Means and Methods for Measurement and Monitoring :: supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan /
Gespeichert in:
| Körperschaft: | |
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| Weitere Verfasser: | |
| Format: | Elektronisch Tagungsbericht E-Book |
| Sprache: | English |
| Veröffentlicht: |
Zurich, Switzerland :
Trans Tech Publications,
[2019]
|
| Schriftenreihe: | Applied mechanics and materials ;
v. 888. |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | 1 online resource |
| Bibliographie: | Includes bibliographical references. |
| ISBN: | 9783035735536 3035735530 |
Internformat
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| 505 | 0 | |a Intro; Means and Methods for Measurement and Monitoring; Preface; Table of Contents; Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion; Effect of Phase Error in Phase-Shifting Interferometer; Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization; RC Polyphase Filter as Complex Analog Hilbert Filter; Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback; Determination of Phase Shift by Digital Holography; Noise Filter for Surface Shape Measurement in Digital Holography | |
| 505 | 8 | |a High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding; A Torque-Sensorless Viscometer for Food Processing Applications; Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method; Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1; Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source | |
| 505 | 8 | |a A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOSKeyword Index; Author Index | |
| 588 | 0 | |a Online resource; title from digital title page (viewed on May 01, 2019). | |
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| 650 | 0 | |a Mechatronics |x Technological innovations |v Congresses. | |
| 650 | 6 | |a Microsystèmes électromécaniques |x Recherche |v Congrès. | |
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| 650 | 6 | |a Microélectronique |x Innovations |v Congrès. | |
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| contents | Intro; Means and Methods for Measurement and Monitoring; Preface; Table of Contents; Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion; Effect of Phase Error in Phase-Shifting Interferometer; Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization; RC Polyphase Filter as Complex Analog Hilbert Filter; Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback; Determination of Phase Shift by Digital Holography; Noise Filter for Surface Shape Measurement in Digital Holography High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding; A Torque-Sensorless Viscometer for Food Processing Applications; Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method; Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1; Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOSKeyword Index; Author Index |
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| spelling | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / edited by Osamu Hanaizumi. Zurich, Switzerland : Trans Tech Publications, [2019] 1 online resource text txt rdacontent computer c rdamedia online resource cr rdacarrier Applied mechanics and materials ; volume 888 Includes bibliographical references. Intro; Means and Methods for Measurement and Monitoring; Preface; Table of Contents; Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion; Effect of Phase Error in Phase-Shifting Interferometer; Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization; RC Polyphase Filter as Complex Analog Hilbert Filter; Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback; Determination of Phase Shift by Digital Holography; Noise Filter for Surface Shape Measurement in Digital Holography High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding; A Torque-Sensorless Viscometer for Food Processing Applications; Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method; Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1; Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOSKeyword Index; Author Index Online resource; title from digital title page (viewed on May 01, 2019). Nanotechnology Research Congresses. Microelectromechanical systems Research Congresses. Miniature electronic equipment Technological innovations Congresses. Microelectronics Technological innovations Congresses. Mechatronics Technological innovations Congresses. Microsystèmes électromécaniques Recherche Congrès. Équipement électronique miniaturisé Innovations Congrès. Microélectronique Innovations Congrès. Mécatronique Innovations Congrès. TECHNOLOGY & ENGINEERING Engineering (General) bisacsh TECHNOLOGY & ENGINEERING Reference. bisacsh Microelectronics Technological innovations fast Nanotechnology Research fast Conference papers and proceedings fast Hanaizumi, Osamu. http://id.loc.gov/authorities/names/no2011030171 International Conference on Advanced Micro Device Engineering (8th : 2016 : Kiryū-shi, Japan) http://id.loc.gov/authorities/names/n2020064141 has work: Means and Methods for Measurement and Monitoring (Text) https://id.oclc.org/worldcat/entity/E39PCFGJVwyW3YqFxt6fHW98VK https://id.oclc.org/worldcat/ontology/hasWork Print version: Means and Methods for Measurement and Monitoring. Zurich, Switzerland : Trans Tech Publications, [2019] 303571553X 9783035715538 (OCoLC)1083226205 Applied mechanics and materials ; v. 888. http://id.loc.gov/authorities/names/no2009039852 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2030907 Volltext |
| spellingShingle | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / Applied mechanics and materials ; Intro; Means and Methods for Measurement and Monitoring; Preface; Table of Contents; Analysis and Design of Operational Amplifier Stability Using Routh-Hurwitz Stability Criterion; Effect of Phase Error in Phase-Shifting Interferometer; Comparator Synthesis Using Distributed Genetic Algorithm and HSPICE Optimization; RC Polyphase Filter as Complex Analog Hilbert Filter; Rehabilitation Assistance Using Motion Capture Devices and Virtual Reality Feedback; Determination of Phase Shift by Digital Holography; Noise Filter for Surface Shape Measurement in Digital Holography High-Frequency Low-Distortion One-Tone and Two-Tone Signal Generation Using Arbitrary Waveform GeneratorMulti-Valued PAM-N Data Transmission Using Double-Rate Tomlinson-Harashima Precoding; A Torque-Sensorless Viscometer for Food Processing Applications; Effect of Mass Added to a Force Transducer on the Dynamic-Force Correction Method; Another Implementation of Efficient Recoding Circuit for Signed Digit to Residue Canonical Signed Digit on Modulo 2n-1; Electron Density Measurement Using Multi-Energy X-Rays from a Conventional Laboratory X-Ray Source A Study on Physically Based Maximum Electric Field Modeling Used for HCI Induced Degradation Characteristic of LDMOSKeyword Index; Author Index Nanotechnology Research Congresses. Microelectromechanical systems Research Congresses. Miniature electronic equipment Technological innovations Congresses. Microelectronics Technological innovations Congresses. Mechatronics Technological innovations Congresses. Microsystèmes électromécaniques Recherche Congrès. Équipement électronique miniaturisé Innovations Congrès. Microélectronique Innovations Congrès. Mécatronique Innovations Congrès. TECHNOLOGY & ENGINEERING Engineering (General) bisacsh TECHNOLOGY & ENGINEERING Reference. bisacsh Microelectronics Technological innovations fast Nanotechnology Research fast |
| title | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / |
| title_auth | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / |
| title_exact_search | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / |
| title_full | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / edited by Osamu Hanaizumi. |
| title_fullStr | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / edited by Osamu Hanaizumi. |
| title_full_unstemmed | Means and Methods for Measurement and Monitoring : supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / edited by Osamu Hanaizumi. |
| title_short | Means and Methods for Measurement and Monitoring : |
| title_sort | means and methods for measurement and monitoring supplement book to advanced micro device engineering viii selected peer reviewed from the 8th international conference on advanced micro device engineering amde 2016 december 9 2016 kiryu japan |
| title_sub | supplement book to advanced micro-device engineering VIII : selected, peer reviewed from the 8th International Conference on Advanced Micro-Device Engineering AMDE (2016), December 9, 2016, Kiryu, Japan / |
| topic | Nanotechnology Research Congresses. Microelectromechanical systems Research Congresses. Miniature electronic equipment Technological innovations Congresses. Microelectronics Technological innovations Congresses. Mechatronics Technological innovations Congresses. Microsystèmes électromécaniques Recherche Congrès. Équipement électronique miniaturisé Innovations Congrès. Microélectronique Innovations Congrès. Mécatronique Innovations Congrès. TECHNOLOGY & ENGINEERING Engineering (General) bisacsh TECHNOLOGY & ENGINEERING Reference. bisacsh Microelectronics Technological innovations fast Nanotechnology Research fast |
| topic_facet | Nanotechnology Research Congresses. Microelectromechanical systems Research Congresses. Miniature electronic equipment Technological innovations Congresses. Microelectronics Technological innovations Congresses. Mechatronics Technological innovations Congresses. Microsystèmes électromécaniques Recherche Congrès. Équipement électronique miniaturisé Innovations Congrès. Microélectronique Innovations Congrès. Mécatronique Innovations Congrès. TECHNOLOGY & ENGINEERING Engineering (General) TECHNOLOGY & ENGINEERING Reference. Microelectronics Technological innovations Nanotechnology Research Conference papers and proceedings |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2030907 |
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