Thin film materials :: stress, defect formation, and surface evolution /
"Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin fil...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge, UK ; New York :
Cambridge University Press,
2003.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket |
| Beschreibung: | 1 online resource (xviii, 750 pages) : illustrations |
| Bibliographie: | Includes bibliographical references (pages 713-737) and index. |
| ISBN: | 051116372X 9780511163722 0521822815 9780521822817 051116565X 9780511165658 0511164521 9780511164521 0511184123 9780511184123 9780511754715 051175471X 1280437669 9781280437663 |
Internformat
MARC
| LEADER | 00000cam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | ZDB-4-EBA-ocm80244620 | ||
| 003 | OCoLC | ||
| 005 | 20241004212047.0 | ||
| 006 | m o d | ||
| 007 | cr cn||||||||| | ||
| 008 | 030226s2003 enka ob 001 0 eng d | ||
| 010 | |a 2003043937 | ||
| 040 | |a REDDC |b eng |e pn |c REDDC |d YDXCP |d OCLCG |d OCLCQ |d N$T |d AU@ |d OCLCQ |d DKDLA |d MERUC |d CCO |d E7B |d IDEBK |d OCLCQ |d OCLCO |d OCLCQ |d CUS |d OCLCQ |d OSU |d OCLCF |d OCLCQ |d OTZ |d CNNAI |d DEBSZ |d OCLCQ |d AZK |d AGLDB |d MOR |d PIFBR |d ZCU |d OCLCQ |d U3W |d UAB |d STF |d WRM |d OCLCQ |d VTS |d NRAMU |d ICG |d INT |d VT2 |d OCLCQ |d WYU |d JBG |d YDX |d TKN |d OCLCO |d OCLCQ |d DKC |d OCLCA |d OCLCQ |d M8D |d OCLCQ |d K6U |d UKCRE |d UKAHL |d OCLCO |d OCLCQ |d VI# |d OCLCO |d OCLCL |d SFB | ||
| 019 | |a 69404951 |a 144521733 |a 171138180 |a 271786772 |a 437163515 |a 466455411 |a 488493928 |a 560083644 |a 647484425 |a 814393951 |a 819634453 |a 858423699 |a 888469437 |a 961510354 |a 962708423 |a 988508314 |a 992036912 |a 1035673971 |a 1037744680 |a 1038646597 |a 1045550438 |a 1055400464 |a 1062904150 |a 1078894102 |a 1079898241 |a 1080216928 |a 1153499156 |a 1228544067 | ||
| 020 | |a 051116372X | ||
| 020 | |a 9780511163722 | ||
| 020 | |a 0521822815 | ||
| 020 | |a 9780521822817 | ||
| 020 | |a 051116565X |q (electronic bk.) | ||
| 020 | |a 9780511165658 |q (electronic bk.) | ||
| 020 | |a 0511164521 | ||
| 020 | |a 9780511164521 | ||
| 020 | |a 0511184123 |q (electronic bk.) | ||
| 020 | |a 9780511184123 |q (electronic bk.) | ||
| 020 | |a 9780511754715 |q (ebk.) | ||
| 020 | |a 051175471X |q (ebk.) | ||
| 020 | |a 1280437669 | ||
| 020 | |a 9781280437663 | ||
| 035 | |a (OCoLC)80244620 |z (OCoLC)69404951 |z (OCoLC)144521733 |z (OCoLC)171138180 |z (OCoLC)271786772 |z (OCoLC)437163515 |z (OCoLC)466455411 |z (OCoLC)488493928 |z (OCoLC)560083644 |z (OCoLC)647484425 |z (OCoLC)814393951 |z (OCoLC)819634453 |z (OCoLC)858423699 |z (OCoLC)888469437 |z (OCoLC)961510354 |z (OCoLC)962708423 |z (OCoLC)988508314 |z (OCoLC)992036912 |z (OCoLC)1035673971 |z (OCoLC)1037744680 |z (OCoLC)1038646597 |z (OCoLC)1045550438 |z (OCoLC)1055400464 |z (OCoLC)1062904150 |z (OCoLC)1078894102 |z (OCoLC)1079898241 |z (OCoLC)1080216928 |z (OCoLC)1153499156 |z (OCoLC)1228544067 | ||
| 050 | 4 | |a TA418.9.T45 |b F74 2003eb | |
| 072 | 7 | |a TEC |x 008100 |2 bisacsh | |
| 072 | 7 | |a TEC |x 008090 |2 bisacsh | |
| 072 | 7 | |a TGM |2 bicssc | |
| 082 | 7 | |a 621.3815/2 |2 21 | |
| 084 | |a 33.68 |2 bcl | ||
| 084 | |a UP 7500 |2 rvk | ||
| 084 | |a UP 7550 |2 rvk | ||
| 084 | |a WER 070f |2 stub | ||
| 049 | |a MAIN | ||
| 100 | 1 | |a Freund, L. B. |0 http://id.loc.gov/authorities/names/n86000676 | |
| 245 | 1 | 0 | |a Thin film materials : |b stress, defect formation, and surface evolution / |c L.B. Freund, S. Suresh. |
| 260 | |a Cambridge, UK ; |a New York : |b Cambridge University Press, |c 2003. | ||
| 300 | |a 1 online resource (xviii, 750 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 340 | |g polychrome |2 rdacc | ||
| 340 | |p illustration |2 rdaill | ||
| 347 | |a text file |2 rdaft | ||
| 504 | |a Includes bibliographical references (pages 713-737) and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | 0 | |g 1. |t Introduction and Overview -- |g 2. |t Film stress and substrate curvature -- |g 3. |t Stress in anisotropic and patterned films -- |g 4. |t Delamination and fracture -- |g 5. |t Film buckling, bulging and peeling -- |g 6. |t Dislocation formation in epitaxial systems -- |g 7. |t Dislocation interactions and strain relaxation -- |g 8. |t Equilibrium and stability of surfaces -- |g 9. |t The role of stress in mass transport. |
| 520 | 1 | |a "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate | |
| 520 | 8 | |a While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket | |
| 650 | 0 | |a Thin films. |0 http://id.loc.gov/authorities/subjects/sh85134864 | |
| 650 | 0 | |a Surfaces (Technology) |0 http://id.loc.gov/authorities/subjects/sh85130750 | |
| 650 | 6 | |a Couches minces. | |
| 650 | 6 | |a Surfaces (Technologie) | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Solid State. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Semiconductors. |2 bisacsh | |
| 650 | 7 | |a Surfaces (Technology) |2 fast | |
| 650 | 7 | |a Thin films |2 fast | |
| 650 | 7 | |a Dünne Schicht |2 gnd |0 http://d-nb.info/gnd/4136925-7 | |
| 650 | 7 | |a Werkstoffkunde |2 gnd | |
| 655 | 0 | |a Electronic books. | |
| 655 | 4 | |a Electronic books. | |
| 700 | 1 | |a Suresh, S. |q (Subra) |1 https://id.oclc.org/worldcat/entity/E39PBJbMcWYVvwHhPRWQDGrXh3 |0 http://id.loc.gov/authorities/names/n84136804 | |
| 758 | |i has work: |a Thin film materials (Text) |1 https://id.oclc.org/worldcat/entity/E39PCGCPv9fCXwJBmTJggp8JMq |4 https://id.oclc.org/worldcat/ontology/hasWork | ||
| 776 | 0 | 8 | |i Print version: |a Freund, L.B. |t Thin film materials. |d Cambridge [England] ; New York : Cambridge University Press, 2003 |z 0521822815 |w (DLC) 2003043937 |w (OCoLC)51817229 |
| 856 | 4 | 0 | |l FWS01 |p ZDB-4-EBA |q FWS_PDA_EBA |u https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=152232 |3 Volltext |
| 938 | |a Askews and Holts Library Services |b ASKH |n AH13431552 | ||
| 938 | |a ebrary |b EBRY |n ebr10120453 | ||
| 938 | |a EBSCOhost |b EBSC |n 152232 | ||
| 938 | |a ProQuest MyiLibrary Digital eBook Collection |b IDEB |n 43766 | ||
| 938 | |a YBP Library Services |b YANK |n 2591749 | ||
| 938 | |a YBP Library Services |b YANK |n 2431504 | ||
| 938 | |a YBP Library Services |b YANK |n 2619178 | ||
| 938 | |a YBP Library Services |b YANK |n 3583756 | ||
| 994 | |a 92 |b GEBAY | ||
| 912 | |a ZDB-4-EBA | ||
| 049 | |a DE-863 | ||
Datensatz im Suchindex
| DE-BY-FWS_katkey | ZDB-4-EBA-ocm80244620 |
|---|---|
| _version_ | 1816881644767805440 |
| adam_text | |
| any_adam_object | |
| author | Freund, L. B. |
| author2 | Suresh, S. (Subra) |
| author2_role | |
| author2_variant | s s ss |
| author_GND | http://id.loc.gov/authorities/names/n86000676 http://id.loc.gov/authorities/names/n84136804 |
| author_facet | Freund, L. B. Suresh, S. (Subra) |
| author_role | |
| author_sort | Freund, L. B. |
| author_variant | l b f lb lbf |
| building | Verbundindex |
| bvnumber | localFWS |
| callnumber-first | T - Technology |
| callnumber-label | TA418 |
| callnumber-raw | TA418.9.T45 F74 2003eb |
| callnumber-search | TA418.9.T45 F74 2003eb |
| callnumber-sort | TA 3418.9 T45 F74 42003EB |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UP 7500 UP 7550 |
| classification_tum | WER 070f |
| collection | ZDB-4-EBA |
| contents | Introduction and Overview -- Film stress and substrate curvature -- Stress in anisotropic and patterned films -- Delamination and fracture -- Film buckling, bulging and peeling -- Dislocation formation in epitaxial systems -- Dislocation interactions and strain relaxation -- Equilibrium and stability of surfaces -- The role of stress in mass transport. |
| ctrlnum | (OCoLC)80244620 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Werkstoffwissenschaften Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>06142cam a2200913 a 4500</leader><controlfield tag="001">ZDB-4-EBA-ocm80244620 </controlfield><controlfield tag="003">OCoLC</controlfield><controlfield tag="005">20241004212047.0</controlfield><controlfield tag="006">m o d </controlfield><controlfield tag="007">cr cn|||||||||</controlfield><controlfield tag="008">030226s2003 enka ob 001 0 eng d</controlfield><datafield tag="010" ind1=" " ind2=" "><subfield code="a"> 2003043937</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">REDDC</subfield><subfield code="b">eng</subfield><subfield code="e">pn</subfield><subfield code="c">REDDC</subfield><subfield code="d">YDXCP</subfield><subfield code="d">OCLCG</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">N$T</subfield><subfield code="d">AU@</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">DKDLA</subfield><subfield code="d">MERUC</subfield><subfield code="d">CCO</subfield><subfield code="d">E7B</subfield><subfield code="d">IDEBK</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">CUS</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OSU</subfield><subfield code="d">OCLCF</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">OTZ</subfield><subfield code="d">CNNAI</subfield><subfield code="d">DEBSZ</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">AZK</subfield><subfield code="d">AGLDB</subfield><subfield code="d">MOR</subfield><subfield code="d">PIFBR</subfield><subfield code="d">ZCU</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">U3W</subfield><subfield code="d">UAB</subfield><subfield code="d">STF</subfield><subfield code="d">WRM</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">VTS</subfield><subfield code="d">NRAMU</subfield><subfield code="d">ICG</subfield><subfield code="d">INT</subfield><subfield code="d">VT2</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">WYU</subfield><subfield code="d">JBG</subfield><subfield code="d">YDX</subfield><subfield code="d">TKN</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">DKC</subfield><subfield code="d">OCLCA</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">M8D</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">K6U</subfield><subfield code="d">UKCRE</subfield><subfield code="d">UKAHL</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCQ</subfield><subfield code="d">VI#</subfield><subfield code="d">OCLCO</subfield><subfield code="d">OCLCL</subfield><subfield code="d">SFB</subfield></datafield><datafield tag="019" ind1=" " ind2=" "><subfield code="a">69404951</subfield><subfield code="a">144521733</subfield><subfield code="a">171138180</subfield><subfield code="a">271786772</subfield><subfield code="a">437163515</subfield><subfield code="a">466455411</subfield><subfield code="a">488493928</subfield><subfield code="a">560083644</subfield><subfield code="a">647484425</subfield><subfield code="a">814393951</subfield><subfield code="a">819634453</subfield><subfield code="a">858423699</subfield><subfield code="a">888469437</subfield><subfield code="a">961510354</subfield><subfield code="a">962708423</subfield><subfield code="a">988508314</subfield><subfield code="a">992036912</subfield><subfield code="a">1035673971</subfield><subfield code="a">1037744680</subfield><subfield code="a">1038646597</subfield><subfield code="a">1045550438</subfield><subfield code="a">1055400464</subfield><subfield code="a">1062904150</subfield><subfield code="a">1078894102</subfield><subfield code="a">1079898241</subfield><subfield code="a">1080216928</subfield><subfield code="a">1153499156</subfield><subfield code="a">1228544067</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">051116372X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780511163722</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0521822815</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780521822817</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">051116565X</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780511165658</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0511164521</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780511164521</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0511184123</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780511184123</subfield><subfield code="q">(electronic bk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780511754715</subfield><subfield code="q">(ebk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">051175471X</subfield><subfield code="q">(ebk.)</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1280437669</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781280437663</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)80244620</subfield><subfield code="z">(OCoLC)69404951</subfield><subfield code="z">(OCoLC)144521733</subfield><subfield code="z">(OCoLC)171138180</subfield><subfield code="z">(OCoLC)271786772</subfield><subfield code="z">(OCoLC)437163515</subfield><subfield code="z">(OCoLC)466455411</subfield><subfield code="z">(OCoLC)488493928</subfield><subfield code="z">(OCoLC)560083644</subfield><subfield code="z">(OCoLC)647484425</subfield><subfield code="z">(OCoLC)814393951</subfield><subfield code="z">(OCoLC)819634453</subfield><subfield code="z">(OCoLC)858423699</subfield><subfield code="z">(OCoLC)888469437</subfield><subfield code="z">(OCoLC)961510354</subfield><subfield code="z">(OCoLC)962708423</subfield><subfield code="z">(OCoLC)988508314</subfield><subfield code="z">(OCoLC)992036912</subfield><subfield code="z">(OCoLC)1035673971</subfield><subfield code="z">(OCoLC)1037744680</subfield><subfield code="z">(OCoLC)1038646597</subfield><subfield code="z">(OCoLC)1045550438</subfield><subfield code="z">(OCoLC)1055400464</subfield><subfield code="z">(OCoLC)1062904150</subfield><subfield code="z">(OCoLC)1078894102</subfield><subfield code="z">(OCoLC)1079898241</subfield><subfield code="z">(OCoLC)1080216928</subfield><subfield code="z">(OCoLC)1153499156</subfield><subfield code="z">(OCoLC)1228544067</subfield></datafield><datafield tag="050" ind1=" " ind2="4"><subfield code="a">TA418.9.T45</subfield><subfield code="b">F74 2003eb</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">TEC</subfield><subfield code="x">008100</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">TEC</subfield><subfield code="x">008090</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="072" ind1=" " ind2="7"><subfield code="a">TGM</subfield><subfield code="2">bicssc</subfield></datafield><datafield tag="082" ind1="7" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">33.68</subfield><subfield code="2">bcl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7500</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7550</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">WER 070f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">MAIN</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Freund, L. B.</subfield><subfield code="0">http://id.loc.gov/authorities/names/n86000676</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Thin film materials :</subfield><subfield code="b">stress, defect formation, and surface evolution /</subfield><subfield code="c">L.B. Freund, S. Suresh.</subfield></datafield><datafield tag="260" ind1=" " ind2=" "><subfield code="a">Cambridge, UK ;</subfield><subfield code="a">New York :</subfield><subfield code="b">Cambridge University Press,</subfield><subfield code="c">2003.</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (xviii, 750 pages) :</subfield><subfield code="b">illustrations</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">computer</subfield><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">online resource</subfield><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="340" ind1=" " ind2=" "><subfield code="g">polychrome</subfield><subfield code="2">rdacc</subfield></datafield><datafield tag="340" ind1=" " ind2=" "><subfield code="p">illustration</subfield><subfield code="2">rdaill</subfield></datafield><datafield tag="347" ind1=" " ind2=" "><subfield code="a">text file</subfield><subfield code="2">rdaft</subfield></datafield><datafield tag="504" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references (pages 713-737) and index.</subfield></datafield><datafield tag="588" ind1="0" ind2=" "><subfield code="a">Print version record.</subfield></datafield><datafield tag="505" ind1="0" ind2="0"><subfield code="g">1.</subfield><subfield code="t">Introduction and Overview --</subfield><subfield code="g">2.</subfield><subfield code="t">Film stress and substrate curvature --</subfield><subfield code="g">3.</subfield><subfield code="t">Stress in anisotropic and patterned films --</subfield><subfield code="g">4.</subfield><subfield code="t">Delamination and fracture --</subfield><subfield code="g">5.</subfield><subfield code="t">Film buckling, bulging and peeling --</subfield><subfield code="g">6.</subfield><subfield code="t">Dislocation formation in epitaxial systems --</subfield><subfield code="g">7.</subfield><subfield code="t">Dislocation interactions and strain relaxation --</subfield><subfield code="g">8.</subfield><subfield code="t">Equilibrium and stability of surfaces --</subfield><subfield code="g">9.</subfield><subfield code="t">The role of stress in mass transport.</subfield></datafield><datafield tag="520" ind1="1" ind2=" "><subfield code="a">"Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate</subfield></datafield><datafield tag="520" ind1="8" ind2=" "><subfield code="a">While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Thin films.</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh85134864</subfield></datafield><datafield tag="650" ind1=" " ind2="0"><subfield code="a">Surfaces (Technology)</subfield><subfield code="0">http://id.loc.gov/authorities/subjects/sh85130750</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Couches minces.</subfield></datafield><datafield tag="650" ind1=" " ind2="6"><subfield code="a">Surfaces (Technologie)</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING</subfield><subfield code="x">Electronics</subfield><subfield code="x">Solid State.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING</subfield><subfield code="x">Electronics</subfield><subfield code="x">Semiconductors.</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Surfaces (Technology)</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Thin films</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Dünne Schicht</subfield><subfield code="2">gnd</subfield><subfield code="0">http://d-nb.info/gnd/4136925-7</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Werkstoffkunde</subfield><subfield code="2">gnd</subfield></datafield><datafield tag="655" ind1=" " ind2="0"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="655" ind1=" " ind2="4"><subfield code="a">Electronic books.</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Suresh, S.</subfield><subfield code="q">(Subra)</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PBJbMcWYVvwHhPRWQDGrXh3</subfield><subfield code="0">http://id.loc.gov/authorities/names/n84136804</subfield></datafield><datafield tag="758" ind1=" " ind2=" "><subfield code="i">has work:</subfield><subfield code="a">Thin film materials (Text)</subfield><subfield code="1">https://id.oclc.org/worldcat/entity/E39PCGCPv9fCXwJBmTJggp8JMq</subfield><subfield code="4">https://id.oclc.org/worldcat/ontology/hasWork</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Print version:</subfield><subfield code="a">Freund, L.B.</subfield><subfield code="t">Thin film materials.</subfield><subfield code="d">Cambridge [England] ; New York : Cambridge University Press, 2003</subfield><subfield code="z">0521822815</subfield><subfield code="w">(DLC) 2003043937</subfield><subfield code="w">(OCoLC)51817229</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="l">FWS01</subfield><subfield code="p">ZDB-4-EBA</subfield><subfield code="q">FWS_PDA_EBA</subfield><subfield code="u">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=152232</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">Askews and Holts Library Services</subfield><subfield code="b">ASKH</subfield><subfield code="n">AH13431552</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">ebrary</subfield><subfield code="b">EBRY</subfield><subfield code="n">ebr10120453</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">EBSCOhost</subfield><subfield code="b">EBSC</subfield><subfield code="n">152232</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">ProQuest MyiLibrary Digital eBook Collection</subfield><subfield code="b">IDEB</subfield><subfield code="n">43766</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">2591749</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">2431504</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">2619178</subfield></datafield><datafield tag="938" ind1=" " ind2=" "><subfield code="a">YBP Library Services</subfield><subfield code="b">YANK</subfield><subfield code="n">3583756</subfield></datafield><datafield tag="994" ind1=" " ind2=" "><subfield code="a">92</subfield><subfield code="b">GEBAY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-4-EBA</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-863</subfield></datafield></record></collection> |
| genre | Electronic books. |
| genre_facet | Electronic books. |
| id | ZDB-4-EBA-ocm80244620 |
| illustrated | Illustrated |
| indexdate | 2024-11-27T13:16:00Z |
| institution | BVB |
| isbn | 051116372X 9780511163722 0521822815 9780521822817 051116565X 9780511165658 0511164521 9780511164521 0511184123 9780511184123 9780511754715 051175471X 1280437669 9781280437663 |
| language | English |
| lccn | 2003043937 |
| oclc_num | 80244620 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (xviii, 750 pages) : illustrations |
| psigel | ZDB-4-EBA |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Cambridge University Press, |
| record_format | marc |
| spelling | Freund, L. B. http://id.loc.gov/authorities/names/n86000676 Thin film materials : stress, defect formation, and surface evolution / L.B. Freund, S. Suresh. Cambridge, UK ; New York : Cambridge University Press, 2003. 1 online resource (xviii, 750 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier polychrome rdacc illustration rdaill text file rdaft Includes bibliographical references (pages 713-737) and index. Print version record. 1. Introduction and Overview -- 2. Film stress and substrate curvature -- 3. Stress in anisotropic and patterned films -- 4. Delamination and fracture -- 5. Film buckling, bulging and peeling -- 6. Dislocation formation in epitaxial systems -- 7. Dislocation interactions and strain relaxation -- 8. Equilibrium and stability of surfaces -- 9. The role of stress in mass transport. "Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films"--Jacket Thin films. http://id.loc.gov/authorities/subjects/sh85134864 Surfaces (Technology) http://id.loc.gov/authorities/subjects/sh85130750 Couches minces. Surfaces (Technologie) TECHNOLOGY & ENGINEERING Electronics Solid State. bisacsh TECHNOLOGY & ENGINEERING Electronics Semiconductors. bisacsh Surfaces (Technology) fast Thin films fast Dünne Schicht gnd http://d-nb.info/gnd/4136925-7 Werkstoffkunde gnd Electronic books. Suresh, S. (Subra) https://id.oclc.org/worldcat/entity/E39PBJbMcWYVvwHhPRWQDGrXh3 http://id.loc.gov/authorities/names/n84136804 has work: Thin film materials (Text) https://id.oclc.org/worldcat/entity/E39PCGCPv9fCXwJBmTJggp8JMq https://id.oclc.org/worldcat/ontology/hasWork Print version: Freund, L.B. Thin film materials. Cambridge [England] ; New York : Cambridge University Press, 2003 0521822815 (DLC) 2003043937 (OCoLC)51817229 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=152232 Volltext |
| spellingShingle | Freund, L. B. Thin film materials : stress, defect formation, and surface evolution / Introduction and Overview -- Film stress and substrate curvature -- Stress in anisotropic and patterned films -- Delamination and fracture -- Film buckling, bulging and peeling -- Dislocation formation in epitaxial systems -- Dislocation interactions and strain relaxation -- Equilibrium and stability of surfaces -- The role of stress in mass transport. Thin films. http://id.loc.gov/authorities/subjects/sh85134864 Surfaces (Technology) http://id.loc.gov/authorities/subjects/sh85130750 Couches minces. Surfaces (Technologie) TECHNOLOGY & ENGINEERING Electronics Solid State. bisacsh TECHNOLOGY & ENGINEERING Electronics Semiconductors. bisacsh Surfaces (Technology) fast Thin films fast Dünne Schicht gnd http://d-nb.info/gnd/4136925-7 Werkstoffkunde gnd |
| subject_GND | http://id.loc.gov/authorities/subjects/sh85134864 http://id.loc.gov/authorities/subjects/sh85130750 http://d-nb.info/gnd/4136925-7 |
| title | Thin film materials : stress, defect formation, and surface evolution / |
| title_alt | Introduction and Overview -- Film stress and substrate curvature -- Stress in anisotropic and patterned films -- Delamination and fracture -- Film buckling, bulging and peeling -- Dislocation formation in epitaxial systems -- Dislocation interactions and strain relaxation -- Equilibrium and stability of surfaces -- The role of stress in mass transport. |
| title_auth | Thin film materials : stress, defect formation, and surface evolution / |
| title_exact_search | Thin film materials : stress, defect formation, and surface evolution / |
| title_full | Thin film materials : stress, defect formation, and surface evolution / L.B. Freund, S. Suresh. |
| title_fullStr | Thin film materials : stress, defect formation, and surface evolution / L.B. Freund, S. Suresh. |
| title_full_unstemmed | Thin film materials : stress, defect formation, and surface evolution / L.B. Freund, S. Suresh. |
| title_short | Thin film materials : |
| title_sort | thin film materials stress defect formation and surface evolution |
| title_sub | stress, defect formation, and surface evolution / |
| topic | Thin films. http://id.loc.gov/authorities/subjects/sh85134864 Surfaces (Technology) http://id.loc.gov/authorities/subjects/sh85130750 Couches minces. Surfaces (Technologie) TECHNOLOGY & ENGINEERING Electronics Solid State. bisacsh TECHNOLOGY & ENGINEERING Electronics Semiconductors. bisacsh Surfaces (Technology) fast Thin films fast Dünne Schicht gnd http://d-nb.info/gnd/4136925-7 Werkstoffkunde gnd |
| topic_facet | Thin films. Surfaces (Technology) Couches minces. Surfaces (Technologie) TECHNOLOGY & ENGINEERING Electronics Solid State. TECHNOLOGY & ENGINEERING Electronics Semiconductors. Thin films Dünne Schicht Werkstoffkunde Electronic books. |
| url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=152232 |
| work_keys_str_mv | AT freundlb thinfilmmaterialsstressdefectformationandsurfaceevolution AT sureshs thinfilmmaterialsstressdefectformationandsurfaceevolution |