Electron microscopy and analysis /:
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context.
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton :
CRC Press, Taylor & Francis Group,
2017.
|
| Ausgabe: | Third edition. |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. |
| Beschreibung: | 1 online resource (x, 251 pages) : illustrations |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 9781420017250 142001725X |
Internformat
MARC
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| 100 | 1 | |a Goodhew, Peter J., |e author. |0 http://id.loc.gov/authorities/names/n84223809 | |
| 245 | 1 | 0 | |a Electron microscopy and analysis / |c Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK. |
| 250 | |a Third edition. | ||
| 264 | 1 | |a Boca Raton : |b CRC Press, Taylor & Francis Group, |c 2017. | |
| 264 | 4 | |c ©2001 | |
| 300 | |a 1 online resource (x, 251 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
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| 520 | |a Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques. | |
| 588 | 0 | |a Print version record. | |
| 650 | 0 | |a Electron microscopy. |0 http://id.loc.gov/authorities/subjects/sh85042221 | |
| 650 | 2 | |a Microscopy, Electron |0 https://id.nlm.nih.gov/mesh/D008854 | |
| 650 | 6 | |a Microscopie électronique. | |
| 650 | 7 | |a electron microscopy. |2 aat | |
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| 700 | 1 | |a Humphreys, F. J., |e author. |0 http://id.loc.gov/authorities/names/n87940993 | |
| 700 | 1 | |a Beanland, R., |e author. |0 http://id.loc.gov/authorities/names/n99254722 | |
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Datensatz im Suchindex
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| _version_ | 1816882421141864449 |
| adam_text | |
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| author | Goodhew, Peter J. Humphreys, F. J. Beanland, R. |
| author_GND | http://id.loc.gov/authorities/names/n84223809 http://id.loc.gov/authorities/names/n87940993 http://id.loc.gov/authorities/names/n99254722 |
| author_facet | Goodhew, Peter J. Humphreys, F. J. Beanland, R. |
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| author_sort | Goodhew, Peter J. |
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| contents | Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques. |
| ctrlnum | (OCoLC)1035158181 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | Third edition. |
| format | Electronic eBook |
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| id | ZDB-4-EBA-on1035158181 |
| illustrated | Illustrated |
| indexdate | 2024-11-27T13:28:20Z |
| institution | BVB |
| isbn | 9781420017250 142001725X |
| language | English |
| oclc_num | 1035158181 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (x, 251 pages) : illustrations |
| psigel | ZDB-4-EBA |
| publishDate | 2017 |
| publishDateSearch | 2001 2017 |
| publishDateSort | 2017 |
| publisher | CRC Press, Taylor & Francis Group, |
| record_format | marc |
| spelling | Goodhew, Peter J., author. http://id.loc.gov/authorities/names/n84223809 Electron microscopy and analysis / Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK. Third edition. Boca Raton : CRC Press, Taylor & Francis Group, 2017. ©2001 1 online resource (x, 251 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. Includes bibliographical references and index. Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques. Print version record. Electron microscopy. http://id.loc.gov/authorities/subjects/sh85042221 Microscopy, Electron https://id.nlm.nih.gov/mesh/D008854 Microscopie électronique. electron microscopy. aat SCIENCE General. bisacsh Electron microscopy fast Humphreys, F. J., author. http://id.loc.gov/authorities/names/n87940993 Beanland, R., author. http://id.loc.gov/authorities/names/n99254722 has work: Electron microscopy and analysis (Text) https://id.oclc.org/worldcat/entity/E39PCFDvDTxtXWckKr9HTHMPry https://id.oclc.org/worldcat/ontology/hasWork Print version: GOODHEW, PETER J. Electron microscopy and analysis, third edition. [Place of publication not identified], CRC Press, 2017 1138441538 (OCoLC)995776598 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=153992 Volltext |
| spellingShingle | Goodhew, Peter J. Humphreys, F. J. Beanland, R. Electron microscopy and analysis / Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques. Electron microscopy. http://id.loc.gov/authorities/subjects/sh85042221 Microscopy, Electron https://id.nlm.nih.gov/mesh/D008854 Microscopie électronique. electron microscopy. aat SCIENCE General. bisacsh Electron microscopy fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh85042221 https://id.nlm.nih.gov/mesh/D008854 |
| title | Electron microscopy and analysis / |
| title_auth | Electron microscopy and analysis / |
| title_exact_search | Electron microscopy and analysis / |
| title_full | Electron microscopy and analysis / Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK. |
| title_fullStr | Electron microscopy and analysis / Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK. |
| title_full_unstemmed | Electron microscopy and analysis / Peter J. Goodhew, University of Liverpool, UK ; John Humphreys, Manchester Materials Science Centre, UK ; Richard Beanland, Marconi Materials Technology, Towcester, UK. |
| title_short | Electron microscopy and analysis / |
| title_sort | electron microscopy and analysis |
| topic | Electron microscopy. http://id.loc.gov/authorities/subjects/sh85042221 Microscopy, Electron https://id.nlm.nih.gov/mesh/D008854 Microscopie électronique. electron microscopy. aat SCIENCE General. bisacsh Electron microscopy fast |
| topic_facet | Electron microscopy. Microscopy, Electron Microscopie électronique. electron microscopy. SCIENCE General. Electron microscopy |
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