Testing of digital systems /:
The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference.
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cambridge :
Cambridge University Press,
2003.
|
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. |
| Beschreibung: | 1 online resource (xvi, 1000 pages) : illustrations |
| Bibliographie: | Includes bibliographical references and index. |
| ISBN: | 0511077734 9780511077739 0511076169 9780511076169 9780511816321 0511816324 1282387138 9781282387133 1107128935 9781107128934 0511643314 9780511643316 9786612387135 6612387130 0511203810 9780511203817 0511556985 9780511556982 |
Internformat
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| 505 | 0 | 0 | |g 1. |t Introduction / |r Ad van de Goor -- |g 2. |t Fault models -- |g 3. |t Combinational logic and fault simulation -- |g 4. |t Test generation for combinational circuits -- |g 5. |t Sequential ATPG -- |g 6. |t I[subscript DDQ] testing -- |g 7. |t Functional testing -- |g 8. |t Delay fault testing -- |g 9. |t CMOS testing -- |g 10. |t Fault diagnosis -- |g 11. |t Design for testability -- |g 12. |t Built-in-self-test -- |g 13. |t Synthesis for testability -- |g 14. |t Memory testing / |r Ad van de Goor -- |g 15. |t High-level test synthesis -- |g 16. |t System-on-a-chip test synthesis. |
| 520 | |a The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. | ||
| 588 | 0 | |a Print version record. | |
| 546 | |a English. | ||
| 650 | 0 | |a Digital integrated circuits |x Testing. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x Integrated. |2 bisacsh | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Electronics |x Circuits |x General. |2 bisacsh | |
| 650 | 7 | |a Digital integrated circuits |x Testing |2 fast | |
| 650 | 7 | |a Test |2 gnd |0 http://d-nb.info/gnd/4059549-3 | |
| 650 | 7 | |a Digitale integrierte Schaltung |2 gnd |0 http://d-nb.info/gnd/4113313-4 | |
| 655 | 0 | |a Electronic books. | |
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Datensatz im Suchindex
| DE-BY-FWS_katkey | ZDB-4-EBA-ocm57419693 |
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| _version_ | 1816881624009146369 |
| adam_text | |
| any_adam_object | |
| author | Jha, Niraj K. |
| author2 | Gupta, S. (Sandeep), 1962- |
| author2_role | |
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| author_GND | http://id.loc.gov/authorities/names/nb2003052468 |
| author_additional | Ad van de Goor -- |
| author_facet | Jha, Niraj K. Gupta, S. (Sandeep), 1962- |
| author_role | |
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| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874.65 .J43 2003eb |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| collection | ZDB-4-EBA |
| contents | Introduction / Fault models -- Combinational logic and fault simulation -- Test generation for combinational circuits -- Sequential ATPG -- I[subscript DDQ] testing -- Functional testing -- Delay fault testing -- CMOS testing -- Fault diagnosis -- Design for testability -- Built-in-self-test -- Synthesis for testability -- Memory testing / High-level test synthesis -- System-on-a-chip test synthesis. |
| ctrlnum | (OCoLC)57419693 |
| dewey-full | 621.381548 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381548 |
| dewey-search | 621.381548 |
| dewey-sort | 3621.381548 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| genre | Electronic books. |
| genre_facet | Electronic books. |
| id | ZDB-4-EBA-ocm57419693 |
| illustrated | Illustrated |
| indexdate | 2024-11-27T13:15:40Z |
| institution | BVB |
| isbn | 0511077734 9780511077739 0511076169 9780511076169 9780511816321 0511816324 1282387138 9781282387133 1107128935 9781107128934 0511643314 9780511643316 9786612387135 6612387130 0511203810 9780511203817 0511556985 9780511556982 |
| language | English |
| oclc_num | 57419693 |
| open_access_boolean | |
| owner | MAIN DE-863 DE-BY-FWS |
| owner_facet | MAIN DE-863 DE-BY-FWS |
| physical | 1 online resource (xvi, 1000 pages) : illustrations |
| psigel | ZDB-4-EBA |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Cambridge University Press, |
| record_format | marc |
| spelling | Jha, Niraj K. Testing of digital systems / N.K. Jha and S. Gupta. Cambridge : Cambridge University Press, 2003. 1 online resource (xvi, 1000 pages) : illustrations text txt rdacontent computer c rdamedia online resource cr rdacarrier Includes bibliographical references and index. 1. Introduction / Ad van de Goor -- 2. Fault models -- 3. Combinational logic and fault simulation -- 4. Test generation for combinational circuits -- 5. Sequential ATPG -- 6. I[subscript DDQ] testing -- 7. Functional testing -- 8. Delay fault testing -- 9. CMOS testing -- 10. Fault diagnosis -- 11. Design for testability -- 12. Built-in-self-test -- 13. Synthesis for testability -- 14. Memory testing / Ad van de Goor -- 15. High-level test synthesis -- 16. System-on-a-chip test synthesis. The most comprehensive and wide ranging book of its kind, Testing of Digital Systems covers everything you need to know about how to test semiconductor devices and systems. Written for students and engineers, it is both an excellent senior/graduate level textbook and a valuable reference. Print version record. English. Digital integrated circuits Testing. TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. bisacsh TECHNOLOGY & ENGINEERING Electronics Circuits General. bisacsh Digital integrated circuits Testing fast Test gnd http://d-nb.info/gnd/4059549-3 Digitale integrierte Schaltung gnd http://d-nb.info/gnd/4113313-4 Electronic books. Gupta, S. (Sandeep), 1962- https://id.oclc.org/worldcat/entity/E39PCjw7cW96TyBXpwHKrHHjqP http://id.loc.gov/authorities/names/nb2003052468 has work: Testing of digital systems (Text) https://id.oclc.org/worldcat/entity/E39PCFVxkcptVWjPtymfPJGJpd https://id.oclc.org/worldcat/ontology/hasWork Print version: Jha, Niraj K. Testing of digital systems. Cambridge : Cambridge University Press, 2003 0521773563 (OCoLC)48784338 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=125045 Volltext |
| spellingShingle | Jha, Niraj K. Testing of digital systems / Introduction / Fault models -- Combinational logic and fault simulation -- Test generation for combinational circuits -- Sequential ATPG -- I[subscript DDQ] testing -- Functional testing -- Delay fault testing -- CMOS testing -- Fault diagnosis -- Design for testability -- Built-in-self-test -- Synthesis for testability -- Memory testing / High-level test synthesis -- System-on-a-chip test synthesis. Digital integrated circuits Testing. TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. bisacsh TECHNOLOGY & ENGINEERING Electronics Circuits General. bisacsh Digital integrated circuits Testing fast Test gnd http://d-nb.info/gnd/4059549-3 Digitale integrierte Schaltung gnd http://d-nb.info/gnd/4113313-4 |
| subject_GND | http://d-nb.info/gnd/4059549-3 http://d-nb.info/gnd/4113313-4 |
| title | Testing of digital systems / |
| title_alt | Introduction / Fault models -- Combinational logic and fault simulation -- Test generation for combinational circuits -- Sequential ATPG -- I[subscript DDQ] testing -- Functional testing -- Delay fault testing -- CMOS testing -- Fault diagnosis -- Design for testability -- Built-in-self-test -- Synthesis for testability -- Memory testing / High-level test synthesis -- System-on-a-chip test synthesis. |
| title_auth | Testing of digital systems / |
| title_exact_search | Testing of digital systems / |
| title_full | Testing of digital systems / N.K. Jha and S. Gupta. |
| title_fullStr | Testing of digital systems / N.K. Jha and S. Gupta. |
| title_full_unstemmed | Testing of digital systems / N.K. Jha and S. Gupta. |
| title_short | Testing of digital systems / |
| title_sort | testing of digital systems |
| topic | Digital integrated circuits Testing. TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. bisacsh TECHNOLOGY & ENGINEERING Electronics Circuits General. bisacsh Digital integrated circuits Testing fast Test gnd http://d-nb.info/gnd/4059549-3 Digitale integrierte Schaltung gnd http://d-nb.info/gnd/4113313-4 |
| topic_facet | Digital integrated circuits Testing. TECHNOLOGY & ENGINEERING Electronics Circuits Integrated. TECHNOLOGY & ENGINEERING Electronics Circuits General. Digital integrated circuits Testing Test Digitale integrierte Schaltung Electronic books. |
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| work_keys_str_mv | AT jhanirajk testingofdigitalsystems AT guptas testingofdigitalsystems |