Structure analysis of advanced nanomaterials :: nanoworld by high-resolution electron microscopy /
<!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator><...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Boston :
De Gruyter,
[2014]
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | <!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator></head> <body> High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. </body></html> |
| Beschreibung: | 1 online resource (viii, 168 pages .) |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 3110305011 9783110305012 9781523100545 1523100540 9783110388046 3110388049 |
Internformat
MARC
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| 037 | |n Title subscribed to via ProQuest Academic Complete | ||
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| 100 | 1 | |a Oku, Takeo, |d 1965- |e author. |1 https://id.oclc.org/worldcat/entity/E39PCjG9mwMgPwXr4qcKvfd9cP |0 http://id.loc.gov/authorities/names/n2013062128 | |
| 245 | 1 | 0 | |a Structure analysis of advanced nanomaterials : |b nanoworld by high-resolution electron microscopy / |c Takeo Oku. |
| 264 | 1 | |a Berlin ; |a Boston : |b De Gruyter, |c [2014] | |
| 300 | |a 1 online resource (viii, 168 pages .) | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file | ||
| 347 | |b PDF | ||
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Preface; Contents; Table for physical constants; 1 Introduction; 1.1 Characteristic of electron microscopy; 1.2 What information can be obtained by electron microscopy?; 1.3 Various types of electron microscopy; 2 Structure and principle of electron microscopes; 2.1 Structure of transmission electron microscope; 2.2 Observation mechanism of atoms by electrons; 2.3 Information from electron diffraction pattern; 2.4 High-resolution electron microscopy; 2.5 Scanning electron microscope; 2.6 Electron energy-loss spectroscopy; 2.7 Energy dispersive X-ray spectroscopy. | |
| 505 | 8 | |a 2.8 High-angle annular dark-field scanning TEM2.9 Electron holography and Lorentz microscopy; 2.10 Image simulation; 3 Practice of HREM; 3.1 Sample preparation; 3.2 Specimen preparation methods; 3.3 Structure analysis by X-ray diffraction; 3.4 TEM observation; 3.5 HREM observation; 3.6 Fourier filtering; 3.7 Resolution of HREM images; 3.8 Prevention of damage and contamination; 3.9 Taking images and reading data; 3.10 Mental attitude for TEM; 4 Characterization by HREM; 4.1 What information can be obtained?; 4.2 Direct atomic observation; 4.3 Crystallographic image processing. | |
| 520 | |a <!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator></head> <body> High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. </body></html> | ||
| 546 | |a In English. | ||
| 650 | 0 | |a Transmission electron microscopy. |0 http://id.loc.gov/authorities/subjects/sh93001918 | |
| 650 | 0 | |a High resolution electron microscopy. |0 http://id.loc.gov/authorities/subjects/sh2003009914 | |
| 650 | 0 | |a Nanostructured materials. |0 http://id.loc.gov/authorities/subjects/sh93000864 | |
| 650 | 0 | |a Structural analysis (Engineering) |0 http://id.loc.gov/authorities/subjects/sh85129216 | |
| 650 | 6 | |a Microscopie électronique à transmission. | |
| 650 | 6 | |a Microscopie électronique à haute résolution. | |
| 650 | 6 | |a Nanomatériaux. | |
| 650 | 6 | |a Théorie des constructions. | |
| 650 | 7 | |a structural analysis. |2 aat | |
| 650 | 7 | |a SCIENCE |x General. |2 bisacsh | |
| 650 | 7 | |a High resolution electron microscopy |2 fast | |
| 650 | 7 | |a Nanostructured materials |2 fast | |
| 650 | 7 | |a Transmission electron microscopy |2 fast | |
| 650 | 7 | |a Nanostrukturiertes Material |2 gnd | |
| 650 | 7 | |a Durchstrahlungselektronenmikroskopie |2 gnd |0 http://d-nb.info/gnd/4215608-7 | |
| 650 | 7 | |a Hochauflösendes Verfahren |2 gnd | |
| 653 | |a Advanced Nanomaterials. | ||
| 653 | |a Crystallography. | ||
| 653 | |a Industrial Application. | ||
| 653 | |a Materials Science. | ||
| 776 | 0 | 8 | |i Print version: |z 3110304724 |z 9783110304725 |
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Datensatz im Suchindex
| DE-BY-FWS_katkey | ZDB-4-EBA-ocn896786490 |
|---|---|
| _version_ | 1816882294443474944 |
| adam_text | |
| any_adam_object | |
| author | Oku, Takeo, 1965- |
| author_GND | http://id.loc.gov/authorities/names/n2013062128 |
| author_facet | Oku, Takeo, 1965- |
| author_role | aut |
| author_sort | Oku, Takeo, 1965- |
| author_variant | t o to |
| building | Verbundindex |
| bvnumber | localFWS |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.T7 O38 2014 |
| callnumber-search | QH212.T7 O38 2014 |
| callnumber-sort | QH 3212 T7 O38 42014 |
| callnumber-subject | QH - Natural History and Biology |
| collection | ZDB-4-EBA |
| contents | Preface; Contents; Table for physical constants; 1 Introduction; 1.1 Characteristic of electron microscopy; 1.2 What information can be obtained by electron microscopy?; 1.3 Various types of electron microscopy; 2 Structure and principle of electron microscopes; 2.1 Structure of transmission electron microscope; 2.2 Observation mechanism of atoms by electrons; 2.3 Information from electron diffraction pattern; 2.4 High-resolution electron microscopy; 2.5 Scanning electron microscope; 2.6 Electron energy-loss spectroscopy; 2.7 Energy dispersive X-ray spectroscopy. 2.8 High-angle annular dark-field scanning TEM2.9 Electron holography and Lorentz microscopy; 2.10 Image simulation; 3 Practice of HREM; 3.1 Sample preparation; 3.2 Specimen preparation methods; 3.3 Structure analysis by X-ray diffraction; 3.4 TEM observation; 3.5 HREM observation; 3.6 Fourier filtering; 3.7 Resolution of HREM images; 3.8 Prevention of damage and contamination; 3.9 Taking images and reading data; 3.10 Mental attitude for TEM; 4 Characterization by HREM; 4.1 What information can be obtained?; 4.2 Direct atomic observation; 4.3 Crystallographic image processing. |
| ctrlnum | (OCoLC)896786490 |
| dewey-full | 502.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502.8/25 |
| dewey-search | 502.8/25 |
| dewey-sort | 3502.8 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
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| id | ZDB-4-EBA-ocn896786490 |
| illustrated | Illustrated |
| indexdate | 2024-11-27T13:26:20Z |
| institution | BVB |
| isbn | 3110305011 9783110305012 9781523100545 1523100540 9783110388046 3110388049 |
| language | English |
| oclc_num | 896786490 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (viii, 168 pages .) |
| psigel | ZDB-4-EBA |
| publishDate | 2014 |
| publishDateSearch | 2014 |
| publishDateSort | 2014 |
| publisher | De Gruyter, |
| record_format | marc |
| spelling | Oku, Takeo, 1965- author. https://id.oclc.org/worldcat/entity/E39PCjG9mwMgPwXr4qcKvfd9cP http://id.loc.gov/authorities/names/n2013062128 Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Takeo Oku. Berlin ; Boston : De Gruyter, [2014] 1 online resource (viii, 168 pages .) text txt rdacontent computer c rdamedia online resource cr rdacarrier text file Includes bibliographical references and index. Print version record. Preface; Contents; Table for physical constants; 1 Introduction; 1.1 Characteristic of electron microscopy; 1.2 What information can be obtained by electron microscopy?; 1.3 Various types of electron microscopy; 2 Structure and principle of electron microscopes; 2.1 Structure of transmission electron microscope; 2.2 Observation mechanism of atoms by electrons; 2.3 Information from electron diffraction pattern; 2.4 High-resolution electron microscopy; 2.5 Scanning electron microscope; 2.6 Electron energy-loss spectroscopy; 2.7 Energy dispersive X-ray spectroscopy. 2.8 High-angle annular dark-field scanning TEM2.9 Electron holography and Lorentz microscopy; 2.10 Image simulation; 3 Practice of HREM; 3.1 Sample preparation; 3.2 Specimen preparation methods; 3.3 Structure analysis by X-ray diffraction; 3.4 TEM observation; 3.5 HREM observation; 3.6 Fourier filtering; 3.7 Resolution of HREM images; 3.8 Prevention of damage and contamination; 3.9 Taking images and reading data; 3.10 Mental attitude for TEM; 4 Characterization by HREM; 4.1 What information can be obtained?; 4.2 Direct atomic observation; 4.3 Crystallographic image processing. <!Doctype html public ""-//w3c//dtd html 4.0 transitional//en""> <html><head> <meta http-equiv=content-type content=""text/html; charset=iso-8859-1""> <meta content=""mshtml 6.00.6000.17110"" name=generator></head> <body> High-resolution electron microscopy allows the imaging of the crystallographic structure of a sample at an atomic scale. It is a valuable tool to study nanoscale properties of crystalline materials such as superconductors, semiconductors, solar cells, zeolite materials, carbon nanomaterials or BN nanotubes. </body></html> In English. Transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh93001918 High resolution electron microscopy. http://id.loc.gov/authorities/subjects/sh2003009914 Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Structural analysis (Engineering) http://id.loc.gov/authorities/subjects/sh85129216 Microscopie électronique à transmission. Microscopie électronique à haute résolution. Nanomatériaux. Théorie des constructions. structural analysis. aat SCIENCE General. bisacsh High resolution electron microscopy fast Nanostructured materials fast Transmission electron microscopy fast Nanostrukturiertes Material gnd Durchstrahlungselektronenmikroskopie gnd http://d-nb.info/gnd/4215608-7 Hochauflösendes Verfahren gnd Advanced Nanomaterials. Crystallography. Industrial Application. Materials Science. Print version: 3110304724 9783110304725 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=887020 Volltext |
| spellingShingle | Oku, Takeo, 1965- Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Preface; Contents; Table for physical constants; 1 Introduction; 1.1 Characteristic of electron microscopy; 1.2 What information can be obtained by electron microscopy?; 1.3 Various types of electron microscopy; 2 Structure and principle of electron microscopes; 2.1 Structure of transmission electron microscope; 2.2 Observation mechanism of atoms by electrons; 2.3 Information from electron diffraction pattern; 2.4 High-resolution electron microscopy; 2.5 Scanning electron microscope; 2.6 Electron energy-loss spectroscopy; 2.7 Energy dispersive X-ray spectroscopy. 2.8 High-angle annular dark-field scanning TEM2.9 Electron holography and Lorentz microscopy; 2.10 Image simulation; 3 Practice of HREM; 3.1 Sample preparation; 3.2 Specimen preparation methods; 3.3 Structure analysis by X-ray diffraction; 3.4 TEM observation; 3.5 HREM observation; 3.6 Fourier filtering; 3.7 Resolution of HREM images; 3.8 Prevention of damage and contamination; 3.9 Taking images and reading data; 3.10 Mental attitude for TEM; 4 Characterization by HREM; 4.1 What information can be obtained?; 4.2 Direct atomic observation; 4.3 Crystallographic image processing. Transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh93001918 High resolution electron microscopy. http://id.loc.gov/authorities/subjects/sh2003009914 Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Structural analysis (Engineering) http://id.loc.gov/authorities/subjects/sh85129216 Microscopie électronique à transmission. Microscopie électronique à haute résolution. Nanomatériaux. Théorie des constructions. structural analysis. aat SCIENCE General. bisacsh High resolution electron microscopy fast Nanostructured materials fast Transmission electron microscopy fast Nanostrukturiertes Material gnd Durchstrahlungselektronenmikroskopie gnd http://d-nb.info/gnd/4215608-7 Hochauflösendes Verfahren gnd |
| subject_GND | http://id.loc.gov/authorities/subjects/sh93001918 http://id.loc.gov/authorities/subjects/sh2003009914 http://id.loc.gov/authorities/subjects/sh93000864 http://id.loc.gov/authorities/subjects/sh85129216 http://d-nb.info/gnd/4215608-7 |
| title | Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / |
| title_auth | Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / |
| title_exact_search | Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / |
| title_full | Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Takeo Oku. |
| title_fullStr | Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Takeo Oku. |
| title_full_unstemmed | Structure analysis of advanced nanomaterials : nanoworld by high-resolution electron microscopy / Takeo Oku. |
| title_short | Structure analysis of advanced nanomaterials : |
| title_sort | structure analysis of advanced nanomaterials nanoworld by high resolution electron microscopy |
| title_sub | nanoworld by high-resolution electron microscopy / |
| topic | Transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh93001918 High resolution electron microscopy. http://id.loc.gov/authorities/subjects/sh2003009914 Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Structural analysis (Engineering) http://id.loc.gov/authorities/subjects/sh85129216 Microscopie électronique à transmission. Microscopie électronique à haute résolution. Nanomatériaux. Théorie des constructions. structural analysis. aat SCIENCE General. bisacsh High resolution electron microscopy fast Nanostructured materials fast Transmission electron microscopy fast Nanostrukturiertes Material gnd Durchstrahlungselektronenmikroskopie gnd http://d-nb.info/gnd/4215608-7 Hochauflösendes Verfahren gnd |
| topic_facet | Transmission electron microscopy. High resolution electron microscopy. Nanostructured materials. Structural analysis (Engineering) Microscopie électronique à transmission. Microscopie électronique à haute résolution. Nanomatériaux. Théorie des constructions. structural analysis. SCIENCE General. High resolution electron microscopy Nanostructured materials Transmission electron microscopy Nanostrukturiertes Material Durchstrahlungselektronenmikroskopie Hochauflösendes Verfahren |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=887020 |
| work_keys_str_mv | AT okutakeo structureanalysisofadvancednanomaterialsnanoworldbyhighresolutionelectronmicroscopy |