An engineer's guide to automated testing of high-speed interfaces /:
This second edition of An Engineers Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of aut...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Norwood, MA :
Artech House,
[2016]
|
| Ausgabe: | Second edition. |
| Schriftenreihe: | Artech House microwave library.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | This second edition of An Engineers Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing. |
| Beschreibung: | 1 online resource (xxiv, 677 pages) : illustrations |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 9781608079865 1608079864 |
Internformat
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| 245 | 1 | 3 | |a An engineer's guide to automated testing of high-speed interfaces / |c José Moreira, Hubert Werkmann. |
| 246 | 3 | 0 | |a Guide to automated testing of high-speed interfaces |
| 246 | 3 | 0 | |a Automated testing of high-speed interfaces |
| 250 | |a Second edition. | ||
| 264 | 1 | |a Norwood, MA : |b Artech House, |c [2016] | |
| 264 | 4 | |c ©2016 | |
| 300 | |a 1 online resource (xxiv, 677 pages) : |b illustrations | ||
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| 588 | 0 | |a Print version record. | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards. | |
| 505 | 8 | |a 3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. | |
| 520 | |a This second edition of An Engineers Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing. | ||
| 650 | 0 | |a Integrated circuits |x Testing. | |
| 650 | 0 | |a Automatic test equipment. |0 http://id.loc.gov/authorities/subjects/sh85010085 | |
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Datensatz im Suchindex
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| author | Moreira, José, 1975- Werkmann, Hubert |
| author_GND | http://id.loc.gov/authorities/names/nb2010023650 http://id.loc.gov/authorities/names/nb2010023569 |
| author_facet | Moreira, José, 1975- Werkmann, Hubert |
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| contents | Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards. 3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. |
| ctrlnum | (OCoLC)986606908 |
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| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | Second edition. |
| format | Electronic eBook |
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| illustrated | Illustrated |
| indexdate | 2024-11-27T13:27:49Z |
| institution | BVB |
| isbn | 9781608079865 1608079864 |
| language | English |
| lccn | 2016285182 |
| oclc_num | 986606908 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (xxiv, 677 pages) : illustrations |
| psigel | ZDB-4-EBA |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Artech House, |
| record_format | marc |
| series | Artech House microwave library. |
| series2 | Artech House microwave library |
| spelling | Moreira, José, 1975- author. https://id.oclc.org/worldcat/entity/E39PCjFc9WKWrTKJfmHrVj7QC3 http://id.loc.gov/authorities/names/nb2010023650 An engineer's guide to automated testing of high-speed interfaces / José Moreira, Hubert Werkmann. Guide to automated testing of high-speed interfaces Automated testing of high-speed interfaces Second edition. Norwood, MA : Artech House, [2016] ©2016 1 online resource (xxiv, 677 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier Artech House microwave library Print version record. Includes bibliographical references and index. Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards. 3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. This second edition of An Engineers Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing. Integrated circuits Testing. Automatic test equipment. http://id.loc.gov/authorities/subjects/sh85010085 Very high speed integrated circuits. http://id.loc.gov/authorities/subjects/sh85142925 Équipement d'essai automatique. Circuits intégrés à très grande vitesse. TECHNOLOGY & ENGINEERING Mechanical. bisacsh Automatic test equipment fast Integrated circuits Testing fast Very high speed integrated circuits fast Equip de test automàtic. lemac Circuits integrats Proves. lemac Circuits integrats d'alta velocitat Proves. lemac Werkmann, Hubert, author. https://id.oclc.org/worldcat/entity/E39PCjJXXDMgVdHRKRxYfdDvMd http://id.loc.gov/authorities/names/nb2010023569 has work: An engineer's guide to automated testing of high-speed interfaces (Text) https://id.oclc.org/worldcat/entity/E39PCG3HhHmxKpxvH7G8DB4Qbd https://id.oclc.org/worldcat/ontology/hasWork Print version: Moreira, José, 1975- Engineer's guide to automated testing of high-speed interfaces. Second edition. Norwood, MA : Artech House, [2016] 9781608079858 (DLC) 2016285182 (OCoLC)934746462 Artech House microwave library. http://id.loc.gov/authorities/names/n42002465 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1511861 Volltext |
| spellingShingle | Moreira, José, 1975- Werkmann, Hubert An engineer's guide to automated testing of high-speed interfaces / Artech House microwave library. Preface to the Second Edition; Preface to the First Edition; 1 Introduction; 1.1 Characterization and Design Verification; 1.2 Production Testing; 1.3 Accuracy and Correlation; 1.4 The ATE Test Fixture; 1.5 The Future; 2 High-Speed Digital Basics; 2.1 High-Speed Digital Signaling; 2.2 Time and Frequency-Domains; 2.3 Bit Error Rate; 2.4 Jitter; 2.5 Classification of High-Speed I/O Interfaces; 2.6 Hardware Building Blocks and Concepts; 2.7 Multilevel Signaling; 3 High-Speed Interface Standards; 3.1 PCI Express; 3.2 XDR DRAM; 3.3 GDDR SDRAM; 3.4 MIPI Standards. 3.5 Other High-Speed Digital Interface Standards4 ATE Instrumentation for DigitalApplications; 4.1 ATE Timing Architectures; 4.2 Digital Pin Electronics ATE Card; 4.3 Sampler/Digitizer ATE Card; 4.4 Parametric Measurements with Sampled Data; 4.5 Power Supplies; 5 Tests and Measurements; 5.1 Bit and Pattern Alignment; 5.2 Functional Test; 5. Integrated circuits Testing. Automatic test equipment. http://id.loc.gov/authorities/subjects/sh85010085 Very high speed integrated circuits. http://id.loc.gov/authorities/subjects/sh85142925 Équipement d'essai automatique. Circuits intégrés à très grande vitesse. TECHNOLOGY & ENGINEERING Mechanical. bisacsh Automatic test equipment fast Integrated circuits Testing fast Very high speed integrated circuits fast Equip de test automàtic. lemac Circuits integrats Proves. lemac Circuits integrats d'alta velocitat Proves. lemac |
| subject_GND | http://id.loc.gov/authorities/subjects/sh85010085 http://id.loc.gov/authorities/subjects/sh85142925 |
| title | An engineer's guide to automated testing of high-speed interfaces / |
| title_alt | Guide to automated testing of high-speed interfaces Automated testing of high-speed interfaces |
| title_auth | An engineer's guide to automated testing of high-speed interfaces / |
| title_exact_search | An engineer's guide to automated testing of high-speed interfaces / |
| title_full | An engineer's guide to automated testing of high-speed interfaces / José Moreira, Hubert Werkmann. |
| title_fullStr | An engineer's guide to automated testing of high-speed interfaces / José Moreira, Hubert Werkmann. |
| title_full_unstemmed | An engineer's guide to automated testing of high-speed interfaces / José Moreira, Hubert Werkmann. |
| title_short | An engineer's guide to automated testing of high-speed interfaces / |
| title_sort | engineer s guide to automated testing of high speed interfaces |
| topic | Integrated circuits Testing. Automatic test equipment. http://id.loc.gov/authorities/subjects/sh85010085 Very high speed integrated circuits. http://id.loc.gov/authorities/subjects/sh85142925 Équipement d'essai automatique. Circuits intégrés à très grande vitesse. TECHNOLOGY & ENGINEERING Mechanical. bisacsh Automatic test equipment fast Integrated circuits Testing fast Very high speed integrated circuits fast Equip de test automàtic. lemac Circuits integrats Proves. lemac Circuits integrats d'alta velocitat Proves. lemac |
| topic_facet | Integrated circuits Testing. Automatic test equipment. Very high speed integrated circuits. Équipement d'essai automatique. Circuits intégrés à très grande vitesse. TECHNOLOGY & ENGINEERING Mechanical. Automatic test equipment Integrated circuits Testing Very high speed integrated circuits Equip de test automàtic. Circuits integrats Proves. Circuits integrats d'alta velocitat Proves. |
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