Theory of CMOS digital circuits and circuit failures /:
CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all pro...
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1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Princeton, New Jersey :
Princeton University Press,
[1992]
|
Schriftenreihe: | Princeton legacy library
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Schlagworte: | |
Online-Zugang: | Volltext |
Zusammenfassung: | CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905. |
Beschreibung: | 1 online resource (589 pages) : illustrations |
Bibliographie: | Includes bibliographical references and index. |
ISBN: | 9781400862849 1400862841 9780691087634 0691087636 0691603014 9780691603018 |
Internformat
MARC
LEADER | 00000cam a2200000Mi 4500 | ||
---|---|---|---|
001 | ZDB-4-EBA-ocn889252808 | ||
003 | OCoLC | ||
005 | 20241004212047.0 | ||
006 | m o d | ||
007 | cr cn||||||||| | ||
008 | 920312t19921992njua ob 001 0 eng d | ||
040 | |a E7B |b eng |e rda |e pn |c E7B |d OCLCO |d JSTOR |d OCLCF |d DEBBG |d N$T |d OCLCQ |d DEBSZ |d YDXCP |d OCLCQ |d IGB |d AGLDB |d EZ9 |d DEGRU |d D6H |d STF |d OCLCQ |d VTS |d OCLCQ |d LVT |d S9I |d COO |d DKC |d OCLCQ |d LEAUB |d UX1 |d AJS |d IEEEE |d OCLCO |d OCLCQ |d OCLCO |d OCLCL | ||
019 | |a 956738559 |a 1013955510 |a 1029825195 |a 1032677483 |a 1037978592 |a 1041976614 |a 1046612531 |a 1046729852 |a 1047005755 |a 1079012813 |a 1086506215 |a 1175625423 | ||
020 | |a 9781400862849 |q (electronic bk.) | ||
020 | |a 1400862841 |q (electronic bk.) | ||
020 | |a 9780691087634 | ||
020 | |a 0691087636 | ||
020 | |a 0691603014 | ||
020 | |a 9780691603018 | ||
024 | 7 | |a 10.1515/9781400862849 |2 doi | |
035 | |a (OCoLC)889252808 |z (OCoLC)956738559 |z (OCoLC)1013955510 |z (OCoLC)1029825195 |z (OCoLC)1032677483 |z (OCoLC)1037978592 |z (OCoLC)1041976614 |z (OCoLC)1046612531 |z (OCoLC)1046729852 |z (OCoLC)1047005755 |z (OCoLC)1079012813 |z (OCoLC)1086506215 |z (OCoLC)1175625423 | ||
037 | |a 22573/ctt738995 |b JSTOR | ||
037 | |a 9453259 |b IEEE | ||
050 | 4 | |a TK7871.99.M44 |b S525 1992eb | |
072 | 7 | |a MAT040000 |2 bisacsh | |
072 | 7 | |a TEC |x 009070 |2 bisacsh | |
082 | 7 | |a 621.39/5 |2 20 | |
049 | |a MAIN | ||
100 | 1 | |a Shoji, Masakazu, |d 1936- |e author. |1 https://id.oclc.org/worldcat/entity/E39PCjqBQpTw6DxRW9mbJjftTd |0 http://id.loc.gov/authorities/names/n87891860 | |
245 | 1 | 0 | |a Theory of CMOS digital circuits and circuit failures / |c Masakazu Shoji. |
264 | 1 | |a Princeton, New Jersey : |b Princeton University Press, |c [1992] | |
264 | 4 | |c ©1992 | |
300 | |a 1 online resource (589 pages) : |b illustrations | ||
336 | |a text |b txt |2 rdacontent | ||
337 | |a computer |b c |2 rdamedia | ||
338 | |a online resource |b cr |2 rdacarrier | ||
347 | |a data file |2 rda | ||
490 | 0 | |a Princeton legacy library | |
504 | |a Includes bibliographical references and index. | ||
588 | 0 | |a Print version record. | |
505 | 0 | 0 | |t Frontmatter -- |t Contents -- |t Preface and Acknowledgments -- |t List of Mathematical Symbols -- |t Chapter 1. Physics of CMOS Integrated Circuits -- |t Chapter 2. Method of Analysis of CMOS Circuit Failures -- |t Chapter 3. Circuit Failures Due to Anomalous Signal Flow -- |t Chapter 4. Noise Phenomena in Digital Circuits -- |t Chapter 5. Circuit Failures Due to Timing Problems -- |t Chapter 6. Essential Uncertainty in CMOS Circuits -- |t Chapter 7. Design Failures of CMOS Systems -- |t Index. |
520 | |a CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905. | ||
546 | |a In English. | ||
650 | 0 | |a Metal oxide semiconductors, Complementary. |0 http://id.loc.gov/authorities/subjects/sh85084067 | |
650 | 0 | |a Semiconductors |x Failures. |0 http://id.loc.gov/authorities/subjects/sh86006952 | |
650 | 0 | |a Digital integrated circuits |x Design and construction |x Data processing. |0 http://id.loc.gov/authorities/subjects/sh87006330 | |
650 | 6 | |a MOS complémentaires. | |
650 | 6 | |a Semi-conducteurs |x Défaillances. | |
650 | 6 | |a Circuits intégrés numériques |x Conception et construction |x Informatique. | |
650 | 7 | |a MATHEMATICS |x Complex Analysis. |2 bisacsh | |
650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
650 | 7 | |a Digital integrated circuits |x Design and construction |x Data processing |2 fast | |
650 | 7 | |a Metal oxide semiconductors, Complementary |2 fast | |
650 | 7 | |a Semiconductors |x Failures |2 fast | |
776 | 0 | 8 | |i Print version: |a Shoji, Masakazu. |t Theory of CMOS digital circuits and circuit failures. |d Princeton, New Jersey : Princeton University Press, [1992] |h xviii, 570 pages ; 27 cm |k Princeton legacy library |z 9780691603018 |w (DLC) 10899030 |
856 | 4 | 0 | |l FWS01 |p ZDB-4-EBA |q FWS_PDA_EBA |u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=790985 |3 Volltext |
938 | |a De Gruyter |b DEGR |n 9781400862849 | ||
938 | |a ebrary |b EBRY |n ebr10899030 | ||
938 | |a EBSCOhost |b EBSC |n 790985 | ||
938 | |a YBP Library Services |b YANK |n 11997457 | ||
994 | |a 92 |b GEBAY | ||
912 | |a ZDB-4-EBA | ||
049 | |a DE-863 |
Datensatz im Suchindex
DE-BY-FWS_katkey | ZDB-4-EBA-ocn889252808 |
---|---|
_version_ | 1816882283893751809 |
adam_text | |
any_adam_object | |
author | Shoji, Masakazu, 1936- |
author_GND | http://id.loc.gov/authorities/names/n87891860 |
author_facet | Shoji, Masakazu, 1936- |
author_role | aut |
author_sort | Shoji, Masakazu, 1936- |
author_variant | m s ms |
building | Verbundindex |
bvnumber | localFWS |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871.99.M44 S525 1992eb |
callnumber-search | TK7871.99.M44 S525 1992eb |
callnumber-sort | TK 47871.99 M44 S525 41992EB |
callnumber-subject | TK - Electrical and Nuclear Engineering |
collection | ZDB-4-EBA |
contents | Frontmatter -- Contents -- Preface and Acknowledgments -- List of Mathematical Symbols -- Chapter 1. Physics of CMOS Integrated Circuits -- Chapter 2. Method of Analysis of CMOS Circuit Failures -- Chapter 3. Circuit Failures Due to Anomalous Signal Flow -- Chapter 4. Noise Phenomena in Digital Circuits -- Chapter 5. Circuit Failures Due to Timing Problems -- Chapter 6. Essential Uncertainty in CMOS Circuits -- Chapter 7. Design Failures of CMOS Systems -- Index. |
ctrlnum | (OCoLC)889252808 |
dewey-full | 621.39/5 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.39/5 |
dewey-search | 621.39/5 |
dewey-sort | 3621.39 15 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>05984cam a2200697Mi 4500</leader><controlfield tag="001">ZDB-4-EBA-ocn889252808</controlfield><controlfield tag="003">OCoLC</controlfield><controlfield tag="005">20241004212047.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">920312t19921992njua ob 001 0 eng d</controlfield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">E7B</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">E7B</subfield><subfield code="d">OCLCO</subfield><subfield code="d">JSTOR</subfield><subfield code="d">OCLCF</subfield><subfield code="d">DEBBG</subfield><subfield code="d">N$T</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">DEBSZ</subfield><subfield code="d">YDXCP</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">IGB</subfield><subfield code="d">AGLDB</subfield><subfield code="d">EZ9</subfield><subfield code="d">DEGRU</subfield><subfield code="d">D6H</subfield><subfield code="d">STF</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">VTS</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">LVT</subfield><subfield code="d">S9I</subfield><subfield code="d">COO</subfield><subfield code="d">DKC</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">LEAUB</subfield><subfield code="d">UX1</subfield><subfield code="d">AJS</subfield><subfield code="d">IEEEE</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCL</subfield></datafield><datafield tag="019" ind1=" " ind2=" "><subfield code="a">956738559</subfield><subfield code="a">1013955510</subfield><subfield code="a">1029825195</subfield><subfield code="a">1032677483</subfield><subfield code="a">1037978592</subfield><subfield code="a">1041976614</subfield><subfield code="a">1046612531</subfield><subfield code="a">1046729852</subfield><subfield code="a">1047005755</subfield><subfield code="a">1079012813</subfield><subfield code="a">1086506215</subfield><subfield code="a">1175625423</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781400862849</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1400862841</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780691087634</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0691087636</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0691603014</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780691603018</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1515/9781400862849</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)889252808</subfield><subfield code="z">(OCoLC)956738559</subfield><subfield code="z">(OCoLC)1013955510</subfield><subfield code="z">(OCoLC)1029825195</subfield><subfield code="z">(OCoLC)1032677483</subfield><subfield code="z">(OCoLC)1037978592</subfield><subfield code="z">(OCoLC)1041976614</subfield><subfield code="z">(OCoLC)1046612531</subfield><subfield code="z">(OCoLC)1046729852</subfield><subfield code="z">(OCoLC)1047005755</subfield><subfield code="z">(OCoLC)1079012813</subfield><subfield code="z">(OCoLC)1086506215</subfield><subfield code="z">(OCoLC)1175625423</subfield></datafield><datafield tag="037" ind1=" " ind2=" "><subfield code="a">22573/ctt738995</subfield><subfield code="b">JSTOR</subfield></datafield><datafield tag="037" ind1=" " ind2=" "><subfield code="a">9453259</subfield><subfield code="b">IEEE</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TK7871.99.M44</subfield><subfield code="b">S525 1992eb</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">MAT040000</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">TEC</subfield><subfield code="x">009070</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="082" ind1="7" ind2=" "><subfield code="a">621.39/5</subfield><subfield code="2">20</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">MAIN</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shoji, Masakazu,</subfield><subfield code="d">1936-</subfield><subfield code="e">author.</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PCjqBQpTw6DxRW9mbJjftTd</subfield><subfield code="0">http://id.loc.gov/authorities/names/n87891860</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Theory of CMOS digital circuits and circuit failures /</subfield><subfield code="c">Masakazu Shoji.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Princeton, New Jersey :</subfield><subfield code="b">Princeton University Press,</subfield><subfield code="c">[1992]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">©1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (589 pages) :</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="347" ind1=" " ind2=" "><subfield code="a">data file</subfield><subfield code="2">rda</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Princeton legacy library</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index.</subfield></datafield><datafield tag="588" ind1="0" ind2=" "><subfield code="a">Print version record.</subfield></datafield><datafield tag="505" ind1="0" ind2="0"><subfield code="t">Frontmatter --</subfield><subfield code="t">Contents --</subfield><subfield code="t">Preface and Acknowledgments --</subfield><subfield code="t">List of Mathematical Symbols --</subfield><subfield code="t">Chapter 1. Physics of CMOS Integrated Circuits --</subfield><subfield code="t">Chapter 2. Method of Analysis of CMOS Circuit Failures --</subfield><subfield code="t">Chapter 3. Circuit Failures Due to Anomalous Signal Flow --</subfield><subfield code="t">Chapter 4. Noise Phenomena in Digital Circuits --</subfield><subfield code="t">Chapter 5. Circuit Failures Due to Timing Problems --</subfield><subfield code="t">Chapter 6. Essential Uncertainty in CMOS Circuits --</subfield><subfield code="t">Chapter 7. Design Failures of CMOS Systems --</subfield><subfield code="t">Index.</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905.</subfield></datafield><datafield tag="546" ind1=" " ind2=" "><subfield code="a">In English.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Metal oxide semiconductors, Complementary.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh85084067</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Semiconductors</subfield><subfield code="x">Failures.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh86006952</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Digital integrated circuits</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Data processing.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh87006330</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">MOS complémentaires.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Semi-conducteurs</subfield><subfield code="x">Défaillances.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Circuits intégrés numériques</subfield><subfield code="x">Conception et construction</subfield><subfield code="x">Informatique.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">MATHEMATICS</subfield><subfield code="x">Complex Analysis.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING</subfield><subfield code="x">Mechanical.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Digital integrated circuits</subfield><subfield code="x">Design and construction</subfield><subfield code="x">Data processing</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Metal oxide semiconductors, Complementary</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconductors</subfield><subfield code="x">Failures</subfield><subfield code="2">fast</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Shoji, Masakazu.</subfield><subfield code="t">Theory of CMOS digital circuits and circuit failures.</subfield><subfield code="d">Princeton, New Jersey : Princeton University Press, [1992]</subfield><subfield code="h">xviii, 570 pages ; 27 cm</subfield><subfield code="k">Princeton legacy library</subfield><subfield code="z">9780691603018</subfield><subfield code="w">(DLC) 10899030</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="l">FWS01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FWS_PDA_EBA</subfield><subfield code="u">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=790985</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">De Gruyter</subfield><subfield code="b">DEGR</subfield><subfield code="n">9781400862849</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">ebrary</subfield><subfield code="b">EBRY</subfield><subfield code="n">ebr10899030</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBSCOhost</subfield><subfield code="b">EBSC</subfield><subfield code="n">790985</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">11997457</subfield></datafield><datafield tag="994" ind1=" " ind2=" "><subfield code="a">92</subfield><subfield code="b">GEBAY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-863</subfield></datafield></record></collection> |
id | ZDB-4-EBA-ocn889252808 |
illustrated | Illustrated |
indexdate | 2024-11-27T13:26:09Z |
institution | BVB |
isbn | 9781400862849 1400862841 9780691087634 0691087636 0691603014 9780691603018 |
language | English |
oclc_num | 889252808 |
open_access_boolean | |
owner | MAIN DE-863 DE-BY-FWS |
owner_facet | MAIN DE-863 DE-BY-FWS |
physical | 1 online resource (589 pages) : illustrations |
psigel | ZDB-4-EBA |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
publisher | Princeton University Press, |
record_format | marc |
series2 | Princeton legacy library |
spelling | Shoji, Masakazu, 1936- author. https://id.oclc.org/worldcat/entity/E39PCjqBQpTw6DxRW9mbJjftTd http://id.loc.gov/authorities/names/n87891860 Theory of CMOS digital circuits and circuit failures / Masakazu Shoji. Princeton, New Jersey : Princeton University Press, [1992] ©1992 1 online resource (589 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier data file rda Princeton legacy library Includes bibliographical references and index. Print version record. Frontmatter -- Contents -- Preface and Acknowledgments -- List of Mathematical Symbols -- Chapter 1. Physics of CMOS Integrated Circuits -- Chapter 2. Method of Analysis of CMOS Circuit Failures -- Chapter 3. Circuit Failures Due to Anomalous Signal Flow -- Chapter 4. Noise Phenomena in Digital Circuits -- Chapter 5. Circuit Failures Due to Timing Problems -- Chapter 6. Essential Uncertainty in CMOS Circuits -- Chapter 7. Design Failures of CMOS Systems -- Index. CMOS chips are becoming increasingly important in computer circuitry. They have been widely used during the past decade, and they will continue to grow in popularity in those application areas that demand high performance. Challenging the prevailing opinion that circuit simulation can reveal all problems in CMOS circuits, Masakazu Shoji maintains that simulation cannot completely remove the often costly errors that occur in circuit design. To address the failure modes of these circuits more fully, he presents a new approach to CMOS circuit design based on his systematizing of circuit design error and his unique theory of CMOS digital circuit operation. In analyzing CMOS digital circuits, the author focuses not on effects originating from the characteristics of the device (MOSFET) but on those arising from their connection. This emphasis allows him to formulate a powerful but ultimately simple theory explaining the effects of connectivity by using a concept of the states of the circuits, called microstates. Shoji introduces microstate sequence diagrams that describe the state changes (or the circuit connectivity changes), and he uses his microstate theory to analyze many of the conventional CMOS digital circuits. These analyses are practically all in closed-form, and they provide easy physical interpretation of the circuit's working mechanisms, the parametric dependence of performance, and the circuit's failure modes. Originally published in 1992. The Princeton Legacy Library uses the latest print-on-demand technology to again make available previously out-of-print books from the distinguished backlist of Princeton University Press. These paperback editions preserve the original texts of these important books while presenting them in durable paperback editions. The goal of the Princeton Legacy Library is to vastly increase access to the rich scholarly heritage found in the thousands of books published by Princeton University Press since its founding in 1905. In English. Metal oxide semiconductors, Complementary. http://id.loc.gov/authorities/subjects/sh85084067 Semiconductors Failures. http://id.loc.gov/authorities/subjects/sh86006952 Digital integrated circuits Design and construction Data processing. http://id.loc.gov/authorities/subjects/sh87006330 MOS complémentaires. Semi-conducteurs Défaillances. Circuits intégrés numériques Conception et construction Informatique. MATHEMATICS Complex Analysis. bisacsh TECHNOLOGY & ENGINEERING Mechanical. bisacsh Digital integrated circuits Design and construction Data processing fast Metal oxide semiconductors, Complementary fast Semiconductors Failures fast Print version: Shoji, Masakazu. Theory of CMOS digital circuits and circuit failures. Princeton, New Jersey : Princeton University Press, [1992] xviii, 570 pages ; 27 cm Princeton legacy library 9780691603018 (DLC) 10899030 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=790985 Volltext |
spellingShingle | Shoji, Masakazu, 1936- Theory of CMOS digital circuits and circuit failures / Frontmatter -- Contents -- Preface and Acknowledgments -- List of Mathematical Symbols -- Chapter 1. Physics of CMOS Integrated Circuits -- Chapter 2. Method of Analysis of CMOS Circuit Failures -- Chapter 3. Circuit Failures Due to Anomalous Signal Flow -- Chapter 4. Noise Phenomena in Digital Circuits -- Chapter 5. Circuit Failures Due to Timing Problems -- Chapter 6. Essential Uncertainty in CMOS Circuits -- Chapter 7. Design Failures of CMOS Systems -- Index. Metal oxide semiconductors, Complementary. http://id.loc.gov/authorities/subjects/sh85084067 Semiconductors Failures. http://id.loc.gov/authorities/subjects/sh86006952 Digital integrated circuits Design and construction Data processing. http://id.loc.gov/authorities/subjects/sh87006330 MOS complémentaires. Semi-conducteurs Défaillances. Circuits intégrés numériques Conception et construction Informatique. MATHEMATICS Complex Analysis. bisacsh TECHNOLOGY & ENGINEERING Mechanical. bisacsh Digital integrated circuits Design and construction Data processing fast Metal oxide semiconductors, Complementary fast Semiconductors Failures fast |
subject_GND | http://id.loc.gov/authorities/subjects/sh85084067 http://id.loc.gov/authorities/subjects/sh86006952 http://id.loc.gov/authorities/subjects/sh87006330 |
title | Theory of CMOS digital circuits and circuit failures / |
title_alt | Frontmatter -- Contents -- Preface and Acknowledgments -- List of Mathematical Symbols -- Chapter 1. Physics of CMOS Integrated Circuits -- Chapter 2. Method of Analysis of CMOS Circuit Failures -- Chapter 3. Circuit Failures Due to Anomalous Signal Flow -- Chapter 4. Noise Phenomena in Digital Circuits -- Chapter 5. Circuit Failures Due to Timing Problems -- Chapter 6. Essential Uncertainty in CMOS Circuits -- Chapter 7. Design Failures of CMOS Systems -- Index. |
title_auth | Theory of CMOS digital circuits and circuit failures / |
title_exact_search | Theory of CMOS digital circuits and circuit failures / |
title_full | Theory of CMOS digital circuits and circuit failures / Masakazu Shoji. |
title_fullStr | Theory of CMOS digital circuits and circuit failures / Masakazu Shoji. |
title_full_unstemmed | Theory of CMOS digital circuits and circuit failures / Masakazu Shoji. |
title_short | Theory of CMOS digital circuits and circuit failures / |
title_sort | theory of cmos digital circuits and circuit failures |
topic | Metal oxide semiconductors, Complementary. http://id.loc.gov/authorities/subjects/sh85084067 Semiconductors Failures. http://id.loc.gov/authorities/subjects/sh86006952 Digital integrated circuits Design and construction Data processing. http://id.loc.gov/authorities/subjects/sh87006330 MOS complémentaires. Semi-conducteurs Défaillances. Circuits intégrés numériques Conception et construction Informatique. MATHEMATICS Complex Analysis. bisacsh TECHNOLOGY & ENGINEERING Mechanical. bisacsh Digital integrated circuits Design and construction Data processing fast Metal oxide semiconductors, Complementary fast Semiconductors Failures fast |
topic_facet | Metal oxide semiconductors, Complementary. Semiconductors Failures. Digital integrated circuits Design and construction Data processing. MOS complémentaires. Semi-conducteurs Défaillances. Circuits intégrés numériques Conception et construction Informatique. MATHEMATICS Complex Analysis. TECHNOLOGY & ENGINEERING Mechanical. Digital integrated circuits Design and construction Data processing Metal oxide semiconductors, Complementary Semiconductors Failures |
url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=790985 |
work_keys_str_mv | AT shojimasakazu theoryofcmosdigitalcircuitsandcircuitfailures |