Advanced measurement and test :: selected, peer reviewed papers from the 2011 International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China /

This second collection on ""Advanced Measurement and Test II"" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, sys...

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Körperschaft: International Conference on Advanced Measurement and Test Nanchang, China
Weitere Verfasser: Esa, Riza, Wu, Yanwen
Format: Elektronisch Tagungsbericht E-Book
Sprache:English
Veröffentlicht: Durnten-Zurich, Switzerland ; Enfield, NH : Trans Tech Publication, ©2011.
Schriftenreihe:Advanced materials research ; v. 301-303.
Schlagworte:
Online-Zugang:Volltext
Zusammenfassung:This second collection on ""Advanced Measurement and Test II"" is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics. Review from Book News Inc.: Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testin.
Beschreibung:1 online resource (2 volumes) : illustrations
Bibliographie:Includes bibliographical references and index.
ISBN:9783038136279
3038136271

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