Modern X-ray analysis on single crystals :: a practical guide /
This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Boston :
Walter de Gruyter GmbH & Co. KG,
2013.
|
| Ausgabe: | 2nd edition. |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level. |
| Beschreibung: | Includes index. |
| Beschreibung: | 1 online resource |
| ISBN: | 9783110308280 3110308282 9781523100576 1523100575 9783110370614 3110370611 |
Internformat
MARC
| LEADER | 00000cam a2200000 i 4500 | ||
|---|---|---|---|
| 001 | ZDB-4-EBA-ocn876592818 | ||
| 003 | OCoLC | ||
| 005 | 20241004212047.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 140414s2013 gw o 001 0 eng d | ||
| 040 | |a N$T |b eng |e rda |e pn |c N$T |d CDX |d OCLCF |d DEBBG |d EBLCP |d HEBIS |d YDXCP |d DEBSZ |d KNOVL |d N$T |d ZCU |d AGLDB |d OCLCQ |d MERUC |d OCLCQ |d VTS |d CEF |d RRP |d ICG |d OCLCQ |d STF |d DKC |d AU@ |d OCLCQ |d M8D |d OCLCQ |d S9I |d OCLCQ |d AJS |d OCLCQ |d OCLCO |d OCLCQ |d OCLCO |d OCLCL |d SXB | ||
| 019 | |a 875819003 |a 900213162 |a 900283017 |a 958545452 | ||
| 020 | |a 9783110308280 |q (electronic bk.) | ||
| 020 | |a 3110308282 |q (electronic bk.) | ||
| 020 | |a 9781523100576 |q (electronic bk.) | ||
| 020 | |a 1523100575 |q (electronic bk.) | ||
| 020 | |a 9783110370614 |q (electronic bk.) | ||
| 020 | |a 3110370611 |q (electronic bk.) | ||
| 020 | |z 9783110308235 | ||
| 020 | |z 3110308231 | ||
| 020 | |z 3110370611 | ||
| 035 | |a (OCoLC)876592818 |z (OCoLC)875819003 |z (OCoLC)900213162 |z (OCoLC)900283017 |z (OCoLC)958545452 | ||
| 050 | 4 | |a QD945 |b .L77 2013eb | |
| 072 | 7 | |a SCI |x 016000 |2 bisacsh | |
| 082 | 7 | |a 548 |2 23 | |
| 049 | |a MAIN | ||
| 100 | 1 | |a Luger, Peter, |d 1943- |e author. |1 https://id.oclc.org/worldcat/entity/E39PBJhMfwJPcpgw688McjQg8C |0 http://id.loc.gov/authorities/names/n80018260 | |
| 245 | 1 | 0 | |a Modern X-ray analysis on single crystals : |b a practical guide / |c by Peter Luger. |
| 250 | |a 2nd edition. | ||
| 264 | 1 | |a Berlin ; |a Boston : |b Walter de Gruyter GmbH & Co. KG, |c 2013. | |
| 300 | |a 1 online resource | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 500 | |a Includes index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a 1 Introduction; 1.1 Historical remarks; 1.2 The crystal lattice: Basic definitions; 1.2.1 Periodicity, lattice constants; 1.2.2 Lattice points, lattice planes, reciprocal lattice; 1.3 Sample structures; 2 Fundamental results of diffraction theory, X-radiation; 2.1 Electron density and related functions; 2.2 Diffraction conditions for single crystals; 2.3 X-rays; 2.3.1 Generation of X-rays; 2.3.2 Absorption; 2.3.3 Filters, monochromators; 2.3.4 X-ray tubes; 2.3.5 Synchrotron radiation; 3 Preliminary experiments; 3.1 Film methods; 3.1.1 The rotation method; 3.1.2 Zero level Weissenberg method. | |
| 505 | 8 | |a 3.1.3 Upper level Weissenberg -- normal beam and equi-inclination method3.1.4 Precession technique; 3.2 Practicing film techniques; 3.2.1 Choice of experimental conditions; 3.2.2 Rotation and Weissenberg photographs of KAMTRA and SUCROS; 4 Crystal symmetry; 4.1 Symmetry operations in a crystal lattice; 4.1.1 Introduction; 4.1.2 Basic symmetry operations; 4.1.3 Crystal classes and related coordinate systems; 4.1.4 Translational symmetry, lattice types and space groups; 4.2 Crystal symmetry and related intensity symmetry; 4.2.1 Representation of? and F as Fourier series. | |
| 505 | 8 | |a 4.2.2 Thermal motion, displacement parameters4.2.3 Intensity symmetry, asymmetric unit; 4.2.4 Systematic extinctions; 4.2.5 Quasicrystals; 4.3 Space group determination; 4.3.1 General considerations, practical aspects; 4.3.2 Space groups of KAMTRA and SUCROS from film exposures; 5 Diffractometer measurements; 5.1 Point detector data collection on a four-circle diffractometer; 5.1.1 Eulerian cradle geometry; 5.1.2 Choice of experimental conditions; 5.1.3 Precise determination of lattice constants; 5.1.4 Intensity measurements; 5.2 Area detector diffractometers; 5.2.1 Imaging plates. | |
| 505 | 8 | |a 5.2.2 CCD diffractometers5.2.3 Data processing for area detector measurements; 5.2.4 Data collections for B12 and C60F18; 6 Computer programs; 7 Solution of the phase problem; 7.1 Data reduction; 7.2 Fourier methods; 7.2.1 Interpretation of the Patterson function; 7.2.2 Heavy atom methods, principle of difference electron density; 7.2.3 Harker sections, applications to KAMTRA; 7.2.4 Numerical calculation of Fourier syntheses; 7.3 Direct methods; 7.3.1 Normalization; 7.3.2 Fundamental formulae; 7.3.3 Origin definition, choice of starting set. | |
| 505 | 8 | |a 7.3.4 Application of direct methods, the examples of SUCROS and C60F187.4 Phase determination for macromolecules; 8 Refinements; 8.1 Theoretical aspects; 8.1.1 Model versus experiment, R-value; 8.1.2 Theory of least-squares refinement; 8.2 Practicing least-squares methods; 8.2.1 Aspects of numerical calculations; 8.2.2 Execution of a complete refinement process; 8.2.3 Corrections to be applied during refinement; 8.3 Analysis and representation of results; 8.3.1 Geometrical data; 8.3.2 Graphical representations; 8.3.3 Archiving data, crystallographic information file (CIF). | |
| 520 | |a This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level. | ||
| 650 | 0 | |a X-ray crystallography. |0 http://id.loc.gov/authorities/subjects/sh85148730 | |
| 650 | 2 | |a Crystallography, X-Ray |0 https://id.nlm.nih.gov/mesh/D018360 | |
| 650 | 6 | |a Radiocristallographie. | |
| 650 | 7 | |a SCIENCE |x Physics |x Crystallography. |2 bisacsh | |
| 650 | 7 | |a X-ray crystallography |2 fast | |
| 655 | 4 | |a Electronic book. | |
| 776 | 0 | 8 | |i Print version: |a Luger, Peter, 1943- |t Modern X-ray analysis on single crystals. |b 2nd edition |z 9783110308235 |w (DLC) 2013045276 |w (OCoLC)862962293 |
| 856 | 4 | 0 | |l FWS01 |p ZDB-4-EBA |q FWS_PDA_EBA |u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=754098 |3 Volltext |
| 938 | |a Coutts Information Services |b COUT |n 28004114 | ||
| 938 | |a EBL - Ebook Library |b EBLB |n EBL1575462 | ||
| 938 | |a EBSCOhost |b EBSC |n 754098 | ||
| 938 | |a YBP Library Services |b YANK |n 11723022 | ||
| 938 | |a YBP Library Services |b YANK |n 10818202 | ||
| 994 | |a 92 |b GEBAY | ||
| 912 | |a ZDB-4-EBA | ||
| 049 | |a DE-863 | ||
Datensatz im Suchindex
| DE-BY-FWS_katkey | ZDB-4-EBA-ocn876592818 |
|---|---|
| _version_ | 1816882267866267648 |
| adam_text | |
| any_adam_object | |
| author | Luger, Peter, 1943- |
| author_GND | http://id.loc.gov/authorities/names/n80018260 |
| author_facet | Luger, Peter, 1943- |
| author_role | aut |
| author_sort | Luger, Peter, 1943- |
| author_variant | p l pl |
| building | Verbundindex |
| bvnumber | localFWS |
| callnumber-first | Q - Science |
| callnumber-label | QD945 |
| callnumber-raw | QD945 .L77 2013eb |
| callnumber-search | QD945 .L77 2013eb |
| callnumber-sort | QD 3945 L77 42013EB |
| callnumber-subject | QD - Chemistry |
| collection | ZDB-4-EBA |
| contents | 1 Introduction; 1.1 Historical remarks; 1.2 The crystal lattice: Basic definitions; 1.2.1 Periodicity, lattice constants; 1.2.2 Lattice points, lattice planes, reciprocal lattice; 1.3 Sample structures; 2 Fundamental results of diffraction theory, X-radiation; 2.1 Electron density and related functions; 2.2 Diffraction conditions for single crystals; 2.3 X-rays; 2.3.1 Generation of X-rays; 2.3.2 Absorption; 2.3.3 Filters, monochromators; 2.3.4 X-ray tubes; 2.3.5 Synchrotron radiation; 3 Preliminary experiments; 3.1 Film methods; 3.1.1 The rotation method; 3.1.2 Zero level Weissenberg method. 3.1.3 Upper level Weissenberg -- normal beam and equi-inclination method3.1.4 Precession technique; 3.2 Practicing film techniques; 3.2.1 Choice of experimental conditions; 3.2.2 Rotation and Weissenberg photographs of KAMTRA and SUCROS; 4 Crystal symmetry; 4.1 Symmetry operations in a crystal lattice; 4.1.1 Introduction; 4.1.2 Basic symmetry operations; 4.1.3 Crystal classes and related coordinate systems; 4.1.4 Translational symmetry, lattice types and space groups; 4.2 Crystal symmetry and related intensity symmetry; 4.2.1 Representation of? and F as Fourier series. 4.2.2 Thermal motion, displacement parameters4.2.3 Intensity symmetry, asymmetric unit; 4.2.4 Systematic extinctions; 4.2.5 Quasicrystals; 4.3 Space group determination; 4.3.1 General considerations, practical aspects; 4.3.2 Space groups of KAMTRA and SUCROS from film exposures; 5 Diffractometer measurements; 5.1 Point detector data collection on a four-circle diffractometer; 5.1.1 Eulerian cradle geometry; 5.1.2 Choice of experimental conditions; 5.1.3 Precise determination of lattice constants; 5.1.4 Intensity measurements; 5.2 Area detector diffractometers; 5.2.1 Imaging plates. 5.2.2 CCD diffractometers5.2.3 Data processing for area detector measurements; 5.2.4 Data collections for B12 and C60F18; 6 Computer programs; 7 Solution of the phase problem; 7.1 Data reduction; 7.2 Fourier methods; 7.2.1 Interpretation of the Patterson function; 7.2.2 Heavy atom methods, principle of difference electron density; 7.2.3 Harker sections, applications to KAMTRA; 7.2.4 Numerical calculation of Fourier syntheses; 7.3 Direct methods; 7.3.1 Normalization; 7.3.2 Fundamental formulae; 7.3.3 Origin definition, choice of starting set. 7.3.4 Application of direct methods, the examples of SUCROS and C60F187.4 Phase determination for macromolecules; 8 Refinements; 8.1 Theoretical aspects; 8.1.1 Model versus experiment, R-value; 8.1.2 Theory of least-squares refinement; 8.2 Practicing least-squares methods; 8.2.1 Aspects of numerical calculations; 8.2.2 Execution of a complete refinement process; 8.2.3 Corrections to be applied during refinement; 8.3 Analysis and representation of results; 8.3.1 Geometrical data; 8.3.2 Graphical representations; 8.3.3 Archiving data, crystallographic information file (CIF). |
| ctrlnum | (OCoLC)876592818 |
| dewey-full | 548 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548 |
| dewey-search | 548 |
| dewey-sort | 3548 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| edition | 2nd edition. |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>06004cam a2200649 i 4500</leader><controlfield tag="001">ZDB-4-EBA-ocn876592818</controlfield><controlfield tag="003">OCoLC</controlfield><controlfield tag="005">20241004212047.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr cnu---unuuu</controlfield><controlfield tag="008">140414s2013 gw o 001 0 eng d</controlfield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">N$T</subfield><subfield code="b">eng</subfield><subfield code="e">rda</subfield><subfield code="e">pn</subfield><subfield code="c">N$T</subfield><subfield code="d">CDX</subfield><subfield code="d">OCLCF</subfield><subfield code="d">DEBBG</subfield><subfield code="d">EBLCP</subfield><subfield code="d">HEBIS</subfield><subfield code="d">YDXCP</subfield><subfield code="d">DEBSZ</subfield><subfield code="d">KNOVL</subfield><subfield code="d">N$T</subfield><subfield code="d">ZCU</subfield><subfield code="d">AGLDB</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">MERUC</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">VTS</subfield><subfield code="d">CEF</subfield><subfield code="d">RRP</subfield><subfield code="d">ICG</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">STF</subfield><subfield code="d">DKC</subfield><subfield code="d">AU@</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">M8D</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">S9I</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">AJS</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCL</subfield><subfield code="d">SXB</subfield></datafield><datafield tag="019" ind1=" " ind2=" "><subfield code="a">875819003</subfield><subfield code="a">900213162</subfield><subfield code="a">900283017</subfield><subfield code="a">958545452</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783110308280</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3110308282</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781523100576</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1523100575</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783110370614</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3110370611</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">9783110308235</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">3110308231</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="z">3110370611</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)876592818</subfield><subfield code="z">(OCoLC)875819003</subfield><subfield code="z">(OCoLC)900213162</subfield><subfield code="z">(OCoLC)900283017</subfield><subfield code="z">(OCoLC)958545452</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">QD945</subfield><subfield code="b">.L77 2013eb</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">SCI</subfield><subfield code="x">016000</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="082" ind1="7" ind2=" "><subfield code="a">548</subfield><subfield code="2">23</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">MAIN</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Luger, Peter,</subfield><subfield code="d">1943-</subfield><subfield code="e">author.</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PBJhMfwJPcpgw688McjQg8C</subfield><subfield code="0">http://id.loc.gov/authorities/names/n80018260</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Modern X-ray analysis on single crystals :</subfield><subfield code="b">a practical guide /</subfield><subfield code="c">by Peter Luger.</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2nd edition.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin ;</subfield><subfield code="a">Boston :</subfield><subfield code="b">Walter de Gruyter GmbH & Co. KG,</subfield><subfield code="c">2013.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes index.</subfield></datafield><datafield tag="588" ind1="0" ind2=" "><subfield code="a">Print version record.</subfield></datafield><datafield tag="505" ind1="0" ind2=" "><subfield code="a">1 Introduction; 1.1 Historical remarks; 1.2 The crystal lattice: Basic definitions; 1.2.1 Periodicity, lattice constants; 1.2.2 Lattice points, lattice planes, reciprocal lattice; 1.3 Sample structures; 2 Fundamental results of diffraction theory, X-radiation; 2.1 Electron density and related functions; 2.2 Diffraction conditions for single crystals; 2.3 X-rays; 2.3.1 Generation of X-rays; 2.3.2 Absorption; 2.3.3 Filters, monochromators; 2.3.4 X-ray tubes; 2.3.5 Synchrotron radiation; 3 Preliminary experiments; 3.1 Film methods; 3.1.1 The rotation method; 3.1.2 Zero level Weissenberg method.</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">3.1.3 Upper level Weissenberg -- normal beam and equi-inclination method3.1.4 Precession technique; 3.2 Practicing film techniques; 3.2.1 Choice of experimental conditions; 3.2.2 Rotation and Weissenberg photographs of KAMTRA and SUCROS; 4 Crystal symmetry; 4.1 Symmetry operations in a crystal lattice; 4.1.1 Introduction; 4.1.2 Basic symmetry operations; 4.1.3 Crystal classes and related coordinate systems; 4.1.4 Translational symmetry, lattice types and space groups; 4.2 Crystal symmetry and related intensity symmetry; 4.2.1 Representation of? and F as Fourier series.</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">4.2.2 Thermal motion, displacement parameters4.2.3 Intensity symmetry, asymmetric unit; 4.2.4 Systematic extinctions; 4.2.5 Quasicrystals; 4.3 Space group determination; 4.3.1 General considerations, practical aspects; 4.3.2 Space groups of KAMTRA and SUCROS from film exposures; 5 Diffractometer measurements; 5.1 Point detector data collection on a four-circle diffractometer; 5.1.1 Eulerian cradle geometry; 5.1.2 Choice of experimental conditions; 5.1.3 Precise determination of lattice constants; 5.1.4 Intensity measurements; 5.2 Area detector diffractometers; 5.2.1 Imaging plates.</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">5.2.2 CCD diffractometers5.2.3 Data processing for area detector measurements; 5.2.4 Data collections for B12 and C60F18; 6 Computer programs; 7 Solution of the phase problem; 7.1 Data reduction; 7.2 Fourier methods; 7.2.1 Interpretation of the Patterson function; 7.2.2 Heavy atom methods, principle of difference electron density; 7.2.3 Harker sections, applications to KAMTRA; 7.2.4 Numerical calculation of Fourier syntheses; 7.3 Direct methods; 7.3.1 Normalization; 7.3.2 Fundamental formulae; 7.3.3 Origin definition, choice of starting set.</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">7.3.4 Application of direct methods, the examples of SUCROS and C60F187.4 Phase determination for macromolecules; 8 Refinements; 8.1 Theoretical aspects; 8.1.1 Model versus experiment, R-value; 8.1.2 Theory of least-squares refinement; 8.2 Practicing least-squares methods; 8.2.1 Aspects of numerical calculations; 8.2.2 Execution of a complete refinement process; 8.2.3 Corrections to be applied during refinement; 8.3 Analysis and representation of results; 8.3.1 Geometrical data; 8.3.2 Graphical representations; 8.3.3 Archiving data, crystallographic information file (CIF).</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level.</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">X-ray crystallography.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh85148730</subfield></datafield><datafield tag="650" ind1=" " ind2="2"><subfield code="a">Crystallography, X-Ray</subfield><subfield code="0">https://id.nlm.nih.gov/mesh/D018360</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Radiocristallographie.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">SCIENCE</subfield><subfield code="x">Physics</subfield><subfield code="x">Crystallography.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">X-ray crystallography</subfield><subfield code="2">fast</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic book.</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Luger, Peter, 1943-</subfield><subfield code="t">Modern X-ray analysis on single crystals.</subfield><subfield code="b">2nd edition</subfield><subfield code="z">9783110308235</subfield><subfield code="w">(DLC) 2013045276</subfield><subfield code="w">(OCoLC)862962293</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="l">FWS01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FWS_PDA_EBA</subfield><subfield code="u">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=754098</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">Coutts Information Services</subfield><subfield code="b">COUT</subfield><subfield code="n">28004114</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBL - Ebook Library</subfield><subfield code="b">EBLB</subfield><subfield code="n">EBL1575462</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBSCOhost</subfield><subfield code="b">EBSC</subfield><subfield code="n">754098</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">11723022</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">10818202</subfield></datafield><datafield tag="994" ind1=" " ind2=" "><subfield code="a">92</subfield><subfield code="b">GEBAY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-863</subfield></datafield></record></collection> |
| genre | Electronic book. |
| genre_facet | Electronic book. |
| id | ZDB-4-EBA-ocn876592818 |
| illustrated | Not Illustrated |
| indexdate | 2024-11-27T13:25:54Z |
| institution | BVB |
| isbn | 9783110308280 3110308282 9781523100576 1523100575 9783110370614 3110370611 |
| language | English |
| oclc_num | 876592818 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource |
| psigel | ZDB-4-EBA |
| publishDate | 2013 |
| publishDateSearch | 2013 |
| publishDateSort | 2013 |
| publisher | Walter de Gruyter GmbH & Co. KG, |
| record_format | marc |
| spelling | Luger, Peter, 1943- author. https://id.oclc.org/worldcat/entity/E39PBJhMfwJPcpgw688McjQg8C http://id.loc.gov/authorities/names/n80018260 Modern X-ray analysis on single crystals : a practical guide / by Peter Luger. 2nd edition. Berlin ; Boston : Walter de Gruyter GmbH & Co. KG, 2013. 1 online resource text txt rdacontent computer c rdamedia online resource cr rdacarrier Includes index. Print version record. 1 Introduction; 1.1 Historical remarks; 1.2 The crystal lattice: Basic definitions; 1.2.1 Periodicity, lattice constants; 1.2.2 Lattice points, lattice planes, reciprocal lattice; 1.3 Sample structures; 2 Fundamental results of diffraction theory, X-radiation; 2.1 Electron density and related functions; 2.2 Diffraction conditions for single crystals; 2.3 X-rays; 2.3.1 Generation of X-rays; 2.3.2 Absorption; 2.3.3 Filters, monochromators; 2.3.4 X-ray tubes; 2.3.5 Synchrotron radiation; 3 Preliminary experiments; 3.1 Film methods; 3.1.1 The rotation method; 3.1.2 Zero level Weissenberg method. 3.1.3 Upper level Weissenberg -- normal beam and equi-inclination method3.1.4 Precession technique; 3.2 Practicing film techniques; 3.2.1 Choice of experimental conditions; 3.2.2 Rotation and Weissenberg photographs of KAMTRA and SUCROS; 4 Crystal symmetry; 4.1 Symmetry operations in a crystal lattice; 4.1.1 Introduction; 4.1.2 Basic symmetry operations; 4.1.3 Crystal classes and related coordinate systems; 4.1.4 Translational symmetry, lattice types and space groups; 4.2 Crystal symmetry and related intensity symmetry; 4.2.1 Representation of? and F as Fourier series. 4.2.2 Thermal motion, displacement parameters4.2.3 Intensity symmetry, asymmetric unit; 4.2.4 Systematic extinctions; 4.2.5 Quasicrystals; 4.3 Space group determination; 4.3.1 General considerations, practical aspects; 4.3.2 Space groups of KAMTRA and SUCROS from film exposures; 5 Diffractometer measurements; 5.1 Point detector data collection on a four-circle diffractometer; 5.1.1 Eulerian cradle geometry; 5.1.2 Choice of experimental conditions; 5.1.3 Precise determination of lattice constants; 5.1.4 Intensity measurements; 5.2 Area detector diffractometers; 5.2.1 Imaging plates. 5.2.2 CCD diffractometers5.2.3 Data processing for area detector measurements; 5.2.4 Data collections for B12 and C60F18; 6 Computer programs; 7 Solution of the phase problem; 7.1 Data reduction; 7.2 Fourier methods; 7.2.1 Interpretation of the Patterson function; 7.2.2 Heavy atom methods, principle of difference electron density; 7.2.3 Harker sections, applications to KAMTRA; 7.2.4 Numerical calculation of Fourier syntheses; 7.3 Direct methods; 7.3.1 Normalization; 7.3.2 Fundamental formulae; 7.3.3 Origin definition, choice of starting set. 7.3.4 Application of direct methods, the examples of SUCROS and C60F187.4 Phase determination for macromolecules; 8 Refinements; 8.1 Theoretical aspects; 8.1.1 Model versus experiment, R-value; 8.1.2 Theory of least-squares refinement; 8.2 Practicing least-squares methods; 8.2.1 Aspects of numerical calculations; 8.2.2 Execution of a complete refinement process; 8.2.3 Corrections to be applied during refinement; 8.3 Analysis and representation of results; 8.3.1 Geometrical data; 8.3.2 Graphical representations; 8.3.3 Archiving data, crystallographic information file (CIF). This completely revised edition is a guide for practical work in X-ray analysis. Experimental developments e.g. brilliant X-ray sources, area detection, and developments in computer hardware and software have led to increasing applications in X-ray analysis. An introduction to basic crystallography moves quickly to a practical and experimental treatment of structure analysis. Essential reading from the student to the professional level. X-ray crystallography. http://id.loc.gov/authorities/subjects/sh85148730 Crystallography, X-Ray https://id.nlm.nih.gov/mesh/D018360 Radiocristallographie. SCIENCE Physics Crystallography. bisacsh X-ray crystallography fast Electronic book. Print version: Luger, Peter, 1943- Modern X-ray analysis on single crystals. 2nd edition 9783110308235 (DLC) 2013045276 (OCoLC)862962293 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=754098 Volltext |
| spellingShingle | Luger, Peter, 1943- Modern X-ray analysis on single crystals : a practical guide / 1 Introduction; 1.1 Historical remarks; 1.2 The crystal lattice: Basic definitions; 1.2.1 Periodicity, lattice constants; 1.2.2 Lattice points, lattice planes, reciprocal lattice; 1.3 Sample structures; 2 Fundamental results of diffraction theory, X-radiation; 2.1 Electron density and related functions; 2.2 Diffraction conditions for single crystals; 2.3 X-rays; 2.3.1 Generation of X-rays; 2.3.2 Absorption; 2.3.3 Filters, monochromators; 2.3.4 X-ray tubes; 2.3.5 Synchrotron radiation; 3 Preliminary experiments; 3.1 Film methods; 3.1.1 The rotation method; 3.1.2 Zero level Weissenberg method. 3.1.3 Upper level Weissenberg -- normal beam and equi-inclination method3.1.4 Precession technique; 3.2 Practicing film techniques; 3.2.1 Choice of experimental conditions; 3.2.2 Rotation and Weissenberg photographs of KAMTRA and SUCROS; 4 Crystal symmetry; 4.1 Symmetry operations in a crystal lattice; 4.1.1 Introduction; 4.1.2 Basic symmetry operations; 4.1.3 Crystal classes and related coordinate systems; 4.1.4 Translational symmetry, lattice types and space groups; 4.2 Crystal symmetry and related intensity symmetry; 4.2.1 Representation of? and F as Fourier series. 4.2.2 Thermal motion, displacement parameters4.2.3 Intensity symmetry, asymmetric unit; 4.2.4 Systematic extinctions; 4.2.5 Quasicrystals; 4.3 Space group determination; 4.3.1 General considerations, practical aspects; 4.3.2 Space groups of KAMTRA and SUCROS from film exposures; 5 Diffractometer measurements; 5.1 Point detector data collection on a four-circle diffractometer; 5.1.1 Eulerian cradle geometry; 5.1.2 Choice of experimental conditions; 5.1.3 Precise determination of lattice constants; 5.1.4 Intensity measurements; 5.2 Area detector diffractometers; 5.2.1 Imaging plates. 5.2.2 CCD diffractometers5.2.3 Data processing for area detector measurements; 5.2.4 Data collections for B12 and C60F18; 6 Computer programs; 7 Solution of the phase problem; 7.1 Data reduction; 7.2 Fourier methods; 7.2.1 Interpretation of the Patterson function; 7.2.2 Heavy atom methods, principle of difference electron density; 7.2.3 Harker sections, applications to KAMTRA; 7.2.4 Numerical calculation of Fourier syntheses; 7.3 Direct methods; 7.3.1 Normalization; 7.3.2 Fundamental formulae; 7.3.3 Origin definition, choice of starting set. 7.3.4 Application of direct methods, the examples of SUCROS and C60F187.4 Phase determination for macromolecules; 8 Refinements; 8.1 Theoretical aspects; 8.1.1 Model versus experiment, R-value; 8.1.2 Theory of least-squares refinement; 8.2 Practicing least-squares methods; 8.2.1 Aspects of numerical calculations; 8.2.2 Execution of a complete refinement process; 8.2.3 Corrections to be applied during refinement; 8.3 Analysis and representation of results; 8.3.1 Geometrical data; 8.3.2 Graphical representations; 8.3.3 Archiving data, crystallographic information file (CIF). X-ray crystallography. http://id.loc.gov/authorities/subjects/sh85148730 Crystallography, X-Ray https://id.nlm.nih.gov/mesh/D018360 Radiocristallographie. SCIENCE Physics Crystallography. bisacsh X-ray crystallography fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh85148730 https://id.nlm.nih.gov/mesh/D018360 |
| title | Modern X-ray analysis on single crystals : a practical guide / |
| title_auth | Modern X-ray analysis on single crystals : a practical guide / |
| title_exact_search | Modern X-ray analysis on single crystals : a practical guide / |
| title_full | Modern X-ray analysis on single crystals : a practical guide / by Peter Luger. |
| title_fullStr | Modern X-ray analysis on single crystals : a practical guide / by Peter Luger. |
| title_full_unstemmed | Modern X-ray analysis on single crystals : a practical guide / by Peter Luger. |
| title_short | Modern X-ray analysis on single crystals : |
| title_sort | modern x ray analysis on single crystals a practical guide |
| title_sub | a practical guide / |
| topic | X-ray crystallography. http://id.loc.gov/authorities/subjects/sh85148730 Crystallography, X-Ray https://id.nlm.nih.gov/mesh/D018360 Radiocristallographie. SCIENCE Physics Crystallography. bisacsh X-ray crystallography fast |
| topic_facet | X-ray crystallography. Crystallography, X-Ray Radiocristallographie. SCIENCE Physics Crystallography. X-ray crystallography Electronic book. |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=754098 |
| work_keys_str_mv | AT lugerpeter modernxrayanalysisonsinglecrystalsapracticalguide |