A practical guide to transmission electron microscopy.: Advanced microscopy / Volume II :
Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, howe...
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York [New York] (222 East 46th Street, New York, NY 10017) :
Momentum Press,
2016.
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| Ausgabe: | First edition. |
| Schriftenreihe: | Materials characterization and analysis collection.
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| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills. |
| Beschreibung: | Title from PDF title page (viewed on December 27, 2015). |
| Beschreibung: | 1 online resource (1 PDF (xiv, 155 pages)) : illustrations |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 9781606509180 1606509187 |
| ISSN: | 2377-4355 |
Internformat
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| 100 | 1 | |a Luo, Zhiping, |e author. | |
| 245 | 1 | 2 | |a A practical guide to transmission electron microscopy. |n Volume II : |b Advanced microscopy / |c Zhiping Luo. |
| 246 | 3 | 0 | |a Advanced microscopy |
| 250 | |a First edition. | ||
| 264 | 1 | |a New York [New York] (222 East 46th Street, New York, NY 10017) : |b Momentum Press, |c 2016. | |
| 300 | |a 1 online resource (1 PDF (xiv, 155 pages)) : |b illustrations | ||
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| 490 | 1 | |a Materials characterization and analysis collection, |x 2377-4355 | |
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a 6. Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References. | |
| 505 | 8 | |a 7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References. | |
| 505 | 8 | |a 8. Elemental analyses -- 8.1 X-ray energy-dispersive spectroscopy -- 8.1.1 Formation of characteristic x-rays -- 8.1.2 EDS detector -- 8.1.3 EDS artifacts -- 8.1.4 Effects of specimen thickness, tilt, and space location -- 8.1.5 Experimental procedures -- 8.1.6 EDS applications -- 8.2 Electron energy-loss spectroscopy -- 8.2.1 Formation of EELS -- 8.2.2 EELS qualitative and quantitative analyses -- 8.2.3 Energy-filtered TEM -- 8.2.4 EFTEM experimentation and applications -- References. | |
| 505 | 8 | |a 9. Specific applications -- 9.1 Quantitative microscopy -- 9.1.1 Quantification of size homogeneity -- 9.1.2 Quantification of directional homogeneity -- 9.1.3 Dispersion quantification -- 9.1.4 Electron diffraction pattern processing and refinement -- 9.2 In situ microscopy -- 9.2.1 In situ heating -- 9.2.2 In situ cooling -- 9.2.3 In situ irradiation -- 9.3 Cryo-EM -- 9.4 Low-dose imaging -- 9.5 Electron tomography -- 9.5.1 Experimental procedures -- 9.5.2 Object shapes -- 9.5.3 Nanoparticle assemblies -- 9.5.4 Nanoparticle superlattices -- References -- Illustration credits -- Index. | |
| 520 | 3 | |a Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills. | |
| 500 | |a Title from PDF title page (viewed on December 27, 2015). | ||
| 650 | 0 | |a Transmission electron microscopy. |0 http://id.loc.gov/authorities/subjects/sh93001918 | |
| 650 | 6 | |a Microscopie électronique à transmission. | |
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| 650 | 7 | |a Transmission electron microscopy |2 fast | |
| 653 | |a Analytical Electron Microscopy | ||
| 653 | |a Ceramics | ||
| 653 | |a Chemical Analysis | ||
| 653 | |a Chemistry | ||
| 653 | |a Composites | ||
| 653 | |a Crystallography | ||
| 653 | |a Electron Diffraction | ||
| 653 | |a Electron Energy- Loss Spectroscopy (EELS) | ||
| 653 | |a Forensic Science | ||
| 653 | |a Geosciences | ||
| 653 | |a Imaging | ||
| 653 | |a Industry | ||
| 653 | |a Life Sciences | ||
| 653 | |a Materials Science and Engineering | ||
| 653 | |a Metals and Alloys | ||
| 653 | |a Microstructure | ||
| 653 | |a Nanomaterials | ||
| 653 | |a Nanoscience | ||
| 653 | |a Nanotechnology | ||
| 653 | |a Physics | ||
| 653 | |a Scanning Transmission Electron Microscopy (STEM) | ||
| 653 | |a Polymer | ||
| 653 | |a Structure | ||
| 653 | |a Transmission Electron Microscopy (TEM) | ||
| 653 | |a X-ray Energy- Dispersive Spectroscopy (EDS) | ||
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| contents | 6. Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References. 7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References. 8. Elemental analyses -- 8.1 X-ray energy-dispersive spectroscopy -- 8.1.1 Formation of characteristic x-rays -- 8.1.2 EDS detector -- 8.1.3 EDS artifacts -- 8.1.4 Effects of specimen thickness, tilt, and space location -- 8.1.5 Experimental procedures -- 8.1.6 EDS applications -- 8.2 Electron energy-loss spectroscopy -- 8.2.1 Formation of EELS -- 8.2.2 EELS qualitative and quantitative analyses -- 8.2.3 Energy-filtered TEM -- 8.2.4 EFTEM experimentation and applications -- References. 9. Specific applications -- 9.1 Quantitative microscopy -- 9.1.1 Quantification of size homogeneity -- 9.1.2 Quantification of directional homogeneity -- 9.1.3 Dispersion quantification -- 9.1.4 Electron diffraction pattern processing and refinement -- 9.2 In situ microscopy -- 9.2.1 In situ heating -- 9.2.2 In situ cooling -- 9.2.3 In situ irradiation -- 9.3 Cryo-EM -- 9.4 Low-dose imaging -- 9.5 Electron tomography -- 9.5.1 Experimental procedures -- 9.5.2 Object shapes -- 9.5.3 Nanoparticle assemblies -- 9.5.4 Nanoparticle superlattices -- References -- Illustration credits -- Index. |
| ctrlnum | (OCoLC)936210021 |
| dewey-full | 502.825 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.825 |
| dewey-search | 502.825 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| edition | First edition. |
| format | Electronic eBook |
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Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References.</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References.</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">8. 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| id | ZDB-4-EBA-ocn936210021 |
| illustrated | Illustrated |
| indexdate | 2024-11-27T13:27:01Z |
| institution | BVB |
| isbn | 9781606509180 1606509187 |
| issn | 2377-4355 |
| language | English |
| oclc_num | 936210021 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (1 PDF (xiv, 155 pages)) : illustrations |
| psigel | ZDB-4-EBA |
| publishDate | 2016 |
| publishDateSearch | 2016 |
| publishDateSort | 2016 |
| publisher | Momentum Press, |
| record_format | marc |
| series | Materials characterization and analysis collection. |
| series2 | Materials characterization and analysis collection, |
| spelling | Luo, Zhiping, author. A practical guide to transmission electron microscopy. Volume II : Advanced microscopy / Zhiping Luo. Advanced microscopy First edition. New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2016. 1 online resource (1 PDF (xiv, 155 pages)) : illustrations text txt rdacontent electronic isbdmedia online resource cr rdacarrier Materials characterization and analysis collection, 2377-4355 Includes bibliographical references and index. 6. Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References. 7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References. 8. Elemental analyses -- 8.1 X-ray energy-dispersive spectroscopy -- 8.1.1 Formation of characteristic x-rays -- 8.1.2 EDS detector -- 8.1.3 EDS artifacts -- 8.1.4 Effects of specimen thickness, tilt, and space location -- 8.1.5 Experimental procedures -- 8.1.6 EDS applications -- 8.2 Electron energy-loss spectroscopy -- 8.2.1 Formation of EELS -- 8.2.2 EELS qualitative and quantitative analyses -- 8.2.3 Energy-filtered TEM -- 8.2.4 EFTEM experimentation and applications -- References. 9. Specific applications -- 9.1 Quantitative microscopy -- 9.1.1 Quantification of size homogeneity -- 9.1.2 Quantification of directional homogeneity -- 9.1.3 Dispersion quantification -- 9.1.4 Electron diffraction pattern processing and refinement -- 9.2 In situ microscopy -- 9.2.1 In situ heating -- 9.2.2 In situ cooling -- 9.2.3 In situ irradiation -- 9.3 Cryo-EM -- 9.4 Low-dose imaging -- 9.5 Electron tomography -- 9.5.1 Experimental procedures -- 9.5.2 Object shapes -- 9.5.3 Nanoparticle assemblies -- 9.5.4 Nanoparticle superlattices -- References -- Illustration credits -- Index. Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills. Title from PDF title page (viewed on December 27, 2015). Transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh93001918 Microscopie électronique à transmission. SCIENCE General. bisacsh Transmission electron microscopy fast Analytical Electron Microscopy Ceramics Chemical Analysis Chemistry Composites Crystallography Electron Diffraction Electron Energy- Loss Spectroscopy (EELS) Forensic Science Geosciences Imaging Industry Life Sciences Materials Science and Engineering Metals and Alloys Microstructure Nanomaterials Nanoscience Nanotechnology Physics Scanning Transmission Electron Microscopy (STEM) Polymer Structure Transmission Electron Microscopy (TEM) X-ray Energy- Dispersive Spectroscopy (EDS) Print version: 9781606509173 Materials characterization and analysis collection. 2377-4355 http://id.loc.gov/authorities/names/no2018013025 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1135115 Volltext |
| spellingShingle | Luo, Zhiping A practical guide to transmission electron microscopy. Advanced microscopy / Materials characterization and analysis collection. 6. Electron diffraction II -- 6.1 Kikuchi diffraction -- 6.1.1 Formation of Kikuchi lines -- 6.1.2 Kikuchi diffraction and crystal tilt -- 6.2 Convergent-beam electron diffraction -- 6.2.1 Formation of convergent-beam diffraction -- 6.2.2 High-order Laue zone -- 6.2.3 Experimental procedures -- 6.3 Nano-beam electron diffraction -- 6.3.1 Formation of nano-beam electron diffraction -- 6.3.2 Experimental procedures -- References. 7. Imaging II -- 7.1 STEM imaging -- 7.1.1 Formation of STEM images and optics -- 7.1.2 STEM experimental procedures -- 7.1.3 STEM applications -- 7.2 High-resolution transmission electron microscopy -- 7.2.1 Principles of HRTEM -- 7.2.2 Experimental operations -- 7.2.3 Image interpretation and simulation -- 7.2.4 Image processing -- References. 8. Elemental analyses -- 8.1 X-ray energy-dispersive spectroscopy -- 8.1.1 Formation of characteristic x-rays -- 8.1.2 EDS detector -- 8.1.3 EDS artifacts -- 8.1.4 Effects of specimen thickness, tilt, and space location -- 8.1.5 Experimental procedures -- 8.1.6 EDS applications -- 8.2 Electron energy-loss spectroscopy -- 8.2.1 Formation of EELS -- 8.2.2 EELS qualitative and quantitative analyses -- 8.2.3 Energy-filtered TEM -- 8.2.4 EFTEM experimentation and applications -- References. 9. Specific applications -- 9.1 Quantitative microscopy -- 9.1.1 Quantification of size homogeneity -- 9.1.2 Quantification of directional homogeneity -- 9.1.3 Dispersion quantification -- 9.1.4 Electron diffraction pattern processing and refinement -- 9.2 In situ microscopy -- 9.2.1 In situ heating -- 9.2.2 In situ cooling -- 9.2.3 In situ irradiation -- 9.3 Cryo-EM -- 9.4 Low-dose imaging -- 9.5 Electron tomography -- 9.5.1 Experimental procedures -- 9.5.2 Object shapes -- 9.5.3 Nanoparticle assemblies -- 9.5.4 Nanoparticle superlattices -- References -- Illustration credits -- Index. Transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh93001918 Microscopie électronique à transmission. SCIENCE General. bisacsh Transmission electron microscopy fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh93001918 |
| title | A practical guide to transmission electron microscopy. Advanced microscopy / |
| title_alt | Advanced microscopy |
| title_auth | A practical guide to transmission electron microscopy. Advanced microscopy / |
| title_exact_search | A practical guide to transmission electron microscopy. Advanced microscopy / |
| title_full | A practical guide to transmission electron microscopy. Volume II : Advanced microscopy / Zhiping Luo. |
| title_fullStr | A practical guide to transmission electron microscopy. Volume II : Advanced microscopy / Zhiping Luo. |
| title_full_unstemmed | A practical guide to transmission electron microscopy. Volume II : Advanced microscopy / Zhiping Luo. |
| title_short | A practical guide to transmission electron microscopy. |
| title_sort | practical guide to transmission electron microscopy advanced microscopy |
| title_sub | Advanced microscopy / |
| topic | Transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh93001918 Microscopie électronique à transmission. SCIENCE General. bisacsh Transmission electron microscopy fast |
| topic_facet | Transmission electron microscopy. Microscopie électronique à transmission. SCIENCE General. Transmission electron microscopy |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=1135115 |
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