Handbook of instrumentation and techniques for semiconductor nanostructure characterization /:
"As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramat...
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Schriftenreihe: | World Scientific series in materials and energy ;
v. 1-2. |
| Schlagworte: | |
| Online-Zugang: | DE-862 DE-863 |
| Zusammenfassung: | "As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures."--Provided by publisher. |
| Beschreibung: | 1 online resource (2 volumes (xxiv, 610 pages) :) |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 9789814322843 9814322849 9781299672215 1299672213 |
Internformat
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| 245 | 0 | 0 | |a Handbook of instrumentation and techniques for semiconductor nanostructure characterization / |c editors, Richard Haight, Frances M. Ross, James B. Hannon ; with foreword by Leonard C. Feldman. |
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| 520 | |a "As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures."--Provided by publisher. | ||
| 505 | 0 | |a Volume 1: Electron Microscopies. Characterization of Semiconductor Nanostructures by Scanning Electron Microscopy / Lynne M. Gignac and Oliver C. Wells -- Transmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures / Suneel Kodambaka and Frances M. Ross -- Aberration Corrected Electron Microscopy / Philip E. Batson -- Low-Energy Electron Microscopy for Nanoscale Characterization / James B. Hannon and Rudolf M. Tromp -- Ultrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces / Hrvoje Petek and Atsushi Kubo -- X-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems / Angelo Malachias [and 5 others] -- Stress Determination in Semiconductor Nanostructures Using X-Ray Diffraction / Conal E. Murry and I. Cevdet Noyan. | |
| 505 | 0 | |a Volume 2: Scanning Probes. An Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials / Rachel Oliver -- STM of Self Assembled III-V Nanostructures / Vaishno D. Dasika and Rachel S. Goldman -- Atom and Optical Probes. Atom Probe Tomography for Microelectronics / David J. Larson [and 5 others] -- Raman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices / Marcus Freitag and James C. Tsang -- Single Nanowire Photoelectron Spectroscopy / Carlos Aguilar and Richard Haight -- Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures / Scott T. Huxtable. | |
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| 700 | 1 | |a Hannon, James B., |e editor. |0 http://id.loc.gov/authorities/names/no2012034159 | |
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| _version_ | 1826941684525563904 |
| adam_text | |
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| author2 | Haight, Richard Ross, Frances M., 1964- Hannon, James B. |
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| contents | Volume 1: Electron Microscopies. Characterization of Semiconductor Nanostructures by Scanning Electron Microscopy / Lynne M. Gignac and Oliver C. Wells -- Transmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures / Suneel Kodambaka and Frances M. Ross -- Aberration Corrected Electron Microscopy / Philip E. Batson -- Low-Energy Electron Microscopy for Nanoscale Characterization / James B. Hannon and Rudolf M. Tromp -- Ultrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces / Hrvoje Petek and Atsushi Kubo -- X-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems / Angelo Malachias [and 5 others] -- Stress Determination in Semiconductor Nanostructures Using X-Ray Diffraction / Conal E. Murry and I. Cevdet Noyan. Volume 2: Scanning Probes. An Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials / Rachel Oliver -- STM of Self Assembled III-V Nanostructures / Vaishno D. Dasika and Rachel S. Goldman -- Atom and Optical Probes. Atom Probe Tomography for Microelectronics / David J. Larson [and 5 others] -- Raman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices / Marcus Freitag and James C. Tsang -- Single Nanowire Photoelectron Spectroscopy / Carlos Aguilar and Richard Haight -- Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures / Scott T. Huxtable. |
| ctrlnum | (OCoLC)794555533 |
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| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.115 |
| dewey-search | 620.115 |
| dewey-sort | 3620.115 |
| dewey-tens | 620 - Engineering and allied operations |
| format | Electronic eBook |
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| id | ZDB-4-EBA-ocn794555533 |
| illustrated | Illustrated |
| indexdate | 2025-03-18T14:16:02Z |
| institution | BVB |
| isbn | 9789814322843 9814322849 9781299672215 1299672213 |
| language | English |
| oclc_num | 794555533 |
| open_access_boolean | |
| owner | MAIN DE-862 DE-BY-FWS DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-862 DE-BY-FWS DE-863 DE-BY-FWS |
| physical | 1 online resource (2 volumes (xxiv, 610 pages) :) |
| psigel | ZDB-4-EBA FWS_PDA_EBA ZDB-4-EBA |
| publishDateSearch | 2012 |
| publishDateSort | 2012 |
| record_format | marc |
| series | World Scientific series in materials and energy ; |
| series2 | World Scientific series in materials and energy ; |
| spelling | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon ; with foreword by Leonard C. Feldman. 1 online resource (2 volumes (xxiv, 610 pages) :) text txt rdacontent computer c rdamedia online resource cr rdacarrier World Scientific series in materials and energy ; v. 1-2 Includes bibliographical references and index. Online resource; title from e-book title screen (World Scientific platform, viewed January 17, 2017). "As we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures."--Provided by publisher. Volume 1: Electron Microscopies. Characterization of Semiconductor Nanostructures by Scanning Electron Microscopy / Lynne M. Gignac and Oliver C. Wells -- Transmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures / Suneel Kodambaka and Frances M. Ross -- Aberration Corrected Electron Microscopy / Philip E. Batson -- Low-Energy Electron Microscopy for Nanoscale Characterization / James B. Hannon and Rudolf M. Tromp -- Ultrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces / Hrvoje Petek and Atsushi Kubo -- X-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems / Angelo Malachias [and 5 others] -- Stress Determination in Semiconductor Nanostructures Using X-Ray Diffraction / Conal E. Murry and I. Cevdet Noyan. Volume 2: Scanning Probes. An Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials / Rachel Oliver -- STM of Self Assembled III-V Nanostructures / Vaishno D. Dasika and Rachel S. Goldman -- Atom and Optical Probes. Atom Probe Tomography for Microelectronics / David J. Larson [and 5 others] -- Raman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices / Marcus Freitag and James C. Tsang -- Single Nanowire Photoelectron Spectroscopy / Carlos Aguilar and Richard Haight -- Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures / Scott T. Huxtable. Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Nanotechnology. http://id.loc.gov/authorities/subjects/sh91001490 Nanostructures https://id.nlm.nih.gov/mesh/D049329 Nanotechnology https://id.nlm.nih.gov/mesh/D036103 Nanomatériaux. Nanotechnologie. TECHNOLOGY & ENGINEERING Material Science. bisacsh Nanostructured materials fast Nanotechnology fast Haight, Richard, editor. http://id.loc.gov/authorities/names/no2012034154 Ross, Frances M., 1964- editor. https://id.oclc.org/worldcat/entity/E39PBJdCmFHfJQkQqQbWfKwQv3 http://id.loc.gov/authorities/names/no2012034156 Hannon, James B., editor. http://id.loc.gov/authorities/names/no2012034159 Feldman, Leonard C., writer of foreword. http://id.loc.gov/authorities/names/n82064449 Print version: Handbook of instrumentation and techniques for semiconductor nanostructure characterization. Singapore ; Hackensack, NJ : World Scientific, ©2012 9789814322805 9789814322812 9789814322829 (DLC) 2012472659 (OCoLC)793201975 World Scientific series in materials and energy ; v. 1-2. http://id.loc.gov/authorities/names/no2012034164 |
| spellingShingle | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / World Scientific series in materials and energy ; Volume 1: Electron Microscopies. Characterization of Semiconductor Nanostructures by Scanning Electron Microscopy / Lynne M. Gignac and Oliver C. Wells -- Transmission Electron Microscopy and Ultra-high Vacuum Transmission Electron Microscopy of Semiconductor Nanostructures / Suneel Kodambaka and Frances M. Ross -- Aberration Corrected Electron Microscopy / Philip E. Batson -- Low-Energy Electron Microscopy for Nanoscale Characterization / James B. Hannon and Rudolf M. Tromp -- Ultrafast Microscopy of Plasmon Dynamics in Nanostructured Metal Surfaces / Hrvoje Petek and Atsushi Kubo -- X-Ray Diffraction Methods for Studying Strain and Composition in Epitaxial Nanostructured Systems / Angelo Malachias [and 5 others] -- Stress Determination in Semiconductor Nanostructures Using X-Ray Diffraction / Conal E. Murry and I. Cevdet Noyan. Volume 2: Scanning Probes. An Introduction to Scanning Probe Microscopy of Semiconductors with Case Studies Concerning Gallium Nitride and Related Materials / Rachel Oliver -- STM of Self Assembled III-V Nanostructures / Vaishno D. Dasika and Rachel S. Goldman -- Atom and Optical Probes. Atom Probe Tomography for Microelectronics / David J. Larson [and 5 others] -- Raman Spectroscopy of Carbon Nanotubes and Graphene Materials and Devices / Marcus Freitag and James C. Tsang -- Single Nanowire Photoelectron Spectroscopy / Carlos Aguilar and Richard Haight -- Time-Domain Thermoreflectance Measurements for Thermal Property Characterization of Nanostructures / Scott T. Huxtable. Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Nanotechnology. http://id.loc.gov/authorities/subjects/sh91001490 Nanostructures https://id.nlm.nih.gov/mesh/D049329 Nanotechnology https://id.nlm.nih.gov/mesh/D036103 Nanomatériaux. Nanotechnologie. TECHNOLOGY & ENGINEERING Material Science. bisacsh Nanostructured materials fast Nanotechnology fast |
| subject_GND | http://id.loc.gov/authorities/subjects/sh93000864 http://id.loc.gov/authorities/subjects/sh91001490 https://id.nlm.nih.gov/mesh/D049329 https://id.nlm.nih.gov/mesh/D036103 |
| title | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / |
| title_auth | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / |
| title_exact_search | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / |
| title_full | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon ; with foreword by Leonard C. Feldman. |
| title_fullStr | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon ; with foreword by Leonard C. Feldman. |
| title_full_unstemmed | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / editors, Richard Haight, Frances M. Ross, James B. Hannon ; with foreword by Leonard C. Feldman. |
| title_short | Handbook of instrumentation and techniques for semiconductor nanostructure characterization / |
| title_sort | handbook of instrumentation and techniques for semiconductor nanostructure characterization |
| topic | Nanostructured materials. http://id.loc.gov/authorities/subjects/sh93000864 Nanotechnology. http://id.loc.gov/authorities/subjects/sh91001490 Nanostructures https://id.nlm.nih.gov/mesh/D049329 Nanotechnology https://id.nlm.nih.gov/mesh/D036103 Nanomatériaux. Nanotechnologie. TECHNOLOGY & ENGINEERING Material Science. bisacsh Nanostructured materials fast Nanotechnology fast |
| topic_facet | Nanostructured materials. Nanotechnology. Nanostructures Nanotechnology Nanomatériaux. Nanotechnologie. TECHNOLOGY & ENGINEERING Material Science. Nanostructured materials |
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