Characterization of high Tc materials and devices by electron microscopy /:
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron micros...
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge ; New York :
Cambridge University Press,
2000.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. |
| Beschreibung: | 1 online resource (xii, 391 pages) : illustrations |
| Bibliographie: | Includes bibliographical references. |
| ISBN: | 0511039662 9780511039669 9780511534829 0511534825 9780511038150 0511038151 9786610417018 6610417016 1107113016 9781107113015 1280417013 9781280417016 0511175078 9780511175077 0511155174 9780511155178 0511328664 9780511328664 9780521031707 0521031702 |
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| 245 | 0 | 0 | |a Characterization of high Tc materials and devices by electron microscopy / |c edited by Nigel D. Browning, Stephen J. Pennycook. |
| 260 | |a Cambridge ; |a New York : |b Cambridge University Press, |c 2000. | ||
| 300 | |a 1 online resource (xii, 391 pages) : |b illustrations | ||
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| 504 | |a Includes bibliographical references. | ||
| 505 | 0 | |a Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors. | |
| 520 | |a This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. | ||
| 588 | 0 | |a Print version record. | |
| 546 | |a English. | ||
| 650 | 0 | |a High temperature superconductors. |0 http://id.loc.gov/authorities/subjects/sh88004641 | |
| 650 | 0 | |a Electron microscopy |x Technique. |0 http://id.loc.gov/authorities/subjects/sh85042222 | |
| 650 | 6 | |a Supraconducteurs à hautes températures. | |
| 650 | 6 | |a Microscopie électronique |x Technique. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Superconductors & Superconductivity. |2 bisacsh | |
| 650 | 7 | |a Electron microscopy |x Technique |2 fast | |
| 650 | 7 | |a High temperature superconductors |2 fast | |
| 650 | 7 | |a Elektronenmikroskopie |2 gnd |0 http://d-nb.info/gnd/4014327-2 | |
| 650 | 7 | |a Hochtemperatursupraleiter |2 gnd |0 http://d-nb.info/gnd/4220922-5 | |
| 700 | 1 | |a Browning, Nigel D. | |
| 700 | 1 | |a Pennycook, Stephen J. | |
| 758 | |i has work: |a Characterization of high Tc materials and devices by electron microscopy (Text) |1 https://id.oclc.org/worldcat/entity/E39PCYXtT3PG3M6G6RrPFGpbgq |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |t Characterization of high Tc materials and devices by electron microscopy. |d Cambridge ; New York : Cambridge University Press, 2000 |w (DLC) 99018754 |
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Datensatz im Suchindex
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| contents | Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors. |
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| id | ZDB-4-EBA-ocn228069387 |
| illustrated | Illustrated |
| indexdate | 2024-11-27T13:16:20Z |
| institution | BVB |
| isbn | 0511039662 9780511039669 9780511534829 0511534825 9780511038150 0511038151 9786610417018 6610417016 1107113016 9781107113015 1280417013 9781280417016 0511175078 9780511175077 0511155174 9780511155178 0511328664 9780511328664 9780521031707 0521031702 |
| language | English |
| oclc_num | 228069387 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (xii, 391 pages) : illustrations |
| psigel | ZDB-4-EBA |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Cambridge University Press, |
| record_format | marc |
| spelling | Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook. Cambridge ; New York : Cambridge University Press, 2000. 1 online resource (xii, 391 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier data file Bibliography Includes bibliographical references. Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors. This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Print version record. English. High temperature superconductors. http://id.loc.gov/authorities/subjects/sh88004641 Electron microscopy Technique. http://id.loc.gov/authorities/subjects/sh85042222 Supraconducteurs à hautes températures. Microscopie électronique Technique. TECHNOLOGY & ENGINEERING Superconductors & Superconductivity. bisacsh Electron microscopy Technique fast High temperature superconductors fast Elektronenmikroskopie gnd http://d-nb.info/gnd/4014327-2 Hochtemperatursupraleiter gnd http://d-nb.info/gnd/4220922-5 Browning, Nigel D. Pennycook, Stephen J. has work: Characterization of high Tc materials and devices by electron microscopy (Text) https://id.oclc.org/worldcat/entity/E39PCYXtT3PG3M6G6RrPFGpbgq https://id.oclc.org/worldcat/ontology/hasWork Print version: Characterization of high Tc materials and devices by electron microscopy. Cambridge ; New York : Cambridge University Press, 2000 (DLC) 99018754 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=112386 Volltext |
| spellingShingle | Characterization of high Tc materials and devices by electron microscopy / Cover; Half-title; Title; Copyright; Contents; Contributors; Preface; 1 High-resolution transmission electron microscopy; 2 Holography in the transmission electron microscope; 3 Microanalysis by scanning transmission electron microscopy; 4 Specimen preparation for transmission electron microscopy; 5 Low-temperature scanning electron microscopy; 6 Scanning tunneling microscopy; 7 Identification of new superconducting compounds by electron microscopy; 8 Valence band electron energy loss spectroscopy (EELS) of oxide superconductors. High temperature superconductors. http://id.loc.gov/authorities/subjects/sh88004641 Electron microscopy Technique. http://id.loc.gov/authorities/subjects/sh85042222 Supraconducteurs à hautes températures. Microscopie électronique Technique. TECHNOLOGY & ENGINEERING Superconductors & Superconductivity. bisacsh Electron microscopy Technique fast High temperature superconductors fast Elektronenmikroskopie gnd http://d-nb.info/gnd/4014327-2 Hochtemperatursupraleiter gnd http://d-nb.info/gnd/4220922-5 |
| subject_GND | http://id.loc.gov/authorities/subjects/sh88004641 http://id.loc.gov/authorities/subjects/sh85042222 http://d-nb.info/gnd/4014327-2 http://d-nb.info/gnd/4220922-5 |
| title | Characterization of high Tc materials and devices by electron microscopy / |
| title_auth | Characterization of high Tc materials and devices by electron microscopy / |
| title_exact_search | Characterization of high Tc materials and devices by electron microscopy / |
| title_full | Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook. |
| title_fullStr | Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook. |
| title_full_unstemmed | Characterization of high Tc materials and devices by electron microscopy / edited by Nigel D. Browning, Stephen J. Pennycook. |
| title_short | Characterization of high Tc materials and devices by electron microscopy / |
| title_sort | characterization of high tc materials and devices by electron microscopy |
| topic | High temperature superconductors. http://id.loc.gov/authorities/subjects/sh88004641 Electron microscopy Technique. http://id.loc.gov/authorities/subjects/sh85042222 Supraconducteurs à hautes températures. Microscopie électronique Technique. TECHNOLOGY & ENGINEERING Superconductors & Superconductivity. bisacsh Electron microscopy Technique fast High temperature superconductors fast Elektronenmikroskopie gnd http://d-nb.info/gnd/4014327-2 Hochtemperatursupraleiter gnd http://d-nb.info/gnd/4220922-5 |
| topic_facet | High temperature superconductors. Electron microscopy Technique. Supraconducteurs à hautes températures. Microscopie électronique Technique. TECHNOLOGY & ENGINEERING Superconductors & Superconductivity. Electron microscopy Technique High temperature superconductors Elektronenmikroskopie Hochtemperatursupraleiter |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=112386 |
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