Dark Count Rate of Silicon Photomultipliers :: Metrological Characterization and Suppression.
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Göttingen :
Cuvillier Verlag,
2018.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Beschreibung: | 1 online resource (195 pages) |
| ISBN: | 9783736998926 3736998929 9783736988927 3736988923 |
Internformat
MARC
| LEADER | 00000cam a2200000Mi 4500 | ||
|---|---|---|---|
| 001 | ZDB-4-EBA-on1066182781 | ||
| 003 | OCoLC | ||
| 005 | 20241004212047.0 | ||
| 006 | m o d | ||
| 007 | cr |n|---||||| | ||
| 008 | 181117s2018 gw o 000 0 eng d | ||
| 040 | |a EBLCP |b eng |e pn |c EBLCP |d MERUC |d OCLCQ |d IDB |d OCLCO |d OCLCF |d YDX |d OCLCQ |d OCLCO |d OCLCQ |d OCLCO |d OCLCL |d N$T |d SXB | ||
| 019 | |a 1103222111 | ||
| 020 | |a 9783736998926 | ||
| 020 | |a 3736998929 | ||
| 020 | |a 9783736988927 |q (electronic bk.) | ||
| 020 | |a 3736988923 |q (electronic bk.) | ||
| 035 | |a (OCoLC)1066182781 |z (OCoLC)1103222111 | ||
| 050 | 4 | |a TA1750 |b .E544 2018eb | |
| 082 | 7 | |a 621.381045 |2 23 | |
| 049 | |a MAIN | ||
| 100 | 1 | |a Engelmann, Eugen. | |
| 245 | 1 | 0 | |a Dark Count Rate of Silicon Photomultipliers : |b Metrological Characterization and Suppression. |
| 260 | |a Göttingen : |b Cuvillier Verlag, |c 2018. | ||
| 300 | |a 1 online resource (195 pages) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Photoelectric multipliers. |0 http://id.loc.gov/authorities/subjects/sh85101162 | |
| 650 | 0 | |a Optoelectronic devices. |0 http://id.loc.gov/authorities/subjects/sh85095200 | |
| 650 | 6 | |a Photomultiplicateurs. | |
| 650 | 6 | |a Dispositifs optoélectroniques. | |
| 650 | 7 | |a Optoelectronic devices |2 fast | |
| 650 | 7 | |a Photoelectric multipliers |2 fast | |
| 655 | 4 | |a Electronic book. | |
| 758 | |i has work: |a Dark count rate of silicon photomultipliers (Text) |1 https://id.oclc.org/worldcat/entity/E39PCGPQpX349C8mmXwYYQ9TDy |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |a Engelmann, Eugen. |t Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. |d Göttingen : Cuvillier Verlag, ©2018 |z 9783736998926 |
| 856 | 4 | 0 | |l FWS01 |p ZDB-4-EBA |q FWS_PDA_EBA |u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2133991 |3 Volltext |
| 938 | |a EBL - Ebook Library |b EBLB |n EBL5574462 | ||
| 938 | |a YBP Library Services |b YANK |n 16251134 | ||
| 938 | |a EBSCOhost |b EBSC |n 2133991 | ||
| 994 | |a 92 |b GEBAY | ||
| 912 | |a ZDB-4-EBA | ||
| 049 | |a DE-863 | ||
Datensatz im Suchindex
| DE-BY-FWS_katkey | ZDB-4-EBA-on1066182781 |
|---|---|
| _version_ | 1816882477176717312 |
| adam_text | |
| any_adam_object | |
| author | Engelmann, Eugen |
| author_facet | Engelmann, Eugen |
| author_role | |
| author_sort | Engelmann, Eugen |
| author_variant | e e ee |
| building | Verbundindex |
| bvnumber | localFWS |
| callnumber-first | T - Technology |
| callnumber-label | TA1750 |
| callnumber-raw | TA1750 .E544 2018eb |
| callnumber-search | TA1750 .E544 2018eb |
| callnumber-sort | TA 41750 E544 42018EB |
| callnumber-subject | TA - General and Civil Engineering |
| collection | ZDB-4-EBA |
| ctrlnum | (OCoLC)1066182781 |
| dewey-full | 621.381045 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381045 |
| dewey-search | 621.381045 |
| dewey-sort | 3621.381045 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02116cam a2200481Mi 4500</leader><controlfield tag="001">ZDB-4-EBA-on1066182781</controlfield><controlfield tag="003">OCoLC</controlfield><controlfield tag="005">20241004212047.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr |n|---|||||</controlfield><controlfield tag="008">181117s2018 gw o 000 0 eng d</controlfield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">EBLCP</subfield><subfield code="b">eng</subfield><subfield code="e">pn</subfield><subfield code="c">EBLCP</subfield><subfield code="d">MERUC</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">IDB</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCF</subfield><subfield code="d">YDX</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCL</subfield><subfield code="d">N$T</subfield><subfield code="d">SXB</subfield></datafield><datafield tag="019" ind1=" " ind2=" "><subfield code="a">1103222111</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783736998926</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3736998929</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783736988927</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3736988923</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1066182781</subfield><subfield code="z">(OCoLC)1103222111</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TA1750</subfield><subfield code="b">.E544 2018eb</subfield></datafield><datafield tag="082" ind1="7" ind2=" "><subfield code="a">621.381045</subfield><subfield code="2">23</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">MAIN</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Engelmann, Eugen.</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Dark Count Rate of Silicon Photomultipliers :</subfield><subfield code="b">Metrological Characterization and Suppression.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Göttingen :</subfield><subfield code="b">Cuvillier Verlag,</subfield><subfield code="c">2018.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (195 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="588" ind1="0" ind2=" "><subfield code="a">Print version record.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Photoelectric multipliers.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh85101162</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Optoelectronic devices.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh85095200</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Photomultiplicateurs.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Dispositifs optoélectroniques.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Optoelectronic devices</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Photoelectric multipliers</subfield><subfield code="2">fast</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic book.</subfield></datafield><datafield tag="758" ind1=" " ind2=" "><subfield code="i">has work:</subfield><subfield code="a">Dark count rate of silicon photomultipliers (Text)</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PCGPQpX349C8mmXwYYQ9TDy</subfield><subfield code="4">https://id.oclc.org/worldcat/ontology/hasWork</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Engelmann, Eugen.</subfield><subfield code="t">Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression.</subfield><subfield code="d">Göttingen : Cuvillier Verlag, ©2018</subfield><subfield code="z">9783736998926</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="l">FWS01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FWS_PDA_EBA</subfield><subfield code="u">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2133991</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBL - Ebook Library</subfield><subfield code="b">EBLB</subfield><subfield code="n">EBL5574462</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">16251134</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBSCOhost</subfield><subfield code="b">EBSC</subfield><subfield code="n">2133991</subfield></datafield><datafield tag="994" ind1=" " ind2=" "><subfield code="a">92</subfield><subfield code="b">GEBAY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-863</subfield></datafield></record></collection> |
| genre | Electronic book. |
| genre_facet | Electronic book. |
| id | ZDB-4-EBA-on1066182781 |
| illustrated | Not Illustrated |
| indexdate | 2024-11-27T13:29:14Z |
| institution | BVB |
| isbn | 9783736998926 3736998929 9783736988927 3736988923 |
| language | English |
| oclc_num | 1066182781 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (195 pages) |
| psigel | ZDB-4-EBA |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Cuvillier Verlag, |
| record_format | marc |
| spelling | Engelmann, Eugen. Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. Göttingen : Cuvillier Verlag, 2018. 1 online resource (195 pages) text txt rdacontent computer c rdamedia online resource cr rdacarrier Print version record. Photoelectric multipliers. http://id.loc.gov/authorities/subjects/sh85101162 Optoelectronic devices. http://id.loc.gov/authorities/subjects/sh85095200 Photomultiplicateurs. Dispositifs optoélectroniques. Optoelectronic devices fast Photoelectric multipliers fast Electronic book. has work: Dark count rate of silicon photomultipliers (Text) https://id.oclc.org/worldcat/entity/E39PCGPQpX349C8mmXwYYQ9TDy https://id.oclc.org/worldcat/ontology/hasWork Print version: Engelmann, Eugen. Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. Göttingen : Cuvillier Verlag, ©2018 9783736998926 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2133991 Volltext |
| spellingShingle | Engelmann, Eugen Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. Photoelectric multipliers. http://id.loc.gov/authorities/subjects/sh85101162 Optoelectronic devices. http://id.loc.gov/authorities/subjects/sh85095200 Photomultiplicateurs. Dispositifs optoélectroniques. Optoelectronic devices fast Photoelectric multipliers fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh85101162 http://id.loc.gov/authorities/subjects/sh85095200 |
| title | Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. |
| title_auth | Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. |
| title_exact_search | Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. |
| title_full | Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. |
| title_fullStr | Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. |
| title_full_unstemmed | Dark Count Rate of Silicon Photomultipliers : Metrological Characterization and Suppression. |
| title_short | Dark Count Rate of Silicon Photomultipliers : |
| title_sort | dark count rate of silicon photomultipliers metrological characterization and suppression |
| title_sub | Metrological Characterization and Suppression. |
| topic | Photoelectric multipliers. http://id.loc.gov/authorities/subjects/sh85101162 Optoelectronic devices. http://id.loc.gov/authorities/subjects/sh85095200 Photomultiplicateurs. Dispositifs optoélectroniques. Optoelectronic devices fast Photoelectric multipliers fast |
| topic_facet | Photoelectric multipliers. Optoelectronic devices. Photomultiplicateurs. Dispositifs optoélectroniques. Optoelectronic devices Photoelectric multipliers Electronic book. |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2133991 |
| work_keys_str_mv | AT engelmanneugen darkcountrateofsiliconphotomultipliersmetrologicalcharacterizationandsuppression |