | |a Crack Detection by Multimode and Shear-Wave ImagingExtending Package Inspection Capability with Acoustic Ghz-Microscopy: Potential, Application and Challenges; GHz-SAM Imaging of Wirebond Interfaces and Bond Pads; GHz-SAM for the Inspection of Bonding Interfaces in Wafer Bonding; GHz-SAM Inspection for Void Formation in Metallization Lines for Automotive Applications; Inspection of TSVs Using Acoustic GHz-Microscopy; Photo-acoustic GHz-microscopy: an emerging technique?; Summary; Author Contributions; References; 09_04C Srikanth_Keim_Eide__Diagnosis; 010_aorozco-edfas-deskref-7th-ed-v16 | |
| 505 | 8 | |a 011_TDR_EOTPR_TDT_desk_reference_ASM_r4012_Frontsidefinal_9-3-2019; 013_Backside Preparation and Optics Revision4; 014_Corrected Photon emission article (1); 015_Beam fault isolation corrected; 016_Desk Ref_7thEdition_ Thermal detection_V7_new title_rev1; 017_Desk Ref_7thEdition_3DLIT_V6.1; 018_LADA_SDL_Desk_Reference_Final_Final; 019_Laser Voltage Probing Article -; 020_EDFAS_CAD_Navigation_Principles_7th-Ed; 021_05C MDR_Rosenkranz; 022_EDFAS. Transistor Characterization(Final)_8_30; 023_Fundamentals_Nanoprobe_Final; 024_Silicon Device | |
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc. | |
| 650 | 0 | |a Semiconductors |x Defects |v Handbooks, manuals, etc. | |
| 650 | 6 | |a Microélectronique |x Défauts |v Guides, manuels, etc. | |
| 650 | 6 | |a Appareils électroniques |x Essais |v Guides, manuels, etc. | |
| 650 | 6 | |a Semi-conducteurs |x Défauts |v Guides, manuels, etc. | |
| 650 | 7 | |a Electronic apparatus and appliances |x Testing. |2 fast |0 (OCoLC)fst00906837 | |
| 650 | 7 | |a Electronics |x Materials |x Testing. |2 fast |0 (OCoLC)fst00907571 | |
| 650 | 7 | |a Microelectronics |x Materials |x Defects. |2 fast |0 (OCoLC)fst01019772 | |
| 650 | 7 | |a Microelectronics |x Materials |x Testing. |2 fast |0 (OCoLC)fst01019774 | |
| 650 | 7 | |a Semiconductors |x Defects. |2 fast |0 (OCoLC)fst01112211 | |
| 655 | 7 | |a Handbooks and manuals. |2 fast |0 (OCoLC)fst01423877 | |
| 655 | 7 | |a Handbooks and manuals. |2 lcgft | |
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| 700 | 1 | |a Gandhi, Tejinder, |e editor. |0 http://id.loc.gov/authorities/names/nb2020001654 | |
| 710 | 2 | |a ASM International, |e issuing body. |0 http://id.loc.gov/authorities/names/n86066562 | |
| 710 | 2 | |a Electronic Device Failure Analysis Society, |e contributor. |0 http://id.loc.gov/authorities/names/no99092286 | |
| 776 | 0 | 8 | |i Print version: |t Microelectronics failure analysis. |b Seventh edition. |d Materials Park, Ohio : ASM International, 2019 |z 9781627082457 |w (DLC) 2019951107 |w (OCoLC)1126332918 |
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Datensatz im Suchindex
| DE-BY-FWS_katkey | ZDB-4-EBA-on1128706105 |
|---|---|
| _version_ | 1829095318296199168 |
| adam_text | |
| any_adam_object | |
| author2 | Gandhi, Tejinder |
| author2_role | edt |
| author2_variant | t g tg |
| author_GND | http://id.loc.gov/authorities/names/nb2020001654 |
| author_corporate | Electronic Device Failure Analysis Society |
| author_corporate_role | ctb |
| author_facet | Gandhi, Tejinder Electronic Device Failure Analysis Society |
| building | Verbundindex |
| bvnumber | localFWS |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871 .M52 2019 |
| callnumber-search | TK7871 .M52 2019 |
| callnumber-sort | TK 47871 M52 42019 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | ZDB-4-EBA |
| contents | Intro; 01_Overview of Wafer-level Electrical Failure_Pai inputs_addressed; 03_EDFAS Desk Reference Paper -- Susan Li -- 8-5-2019 -- Final; 04_Non-destructive Techniques for Advanced Board Level Failure Analysis; 05_EDFAS Desk Refrence -- FA Lab management article-final; 06_07A Optical Microscopy for Desk Reference 2010_corrected; 07_X-ray imaging tools for electronic device failure analysis_CSFinal_V4; 08_!PUB-2019_EDFAS_SAM_Update_Final-20190731; Acoustic Microscopy of Semiconductor Packages; Cheryl D. Hartfield; Carl Zeiss SMT Inc., Pleasanton, CA, USA; cheryl.hartfield@zeiss.com Thomas M. MooreWaviks Inc., Dallas, TX, USA; tom.moore@waviks.com; Sebastian Brand; Fraunhofer IMWS, Halle, Germany; sebastian.brand@imws.fraunhofer.de; Introduction; History; The C-scan; The Stanford SAM; Today's SAM for IC Package Inspection; Early SAM Applications in the IC Industry; An Important Tool for Popcorn Crack Detection; Theoretical Considerations; Overview: Acoustic Microscopy for IC Package Inspection; Types of Reflected Signal Analysis Modes:; Polarity Analysis of Reflected Signals; Time of Flight Imaging Using Reflected Signals; Resolution and Sensitivity of SAM Inspection Transducer SelectionContrast mechanisms in acoustic imaging; Focusing of acoustic waves; Practical Applications of Conventional SAM; Plastic Package Inspection; Inspection of Packages Having High Velocity Substrates; Strategies for Inspection of Packages Having Thin Layers; Imaging Flip Chip Devices; Complementary Nondestructive Techniques; Current Challenges and New Developments; Stacked Die Packages and Increasing 3D Structures; Signal Analysis in Acoustic Microscopy for Enhanced Defect Detection Capabilities; Spectral Analysis and Split-Spectrum Imaging (SSP); Automated Bump Inspection Crack Detection by Multimode and Shear-Wave ImagingExtending Package Inspection Capability with Acoustic Ghz-Microscopy: Potential, Application and Challenges; GHz-SAM Imaging of Wirebond Interfaces and Bond Pads; GHz-SAM for the Inspection of Bonding Interfaces in Wafer Bonding; GHz-SAM Inspection for Void Formation in Metallization Lines for Automotive Applications; Inspection of TSVs Using Acoustic GHz-Microscopy; Photo-acoustic GHz-microscopy: an emerging technique?; Summary; Author Contributions; References; 09_04C Srikanth_Keim_Eide__Diagnosis; 010_aorozco-edfas-deskref-7th-ed-v16 011_TDR_EOTPR_TDT_desk_reference_ASM_r4012_Frontsidefinal_9-3-2019; 013_Backside Preparation and Optics Revision4; 014_Corrected Photon emission article (1); 015_Beam fault isolation corrected; 016_Desk Ref_7thEdition_ Thermal detection_V7_new title_rev1; 017_Desk Ref_7thEdition_3DLIT_V6.1; 018_LADA_SDL_Desk_Reference_Final_Final; 019_Laser Voltage Probing Article -; 020_EDFAS_CAD_Navigation_Principles_7th-Ed; 021_05C MDR_Rosenkranz; 022_EDFAS. Transistor Characterization(Final)_8_30; 023_Fundamentals_Nanoprobe_Final; 024_Silicon Device |
| ctrlnum | (OCoLC)1128706105 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | Seventh edition. |
| format | Electronic eBook |
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| genre | Handbooks and manuals. fast (OCoLC)fst01423877 Handbooks and manuals. lcgft Guides et manuels. rvmgf |
| genre_facet | Handbooks and manuals. Guides et manuels. |
| id | ZDB-4-EBA-on1128706105 |
| illustrated | Illustrated |
| indexdate | 2025-04-11T08:47:07Z |
| institution | BVB |
| institution_GND | http://id.loc.gov/authorities/names/n86066562 http://id.loc.gov/authorities/names/no99092286 |
| isbn | 9781627082471 1627082476 9781627082464 1627082468 9781523126323 1523126329 |
| language | English |
| oclc_num | 1128706105 |
| open_access_boolean | |
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| physical | 1 online resource (xi, 705 pages) : illustrations (some color) |
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| publishDate | 2019 |
| publishDateSearch | 2019 |
| publishDateSort | 2019 |
| publisher | ASM International, |
| record_format | marc |
| spelling | Microelectronics failure analysis : desk reference / edited by Tejinder Gandhi. Seventh edition. Materials Park, Ohio : ASM International, [2019] ©2019 1 online resource (xi, 705 pages) : illustrations (some color) text txt rdacontent computer c rdamedia online resource cr rdacarrier "An ASM materials solutions publication." "EDFAS, Electronic Device Failure Analysis Society, ASM International." Includes bibliographical references and indexes. Intro; 01_Overview of Wafer-level Electrical Failure_Pai inputs_addressed; 03_EDFAS Desk Reference Paper -- Susan Li -- 8-5-2019 -- Final; 04_Non-destructive Techniques for Advanced Board Level Failure Analysis; 05_EDFAS Desk Refrence -- FA Lab management article-final; 06_07A Optical Microscopy for Desk Reference 2010_corrected; 07_X-ray imaging tools for electronic device failure analysis_CSFinal_V4; 08_!PUB-2019_EDFAS_SAM_Update_Final-20190731; Acoustic Microscopy of Semiconductor Packages; Cheryl D. Hartfield; Carl Zeiss SMT Inc., Pleasanton, CA, USA; cheryl.hartfield@zeiss.com Thomas M. MooreWaviks Inc., Dallas, TX, USA; tom.moore@waviks.com; Sebastian Brand; Fraunhofer IMWS, Halle, Germany; sebastian.brand@imws.fraunhofer.de; Introduction; History; The C-scan; The Stanford SAM; Today's SAM for IC Package Inspection; Early SAM Applications in the IC Industry; An Important Tool for Popcorn Crack Detection; Theoretical Considerations; Overview: Acoustic Microscopy for IC Package Inspection; Types of Reflected Signal Analysis Modes:; Polarity Analysis of Reflected Signals; Time of Flight Imaging Using Reflected Signals; Resolution and Sensitivity of SAM Inspection Transducer SelectionContrast mechanisms in acoustic imaging; Focusing of acoustic waves; Practical Applications of Conventional SAM; Plastic Package Inspection; Inspection of Packages Having High Velocity Substrates; Strategies for Inspection of Packages Having Thin Layers; Imaging Flip Chip Devices; Complementary Nondestructive Techniques; Current Challenges and New Developments; Stacked Die Packages and Increasing 3D Structures; Signal Analysis in Acoustic Microscopy for Enhanced Defect Detection Capabilities; Spectral Analysis and Split-Spectrum Imaging (SSP); Automated Bump Inspection Crack Detection by Multimode and Shear-Wave ImagingExtending Package Inspection Capability with Acoustic Ghz-Microscopy: Potential, Application and Challenges; GHz-SAM Imaging of Wirebond Interfaces and Bond Pads; GHz-SAM for the Inspection of Bonding Interfaces in Wafer Bonding; GHz-SAM Inspection for Void Formation in Metallization Lines for Automotive Applications; Inspection of TSVs Using Acoustic GHz-Microscopy; Photo-acoustic GHz-microscopy: an emerging technique?; Summary; Author Contributions; References; 09_04C Srikanth_Keim_Eide__Diagnosis; 010_aorozco-edfas-deskref-7th-ed-v16 011_TDR_EOTPR_TDT_desk_reference_ASM_r4012_Frontsidefinal_9-3-2019; 013_Backside Preparation and Optics Revision4; 014_Corrected Photon emission article (1); 015_Beam fault isolation corrected; 016_Desk Ref_7thEdition_ Thermal detection_V7_new title_rev1; 017_Desk Ref_7thEdition_3DLIT_V6.1; 018_LADA_SDL_Desk_Reference_Final_Final; 019_Laser Voltage Probing Article -; 020_EDFAS_CAD_Navigation_Principles_7th-Ed; 021_05C MDR_Rosenkranz; 022_EDFAS. Transistor Characterization(Final)_8_30; 023_Fundamentals_Nanoprobe_Final; 024_Silicon Device Print version record. Electronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Defects Handbooks, manuals, etc. Electronic apparatus and appliances Testing Handbooks, manuals, etc. Semiconductors Defects Handbooks, manuals, etc. Microélectronique Défauts Guides, manuels, etc. Appareils électroniques Essais Guides, manuels, etc. Semi-conducteurs Défauts Guides, manuels, etc. Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Electronics Materials Testing. fast (OCoLC)fst00907571 Microelectronics Materials Defects. fast (OCoLC)fst01019772 Microelectronics Materials Testing. fast (OCoLC)fst01019774 Semiconductors Defects. fast (OCoLC)fst01112211 Handbooks and manuals. fast (OCoLC)fst01423877 Handbooks and manuals. lcgft Guides et manuels. rvmgf Gandhi, Tejinder, editor. http://id.loc.gov/authorities/names/nb2020001654 ASM International, issuing body. http://id.loc.gov/authorities/names/n86066562 Electronic Device Failure Analysis Society, contributor. http://id.loc.gov/authorities/names/no99092286 Print version: Microelectronics failure analysis. Seventh edition. Materials Park, Ohio : ASM International, 2019 9781627082457 (DLC) 2019951107 (OCoLC)1126332918 |
| spellingShingle | Microelectronics failure analysis : desk reference / Intro; 01_Overview of Wafer-level Electrical Failure_Pai inputs_addressed; 03_EDFAS Desk Reference Paper -- Susan Li -- 8-5-2019 -- Final; 04_Non-destructive Techniques for Advanced Board Level Failure Analysis; 05_EDFAS Desk Refrence -- FA Lab management article-final; 06_07A Optical Microscopy for Desk Reference 2010_corrected; 07_X-ray imaging tools for electronic device failure analysis_CSFinal_V4; 08_!PUB-2019_EDFAS_SAM_Update_Final-20190731; Acoustic Microscopy of Semiconductor Packages; Cheryl D. Hartfield; Carl Zeiss SMT Inc., Pleasanton, CA, USA; cheryl.hartfield@zeiss.com Thomas M. MooreWaviks Inc., Dallas, TX, USA; tom.moore@waviks.com; Sebastian Brand; Fraunhofer IMWS, Halle, Germany; sebastian.brand@imws.fraunhofer.de; Introduction; History; The C-scan; The Stanford SAM; Today's SAM for IC Package Inspection; Early SAM Applications in the IC Industry; An Important Tool for Popcorn Crack Detection; Theoretical Considerations; Overview: Acoustic Microscopy for IC Package Inspection; Types of Reflected Signal Analysis Modes:; Polarity Analysis of Reflected Signals; Time of Flight Imaging Using Reflected Signals; Resolution and Sensitivity of SAM Inspection Transducer SelectionContrast mechanisms in acoustic imaging; Focusing of acoustic waves; Practical Applications of Conventional SAM; Plastic Package Inspection; Inspection of Packages Having High Velocity Substrates; Strategies for Inspection of Packages Having Thin Layers; Imaging Flip Chip Devices; Complementary Nondestructive Techniques; Current Challenges and New Developments; Stacked Die Packages and Increasing 3D Structures; Signal Analysis in Acoustic Microscopy for Enhanced Defect Detection Capabilities; Spectral Analysis and Split-Spectrum Imaging (SSP); Automated Bump Inspection Crack Detection by Multimode and Shear-Wave ImagingExtending Package Inspection Capability with Acoustic Ghz-Microscopy: Potential, Application and Challenges; GHz-SAM Imaging of Wirebond Interfaces and Bond Pads; GHz-SAM for the Inspection of Bonding Interfaces in Wafer Bonding; GHz-SAM Inspection for Void Formation in Metallization Lines for Automotive Applications; Inspection of TSVs Using Acoustic GHz-Microscopy; Photo-acoustic GHz-microscopy: an emerging technique?; Summary; Author Contributions; References; 09_04C Srikanth_Keim_Eide__Diagnosis; 010_aorozco-edfas-deskref-7th-ed-v16 011_TDR_EOTPR_TDT_desk_reference_ASM_r4012_Frontsidefinal_9-3-2019; 013_Backside Preparation and Optics Revision4; 014_Corrected Photon emission article (1); 015_Beam fault isolation corrected; 016_Desk Ref_7thEdition_ Thermal detection_V7_new title_rev1; 017_Desk Ref_7thEdition_3DLIT_V6.1; 018_LADA_SDL_Desk_Reference_Final_Final; 019_Laser Voltage Probing Article -; 020_EDFAS_CAD_Navigation_Principles_7th-Ed; 021_05C MDR_Rosenkranz; 022_EDFAS. Transistor Characterization(Final)_8_30; 023_Fundamentals_Nanoprobe_Final; 024_Silicon Device Electronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Defects Handbooks, manuals, etc. Electronic apparatus and appliances Testing Handbooks, manuals, etc. Semiconductors Defects Handbooks, manuals, etc. Microélectronique Défauts Guides, manuels, etc. Appareils électroniques Essais Guides, manuels, etc. Semi-conducteurs Défauts Guides, manuels, etc. Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Electronics Materials Testing. fast (OCoLC)fst00907571 Microelectronics Materials Defects. fast (OCoLC)fst01019772 Microelectronics Materials Testing. fast (OCoLC)fst01019774 Semiconductors Defects. fast (OCoLC)fst01112211 |
| subject_GND | (OCoLC)fst00906837 (OCoLC)fst00907571 (OCoLC)fst01019772 (OCoLC)fst01019774 (OCoLC)fst01112211 (OCoLC)fst01423877 |
| title | Microelectronics failure analysis : desk reference / |
| title_auth | Microelectronics failure analysis : desk reference / |
| title_exact_search | Microelectronics failure analysis : desk reference / |
| title_full | Microelectronics failure analysis : desk reference / edited by Tejinder Gandhi. |
| title_fullStr | Microelectronics failure analysis : desk reference / edited by Tejinder Gandhi. |
| title_full_unstemmed | Microelectronics failure analysis : desk reference / edited by Tejinder Gandhi. |
| title_short | Microelectronics failure analysis : |
| title_sort | microelectronics failure analysis desk reference |
| title_sub | desk reference / |
| topic | Electronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Defects Handbooks, manuals, etc. Electronic apparatus and appliances Testing Handbooks, manuals, etc. Semiconductors Defects Handbooks, manuals, etc. Microélectronique Défauts Guides, manuels, etc. Appareils électroniques Essais Guides, manuels, etc. Semi-conducteurs Défauts Guides, manuels, etc. Electronic apparatus and appliances Testing. fast (OCoLC)fst00906837 Electronics Materials Testing. fast (OCoLC)fst00907571 Microelectronics Materials Defects. fast (OCoLC)fst01019772 Microelectronics Materials Testing. fast (OCoLC)fst01019774 Semiconductors Defects. fast (OCoLC)fst01112211 |
| topic_facet | Electronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Testing Handbooks, manuals, etc. Microelectronics Materials Defects Handbooks, manuals, etc. Electronic apparatus and appliances Testing Handbooks, manuals, etc. Semiconductors Defects Handbooks, manuals, etc. Microélectronique Défauts Guides, manuels, etc. Appareils électroniques Essais Guides, manuels, etc. Semi-conducteurs Défauts Guides, manuels, etc. Electronic apparatus and appliances Testing. Electronics Materials Testing. Microelectronics Materials Defects. Microelectronics Materials Testing. Semiconductors Defects. Handbooks and manuals. Guides et manuels. |
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