On-wafer microwave measurements and de-embedding /:
This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston :
Artech House,
[2016]
|
| Schriftenreihe: | Artech House microwave library.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards. |
| Beschreibung: | 1 online resource (xxvii, 216 pages) : illustrations |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 9781630813710 1630813710 |
Internformat
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| 520 | 3 | |a This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards. |c Publisher abstract. | |
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| id | ZDB-4-EBA-ocn986864633 |
| illustrated | Illustrated |
| indexdate | 2024-11-27T13:27:49Z |
| institution | BVB |
| isbn | 9781630813710 1630813710 |
| language | English |
| oclc_num | 986864633 |
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| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (xxvii, 216 pages) : illustrations |
| psigel | ZDB-4-EBA |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Artech House, |
| record_format | marc |
| series | Artech House microwave library. |
| series2 | Artech House Microwave Library |
| spelling | Lourandakis, Errikos, 1981- author. https://id.oclc.org/worldcat/entity/E39PCjCMwbJhPtDJrVvv8vGtjC http://id.loc.gov/authorities/names/no2016124962 On-wafer microwave measurements and de-embedding / Errikos Lourandakis. Boston : Artech House, [2016] 1 online resource (xxvii, 216 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier Artech House Microwave Library Print version record. Includes bibliographical references and index. This new authoritative resource presents the basics of network analyzer measurement equipment and troubleshooting errors involved in the on-wafer microwave measurement process. This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advance CMOS technologies.nBasic circuit equations, terms and fundamentals of time and frequency domain analysis are covered. This book also explores the basics of vector network analyzers (VNA), two port S-parameter measurement routines, signal flow graphs, network theory, error models and VNA calibrations with the use of calibration standards. Publisher abstract. Microwave integrated circuits. http://id.loc.gov/authorities/subjects/sh85084963 Microwave measurements. http://id.loc.gov/authorities/subjects/sh85084966 Circuits intégrés pour micro-ondes. Mesures micro-ondes. TECHNOLOGY & ENGINEERING Mechanical. bisacsh Microwave integrated circuits fast Microwave measurements fast has work: On-wafer microwave measurements and de-embedding (Text) https://id.oclc.org/worldcat/entity/E39PCFQGXbpCD73gxvXVMJCYT3 https://id.oclc.org/worldcat/ontology/hasWork Print version: Lourandakis, Errikos, 1981- On-wafer microwave measurements and de-embedding. Boston ; London : Artech House, [2016] 9781630810566 (DLC) 2016288273 (OCoLC)946216728 Artech House microwave library. http://id.loc.gov/authorities/names/n42002465 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1511845 Volltext |
| spellingShingle | Lourandakis, Errikos, 1981- On-wafer microwave measurements and de-embedding / Artech House microwave library. Microwave integrated circuits. http://id.loc.gov/authorities/subjects/sh85084963 Microwave measurements. http://id.loc.gov/authorities/subjects/sh85084966 Circuits intégrés pour micro-ondes. Mesures micro-ondes. TECHNOLOGY & ENGINEERING Mechanical. bisacsh Microwave integrated circuits fast Microwave measurements fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh85084963 http://id.loc.gov/authorities/subjects/sh85084966 |
| title | On-wafer microwave measurements and de-embedding / |
| title_auth | On-wafer microwave measurements and de-embedding / |
| title_exact_search | On-wafer microwave measurements and de-embedding / |
| title_full | On-wafer microwave measurements and de-embedding / Errikos Lourandakis. |
| title_fullStr | On-wafer microwave measurements and de-embedding / Errikos Lourandakis. |
| title_full_unstemmed | On-wafer microwave measurements and de-embedding / Errikos Lourandakis. |
| title_short | On-wafer microwave measurements and de-embedding / |
| title_sort | on wafer microwave measurements and de embedding |
| topic | Microwave integrated circuits. http://id.loc.gov/authorities/subjects/sh85084963 Microwave measurements. http://id.loc.gov/authorities/subjects/sh85084966 Circuits intégrés pour micro-ondes. Mesures micro-ondes. TECHNOLOGY & ENGINEERING Mechanical. bisacsh Microwave integrated circuits fast Microwave measurements fast |
| topic_facet | Microwave integrated circuits. Microwave measurements. Circuits intégrés pour micro-ondes. Mesures micro-ondes. TECHNOLOGY & ENGINEERING Mechanical. Microwave integrated circuits Microwave measurements |
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