Monte Carlo modeling for electron microscopy and microanalysis /:

1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and I...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Joy, David C., 1943-
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: New York : Oxford University Press, 1995.
Schriftenreihe:Oxford series in optical and imaging sciences ; 9.
Schlagworte:
Online-Zugang:Volltext
Zusammenfassung:1. Preface. 2. An Introduction to Monte Carlo Methods. 3. Constructing a Simulation. 4. The Single Scattering Model. 5. The Plural Scattering Model. 6. Practical Applications of Monte Carlo Models. 7. Backscattered Electrons. 8. Charge Collection and Cathodoluminescence. 9. Secondary Electrons and Imaging. 10. X-Ray Production and Micro-Analysis. 11. What Next in Monte Carlo Simulations?
Beschreibung:1 online resource (viii, 216 pages :)
Bibliographie:Includes bibliographical references and index.
ISBN:9780195358469
0195358465

Es ist kein Print-Exemplar vorhanden.

Fernleihe Bestellen Achtung: Nicht im THWS-Bestand! Volltext öffnen