Triadic Patent Families Methodology:
Patent indicators - within the science and technology (S&T) context - are used to measure inventive performance, diffusion of knowledge and internationalisation of innovative activities - across countries, firms, industries, technology areas, etc. A common approach is to calculate patent indicat...
Gespeichert in:
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Paris
OECD Publishing
2004
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| Schriftenreihe: | OECD Science, Technology and Industry Working Papers
no.2004/02 |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Zusammenfassung: | Patent indicators - within the science and technology (S&T) context - are used to measure inventive performance, diffusion of knowledge and internationalisation of innovative activities - across countries, firms, industries, technology areas, etc. A common approach is to calculate patent indicators based on information (filings, grants, etc.) from a particular patent office. While the richness and strength of those indicators are broadly recognised, they are affected by "home" advantage bias - where proportionate to their inventive activity, domestic applicants tend to file more patents in their home country compared to foreign applicants. Patents taken in various countries to protect inventions can be linked together to build triadic patent families: a set of patents taken at the European Patent Office (EPO), the Japanese Patent Office (JPO), and the US Patent and Trademark Office (USPTO) that share one or more priorities. Patent families are derived from priority application ... |
| Beschreibung: | 1 Online-Ressource (32 p.) 21 x 29.7cm. |
| DOI: | 10.1787/443844125004 |
Internformat
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| spelling | Dernis, Hélène VerfasserIn aut Triadic Patent Families Methodology Hélène, Dernis and Mosahid, Khan = Méthodologie relative aux familles triadiques de brevets / Hélène, Dernis et Mosahid, Khan Méthodologie relative aux familles triadiques de brevets Paris OECD Publishing 2004 1 Online-Ressource (32 p.) 21 x 29.7cm. Text txt rdacontent Computermedien c rdamedia Online-Ressource cr rdacarrier OECD Science, Technology and Industry Working Papers no.2004/02 Patent indicators - within the science and technology (S&T) context - are used to measure inventive performance, diffusion of knowledge and internationalisation of innovative activities - across countries, firms, industries, technology areas, etc. A common approach is to calculate patent indicators based on information (filings, grants, etc.) from a particular patent office. While the richness and strength of those indicators are broadly recognised, they are affected by "home" advantage bias - where proportionate to their inventive activity, domestic applicants tend to file more patents in their home country compared to foreign applicants. Patents taken in various countries to protect inventions can be linked together to build triadic patent families: a set of patents taken at the European Patent Office (EPO), the Japanese Patent Office (JPO), and the US Patent and Trademark Office (USPTO) that share one or more priorities. Patent families are derived from priority application ... Science and Technology Khan, Mosahid MitwirkendeR ctb FWS01 ZDB-13-SOC FWS_PDA_SOC https://doi.org/10.1787/443844125004 Volltext |
| spellingShingle | Dernis, Hélène Triadic Patent Families Methodology Science and Technology |
| title | Triadic Patent Families Methodology |
| title_alt | Méthodologie relative aux familles triadiques de brevets |
| title_auth | Triadic Patent Families Methodology |
| title_exact_search | Triadic Patent Families Methodology |
| title_full | Triadic Patent Families Methodology Hélène, Dernis and Mosahid, Khan = Méthodologie relative aux familles triadiques de brevets / Hélène, Dernis et Mosahid, Khan |
| title_fullStr | Triadic Patent Families Methodology Hélène, Dernis and Mosahid, Khan = Méthodologie relative aux familles triadiques de brevets / Hélène, Dernis et Mosahid, Khan |
| title_full_unstemmed | Triadic Patent Families Methodology Hélène, Dernis and Mosahid, Khan = Méthodologie relative aux familles triadiques de brevets / Hélène, Dernis et Mosahid, Khan |
| title_short | Triadic Patent Families Methodology |
| title_sort | triadic patent families methodology |
| topic | Science and Technology |
| topic_facet | Science and Technology |
| url | https://doi.org/10.1787/443844125004 |
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