Scanning transmission electron microscopy of nanomaterials :: basics of imaging and analysis /
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologi...
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hackensack, NJ :
Imperial College Press,
2014.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents: Introduction (N Tanak. |
| Beschreibung: | 1 online resource |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 9781848167902 1848167903 |
Internformat
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| 245 | 0 | 0 | |a Scanning transmission electron microscopy of nanomaterials : |b basics of imaging and analysis / |c editor, Nobuo Tanaka, Nagoya University, Japan. |
| 264 | 1 | |a Hackensack, NJ : |b Imperial College Press, |c 2014. | |
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| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Preface; Acknowledgments; Contents; List of Contributors; List of Abbreviations; List of Symbols; For Students and Beginners; Softwares for Simulation; Table of Values of Related Physical Constants; Table of Electron Wavelength; 1. Introduction; 1.1 Need for electron nanoprobe imaging; 1.2 Comparison of TEM, SEM, and STEM; 1.3 Advantages of STEM; 1.4 Application possibilities of STEM; 1.5 Brief introduction to the chapters in this book; References; 2. Historical Survey of the Development of STEM Instruments; 2.1 STEM from the 1930s to the 1960s; 2.2 Crewe's STEM. | |
| 505 | 8 | |a 2.3 Crewe's high-voltage STEM with aberration correction2.4 The STEMs of Strojnik, Le Poole, and Jouffrey; 2.5 Vacuum Generators' STEM; 2.6 Cowley's HB-5 STEM; 2.7 Hitachi STEM; 2.8 The Cavendish HB-5 STEM; 2.9 The Cornell STEM; 2.10 The Oak Ridge HB-501 STEM; 2.11 The IBM STEM; 2.12 Hitachi HD-2000 STEM; 2.13 Krivanek's aberration corrector; 2.14 The IBM and Oak Ridge HB-501 STEM with aberration corrector; 2.15 The Oak Ridge 300 kV STEM with aberration corrector; 2.16 The Daresbury STEM; 2.17 The 200 kV TEM-based STEM by JEOL and FEI; 2.18 The Oxford and Nagoya double-corrected STEM. | |
| 505 | 8 | |a 2.19 The 300 kV STEM at Jülich and Berkeley2.20 The Japanese aberration corrector for 200 kV STEM; 2.21 The advanced aberration-corrected TEM/STEM by JEOL; 2.22 The 300 kV TEM/STEM in the R005 project; 2.23 Hitachi aberration-corrected STEM; 2.24 The 200 kV dedicated STEM by NION; 2.25 The Japanese national project TEM/STEM for lower voltages; 2.26 High-voltage environmental STEM in Nagoya University; References; PART 1: BASIC KNOWLEDGE OF STEM; 3. Basics of STEM; 3.1 Basic knowledge of imaging by electrons; 3.2 Basic features of STEM imaging. | |
| 505 | 8 | |a 3.3 Fine electron probe formation in geometrical optics3.4 Wave optics for focusing by a convex lens and its wave aberration; 3.5 Basic design of STEM and its components; 3.6 Incoherent imaging in ADF-STEM; 3.6.1 Cowley's explanation; 3.6.2 Nellist's explanation; 3.7 Reciprocity between STEM and TEM; 3.8 Imaging modes of STEM; 3.9 Various kinds of image contrast in STEM and their theories; 3.9.1 Bright field contrast and lattice images with phase contrast; 3.9.2 Crewe's Z-contrast and its elemental mapping; 3.9.3 Pennycook's Z2-x contrast in ADF-STEM; 3.9.4 Depth-sectioning images in STEM. | |
| 505 | 8 | |a 3.9.5 ABF-STEM3.9.6 EELS and EDX elemental mapping in STEM; 3.9.7 Secondary electron imaging in STEM; 3.9.8 Scanning confocal electron microscopy (SCEM); 3.10 Prototypes of STEM; 3.11 Calculation of STEM image intensity; 3.11.1 Cowley-Moodie method; 3.11.1.1 Probe formation (Step 1); 3.11.1.2 Multislice calculation of dynamical diffraction of a probe in a crystal (Step 2); 3.11.1.3 Collection of diffraction intensity by detectors (Step 3); 3.11.1.4 Inclusion of inelastic scattering for STEM image intensity; 3.11.2 Bethe method. | |
| 520 | |a The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents: Introduction (N Tanak. | ||
| 650 | 0 | |a Scanning transmission electron microscopy. |0 http://id.loc.gov/authorities/subjects/sh97007332 | |
| 650 | 0 | |a Nanostructured materials. |0 http://id.loc.gov/authorities/subjects/sh93000864 | |
| 650 | 6 | |a Microscopie électronique à balayage et à transmission. | |
| 650 | 6 | |a Nanomatériaux. | |
| 650 | 7 | |a SCIENCE |x General. |2 bisacsh | |
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| 650 | 7 | |a Scanning transmission electron microscopy |2 fast | |
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| 758 | |i has work: |a Scanning transmission electron microscopy of nanomaterials (Text) |1 https://id.oclc.org/worldcat/entity/E39PCFwgVPxHwjvmXgRtdHJr9C |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
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Datensatz im Suchindex
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| author_facet | Tanaka, Nobuo, 1949- |
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| contents | Preface; Acknowledgments; Contents; List of Contributors; List of Abbreviations; List of Symbols; For Students and Beginners; Softwares for Simulation; Table of Values of Related Physical Constants; Table of Electron Wavelength; 1. Introduction; 1.1 Need for electron nanoprobe imaging; 1.2 Comparison of TEM, SEM, and STEM; 1.3 Advantages of STEM; 1.4 Application possibilities of STEM; 1.5 Brief introduction to the chapters in this book; References; 2. Historical Survey of the Development of STEM Instruments; 2.1 STEM from the 1930s to the 1960s; 2.2 Crewe's STEM. 2.3 Crewe's high-voltage STEM with aberration correction2.4 The STEMs of Strojnik, Le Poole, and Jouffrey; 2.5 Vacuum Generators' STEM; 2.6 Cowley's HB-5 STEM; 2.7 Hitachi STEM; 2.8 The Cavendish HB-5 STEM; 2.9 The Cornell STEM; 2.10 The Oak Ridge HB-501 STEM; 2.11 The IBM STEM; 2.12 Hitachi HD-2000 STEM; 2.13 Krivanek's aberration corrector; 2.14 The IBM and Oak Ridge HB-501 STEM with aberration corrector; 2.15 The Oak Ridge 300 kV STEM with aberration corrector; 2.16 The Daresbury STEM; 2.17 The 200 kV TEM-based STEM by JEOL and FEI; 2.18 The Oxford and Nagoya double-corrected STEM. 2.19 The 300 kV STEM at Jülich and Berkeley2.20 The Japanese aberration corrector for 200 kV STEM; 2.21 The advanced aberration-corrected TEM/STEM by JEOL; 2.22 The 300 kV TEM/STEM in the R005 project; 2.23 Hitachi aberration-corrected STEM; 2.24 The 200 kV dedicated STEM by NION; 2.25 The Japanese national project TEM/STEM for lower voltages; 2.26 High-voltage environmental STEM in Nagoya University; References; PART 1: BASIC KNOWLEDGE OF STEM; 3. Basics of STEM; 3.1 Basic knowledge of imaging by electrons; 3.2 Basic features of STEM imaging. 3.3 Fine electron probe formation in geometrical optics3.4 Wave optics for focusing by a convex lens and its wave aberration; 3.5 Basic design of STEM and its components; 3.6 Incoherent imaging in ADF-STEM; 3.6.1 Cowley's explanation; 3.6.2 Nellist's explanation; 3.7 Reciprocity between STEM and TEM; 3.8 Imaging modes of STEM; 3.9 Various kinds of image contrast in STEM and their theories; 3.9.1 Bright field contrast and lattice images with phase contrast; 3.9.2 Crewe's Z-contrast and its elemental mapping; 3.9.3 Pennycook's Z2-x contrast in ADF-STEM; 3.9.4 Depth-sectioning images in STEM. 3.9.5 ABF-STEM3.9.6 EELS and EDX elemental mapping in STEM; 3.9.7 Secondary electron imaging in STEM; 3.9.8 Scanning confocal electron microscopy (SCEM); 3.10 Prototypes of STEM; 3.11 Calculation of STEM image intensity; 3.11.1 Cowley-Moodie method; 3.11.1.1 Probe formation (Step 1); 3.11.1.2 Multislice calculation of dynamical diffraction of a probe in a crystal (Step 2); 3.11.1.3 Collection of diffraction intensity by detectors (Step 3); 3.11.1.4 Inclusion of inelastic scattering for STEM image intensity; 3.11.2 Bethe method. |
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| discipline | Allgemeine Naturwissenschaft |
| format | Electronic eBook |
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| publisher | Imperial College Press, |
| record_format | marc |
| spelling | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / editor, Nobuo Tanaka, Nagoya University, Japan. Hackensack, NJ : Imperial College Press, 2014. 1 online resource text txt rdacontent computer c rdamedia online resource cr rdacarrier Includes bibliographical references and index. Print version record. Preface; Acknowledgments; Contents; List of Contributors; List of Abbreviations; List of Symbols; For Students and Beginners; Softwares for Simulation; Table of Values of Related Physical Constants; Table of Electron Wavelength; 1. Introduction; 1.1 Need for electron nanoprobe imaging; 1.2 Comparison of TEM, SEM, and STEM; 1.3 Advantages of STEM; 1.4 Application possibilities of STEM; 1.5 Brief introduction to the chapters in this book; References; 2. Historical Survey of the Development of STEM Instruments; 2.1 STEM from the 1930s to the 1960s; 2.2 Crewe's STEM. 2.3 Crewe's high-voltage STEM with aberration correction2.4 The STEMs of Strojnik, Le Poole, and Jouffrey; 2.5 Vacuum Generators' STEM; 2.6 Cowley's HB-5 STEM; 2.7 Hitachi STEM; 2.8 The Cavendish HB-5 STEM; 2.9 The Cornell STEM; 2.10 The Oak Ridge HB-501 STEM; 2.11 The IBM STEM; 2.12 Hitachi HD-2000 STEM; 2.13 Krivanek's aberration corrector; 2.14 The IBM and Oak Ridge HB-501 STEM with aberration corrector; 2.15 The Oak Ridge 300 kV STEM with aberration corrector; 2.16 The Daresbury STEM; 2.17 The 200 kV TEM-based STEM by JEOL and FEI; 2.18 The Oxford and Nagoya double-corrected STEM. 2.19 The 300 kV STEM at Jülich and Berkeley2.20 The Japanese aberration corrector for 200 kV STEM; 2.21 The advanced aberration-corrected TEM/STEM by JEOL; 2.22 The 300 kV TEM/STEM in the R005 project; 2.23 Hitachi aberration-corrected STEM; 2.24 The 200 kV dedicated STEM by NION; 2.25 The Japanese national project TEM/STEM for lower voltages; 2.26 High-voltage environmental STEM in Nagoya University; References; PART 1: BASIC KNOWLEDGE OF STEM; 3. Basics of STEM; 3.1 Basic knowledge of imaging by electrons; 3.2 Basic features of STEM imaging. 3.3 Fine electron probe formation in geometrical optics3.4 Wave optics for focusing by a convex lens and its wave aberration; 3.5 Basic design of STEM and its components; 3.6 Incoherent imaging in ADF-STEM; 3.6.1 Cowley's explanation; 3.6.2 Nellist's explanation; 3.7 Reciprocity between STEM and TEM; 3.8 Imaging modes of STEM; 3.9 Various kinds of image contrast in STEM and their theories; 3.9.1 Bright field contrast and lattice images with phase contrast; 3.9.2 Crewe's Z-contrast and its elemental mapping; 3.9.3 Pennycook's Z2-x contrast in ADF-STEM; 3.9.4 Depth-sectioning images in STEM. 3.9.5 ABF-STEM3.9.6 EELS and EDX elemental mapping in STEM; 3.9.7 Secondary electron imaging in STEM; 3.9.8 Scanning confocal electron microscopy (SCEM); 3.10 Prototypes of STEM; 3.11 Calculation of STEM image intensity; 3.11.1 Cowley-Moodie method; 3.11.1.1 Probe formation (Step 1); 3.11.1.2 Multislice calculation of dynamical diffraction of a probe in a crystal (Step 2); 3.11.1.3 Collection of diffraction intensity by detectors (Step 3); 3.11.1.4 Inclusion of inelastic scattering for STEM image intensity; 3.11.2 Bethe method. The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials. Contents: Introduction (N Tanak. Scanning transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh97007332 Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Microscopie électronique à balayage et à transmission. Nanomatériaux. SCIENCE General. bisacsh Nanostructured materials fast Scanning transmission electron microscopy fast Tanaka, Nobuo, 1949- editor. https://id.oclc.org/worldcat/entity/E39PCjBFX7g6yfBy8kxj76JMT3 http://id.loc.gov/authorities/names/no2008077631 has work: Scanning transmission electron microscopy of nanomaterials (Text) https://id.oclc.org/worldcat/entity/E39PCFwgVPxHwjvmXgRtdHJr9C https://id.oclc.org/worldcat/ontology/hasWork Print version: Scanning transmission electron microscopy of nanomaterials 9781848167896 (DLC) 2014028461 (OCoLC)884440153 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=839689 Volltext |
| spellingShingle | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / Preface; Acknowledgments; Contents; List of Contributors; List of Abbreviations; List of Symbols; For Students and Beginners; Softwares for Simulation; Table of Values of Related Physical Constants; Table of Electron Wavelength; 1. Introduction; 1.1 Need for electron nanoprobe imaging; 1.2 Comparison of TEM, SEM, and STEM; 1.3 Advantages of STEM; 1.4 Application possibilities of STEM; 1.5 Brief introduction to the chapters in this book; References; 2. Historical Survey of the Development of STEM Instruments; 2.1 STEM from the 1930s to the 1960s; 2.2 Crewe's STEM. 2.3 Crewe's high-voltage STEM with aberration correction2.4 The STEMs of Strojnik, Le Poole, and Jouffrey; 2.5 Vacuum Generators' STEM; 2.6 Cowley's HB-5 STEM; 2.7 Hitachi STEM; 2.8 The Cavendish HB-5 STEM; 2.9 The Cornell STEM; 2.10 The Oak Ridge HB-501 STEM; 2.11 The IBM STEM; 2.12 Hitachi HD-2000 STEM; 2.13 Krivanek's aberration corrector; 2.14 The IBM and Oak Ridge HB-501 STEM with aberration corrector; 2.15 The Oak Ridge 300 kV STEM with aberration corrector; 2.16 The Daresbury STEM; 2.17 The 200 kV TEM-based STEM by JEOL and FEI; 2.18 The Oxford and Nagoya double-corrected STEM. 2.19 The 300 kV STEM at Jülich and Berkeley2.20 The Japanese aberration corrector for 200 kV STEM; 2.21 The advanced aberration-corrected TEM/STEM by JEOL; 2.22 The 300 kV TEM/STEM in the R005 project; 2.23 Hitachi aberration-corrected STEM; 2.24 The 200 kV dedicated STEM by NION; 2.25 The Japanese national project TEM/STEM for lower voltages; 2.26 High-voltage environmental STEM in Nagoya University; References; PART 1: BASIC KNOWLEDGE OF STEM; 3. Basics of STEM; 3.1 Basic knowledge of imaging by electrons; 3.2 Basic features of STEM imaging. 3.3 Fine electron probe formation in geometrical optics3.4 Wave optics for focusing by a convex lens and its wave aberration; 3.5 Basic design of STEM and its components; 3.6 Incoherent imaging in ADF-STEM; 3.6.1 Cowley's explanation; 3.6.2 Nellist's explanation; 3.7 Reciprocity between STEM and TEM; 3.8 Imaging modes of STEM; 3.9 Various kinds of image contrast in STEM and their theories; 3.9.1 Bright field contrast and lattice images with phase contrast; 3.9.2 Crewe's Z-contrast and its elemental mapping; 3.9.3 Pennycook's Z2-x contrast in ADF-STEM; 3.9.4 Depth-sectioning images in STEM. 3.9.5 ABF-STEM3.9.6 EELS and EDX elemental mapping in STEM; 3.9.7 Secondary electron imaging in STEM; 3.9.8 Scanning confocal electron microscopy (SCEM); 3.10 Prototypes of STEM; 3.11 Calculation of STEM image intensity; 3.11.1 Cowley-Moodie method; 3.11.1.1 Probe formation (Step 1); 3.11.1.2 Multislice calculation of dynamical diffraction of a probe in a crystal (Step 2); 3.11.1.3 Collection of diffraction intensity by detectors (Step 3); 3.11.1.4 Inclusion of inelastic scattering for STEM image intensity; 3.11.2 Bethe method. Scanning transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh97007332 Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Microscopie électronique à balayage et à transmission. Nanomatériaux. SCIENCE General. bisacsh Nanostructured materials fast Scanning transmission electron microscopy fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh97007332 http://id.loc.gov/authorities/subjects/sh93000864 |
| title | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / |
| title_auth | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / |
| title_exact_search | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / |
| title_full | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / editor, Nobuo Tanaka, Nagoya University, Japan. |
| title_fullStr | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / editor, Nobuo Tanaka, Nagoya University, Japan. |
| title_full_unstemmed | Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis / editor, Nobuo Tanaka, Nagoya University, Japan. |
| title_short | Scanning transmission electron microscopy of nanomaterials : |
| title_sort | scanning transmission electron microscopy of nanomaterials basics of imaging and analysis |
| title_sub | basics of imaging and analysis / |
| topic | Scanning transmission electron microscopy. http://id.loc.gov/authorities/subjects/sh97007332 Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Microscopie électronique à balayage et à transmission. Nanomatériaux. SCIENCE General. bisacsh Nanostructured materials fast Scanning transmission electron microscopy fast |
| topic_facet | Scanning transmission electron microscopy. Nanostructured materials. Microscopie électronique à balayage et à transmission. Nanomatériaux. SCIENCE General. Nanostructured materials Scanning transmission electron microscopy |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=839689 |
| work_keys_str_mv | AT tanakanobuo scanningtransmissionelectronmicroscopyofnanomaterialsbasicsofimagingandanalysis |