Atomic force microscopy for energy research:
"Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of fu...
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton ; London ; New York
CRC Press, Taylor & Francis Group
2022
|
| Ausgabe: | First edition |
| Schriftenreihe: | Emerging materials and technologies
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Zusammenfassung: | "Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"-- |
| Beschreibung: | Includes bibliographical references and index |
| Beschreibung: | xiii, 441 Seiten Illustrationen, Diagramme |
| ISBN: | 9781032004075 9781032004112 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV050188906 | ||
| 003 | DE-604 | ||
| 007 | t| | ||
| 008 | 250303s2022 xxua||| |||| 00||| eng d | ||
| 020 | |a 9781032004075 |c hbk |9 978-1-03-200407-5 | ||
| 020 | |a 9781032004112 |c pbk |9 978-1-03-200411-2 | ||
| 035 | |a (DE-599)KXP1788050924 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 044 | |a xxu |c XD-US |a xxk |c XA-GB | ||
| 049 | |a DE-703 | ||
| 082 | 0 | |a 620/.5 | |
| 084 | |a 51.30 |2 bkl | ||
| 084 | |a 53.09 |2 bkl | ||
| 245 | 1 | 0 | |a Atomic force microscopy for energy research |c edited by Cai Shen |
| 250 | |a First edition | ||
| 264 | 1 | |a Boca Raton ; London ; New York |b CRC Press, Taylor & Francis Group |c 2022 | |
| 300 | |a xiii, 441 Seiten |b Illustrationen, Diagramme | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Emerging materials and technologies | |
| 500 | |a Includes bibliographical references and index | ||
| 505 | 8 | |a Principles and basic modes of atomic force microscopy / Anyan Cui, Menghan Deng, Yan Ye, Xiang Wang, Zhigao Hu -- Advanced modes of electrostatic and kelvin probe force microscopy for energy applications / Martí Checa, Sabine M. Neumayer, Wan-Yu Tsai, Liam Collins -- Piezoresponse force microscopy and electrochemical strain microscopy / Qibin Zeng, Kaiyang Zeng -- Hybrid AFM technique : atomic force microscopy--scanning electrochemical microscopy / Shuang Cao, Tong Sun -- Scanning microwave impedance microscopy / Yongliang Yang, Nicholas Antoniou, Ravi Chintala -- Atomic force microscopy-based infrared microscopy for chemical nano-imaging and spectroscopy / Xiaoji G. Xu -- Application of AFM in lithium batteries research / Rui Wen, Shuang-Yan Lang, Zhen Zhen Shen, Jing Wan -- Application of AFM in solar cell research / Ahmed Touhami -- Application of AFM for analyzing the microstructure of ferroelectric polymer as an energy material / Dong Guoa, Kai Cai, Jingshu Xu -- Application of AFM in microbial energy systems / Xiaochun Tian -- Practical guidance of AFM operations for energy research / Yang Liu, Xin Guo, Yaolun Liu, Xin Wang, Chen Liu, Wenhui Pang, Fei Peng, Shurui Wang, Youjie Fan and Hao Sun. | |
| 520 | 3 | |a "Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"-- | |
| 650 | 0 | 7 | |a Rasterkraftmikroskop |0 (DE-588)4333578-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Energietechnik |0 (DE-588)4014725-3 |2 gnd |9 rswk-swf |
| 653 | 0 | |a Atomic force microscopy | |
| 653 | 0 | |a Power resources / Research | |
| 655 | 7 | |0 (DE-588)4143413-4 |a Aufsatzsammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Rasterkraftmikroskop |0 (DE-588)4333578-0 |D s |
| 689 | 0 | 1 | |a Energietechnik |0 (DE-588)4014725-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Shen, Cai |0 (DE-588)1163691291 |4 edt | |
| 856 | 4 | 2 | |m B:DE-89 |m V:DE-601 |q pdf/application |u https://www.gbv.de/dms/tib-ub-hannover/1788050924.pdf |v 2023-03-21 |3 Inhaltsverzeichnis |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-035524493 | |
Datensatz im Suchindex
| _version_ | 1825570467750084608 |
|---|---|
| adam_text | |
| any_adam_object | |
| author2 | Shen, Cai |
| author2_role | edt |
| author2_variant | c s cs |
| author_GND | (DE-588)1163691291 |
| author_facet | Shen, Cai |
| building | Verbundindex |
| bvnumber | BV050188906 |
| contents | Principles and basic modes of atomic force microscopy / Anyan Cui, Menghan Deng, Yan Ye, Xiang Wang, Zhigao Hu -- Advanced modes of electrostatic and kelvin probe force microscopy for energy applications / Martí Checa, Sabine M. Neumayer, Wan-Yu Tsai, Liam Collins -- Piezoresponse force microscopy and electrochemical strain microscopy / Qibin Zeng, Kaiyang Zeng -- Hybrid AFM technique : atomic force microscopy--scanning electrochemical microscopy / Shuang Cao, Tong Sun -- Scanning microwave impedance microscopy / Yongliang Yang, Nicholas Antoniou, Ravi Chintala -- Atomic force microscopy-based infrared microscopy for chemical nano-imaging and spectroscopy / Xiaoji G. Xu -- Application of AFM in lithium batteries research / Rui Wen, Shuang-Yan Lang, Zhen Zhen Shen, Jing Wan -- Application of AFM in solar cell research / Ahmed Touhami -- Application of AFM for analyzing the microstructure of ferroelectric polymer as an energy material / Dong Guoa, Kai Cai, Jingshu Xu -- Application of AFM in microbial energy systems / Xiaochun Tian -- Practical guidance of AFM operations for energy research / Yang Liu, Xin Guo, Yaolun Liu, Xin Wang, Chen Liu, Wenhui Pang, Fei Peng, Shurui Wang, Youjie Fan and Hao Sun. |
| ctrlnum | (DE-599)KXP1788050924 |
| dewey-full | 620/.5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620/.5 |
| dewey-search | 620/.5 |
| dewey-sort | 3620 15 |
| dewey-tens | 620 - Engineering and allied operations |
| edition | First edition |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV050188906</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">250303s2022 xxua||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781032004075</subfield><subfield code="c">hbk</subfield><subfield code="9">978-1-03-200407-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781032004112</subfield><subfield code="c">pbk</subfield><subfield code="9">978-1-03-200411-2</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)KXP1788050924</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">xxu</subfield><subfield code="c">XD-US</subfield><subfield code="a">xxk</subfield><subfield code="c">XA-GB</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">620/.5</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">51.30</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.09</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Atomic force microscopy for energy research</subfield><subfield code="c">edited by Cai Shen</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">First edition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boca Raton ; London ; New York</subfield><subfield code="b">CRC Press, Taylor & Francis Group</subfield><subfield code="c">2022</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 441 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Emerging materials and technologies</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Principles and basic modes of atomic force microscopy / Anyan Cui, Menghan Deng, Yan Ye, Xiang Wang, Zhigao Hu -- Advanced modes of electrostatic and kelvin probe force microscopy for energy applications / Martí Checa, Sabine M. Neumayer, Wan-Yu Tsai, Liam Collins -- Piezoresponse force microscopy and electrochemical strain microscopy / Qibin Zeng, Kaiyang Zeng -- Hybrid AFM technique : atomic force microscopy--scanning electrochemical microscopy / Shuang Cao, Tong Sun -- Scanning microwave impedance microscopy / Yongliang Yang, Nicholas Antoniou, Ravi Chintala -- Atomic force microscopy-based infrared microscopy for chemical nano-imaging and spectroscopy / Xiaoji G. Xu -- Application of AFM in lithium batteries research / Rui Wen, Shuang-Yan Lang, Zhen Zhen Shen, Jing Wan -- Application of AFM in solar cell research / Ahmed Touhami -- Application of AFM for analyzing the microstructure of ferroelectric polymer as an energy material / Dong Guoa, Kai Cai, Jingshu Xu -- Application of AFM in microbial energy systems / Xiaochun Tian -- Practical guidance of AFM operations for energy research / Yang Liu, Xin Guo, Yaolun Liu, Xin Wang, Chen Liu, Wenhui Pang, Fei Peng, Shurui Wang, Youjie Fan and Hao Sun.</subfield></datafield><datafield tag="520" ind1="3" ind2=" "><subfield code="a">"Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"--</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskop</subfield><subfield code="0">(DE-588)4333578-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Energietechnik</subfield><subfield code="0">(DE-588)4014725-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Atomic force microscopy</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Power resources / Research</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4143413-4</subfield><subfield code="a">Aufsatzsammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterkraftmikroskop</subfield><subfield code="0">(DE-588)4333578-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Energietechnik</subfield><subfield code="0">(DE-588)4014725-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shen, Cai</subfield><subfield code="0">(DE-588)1163691291</subfield><subfield code="4">edt</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">B:DE-89</subfield><subfield code="m">V:DE-601</subfield><subfield code="q">pdf/application</subfield><subfield code="u">https://www.gbv.de/dms/tib-ub-hannover/1788050924.pdf</subfield><subfield code="v">2023-03-21</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-035524493</subfield></datafield></record></collection> |
| genre | (DE-588)4143413-4 Aufsatzsammlung gnd-content |
| genre_facet | Aufsatzsammlung |
| id | DE-604.BV050188906 |
| illustrated | Illustrated |
| indexdate | 2025-03-03T11:01:07Z |
| institution | BVB |
| isbn | 9781032004075 9781032004112 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-035524493 |
| open_access_boolean | |
| owner | DE-703 |
| owner_facet | DE-703 |
| physical | xiii, 441 Seiten Illustrationen, Diagramme |
| publishDate | 2022 |
| publishDateSearch | 2022 |
| publishDateSort | 2022 |
| publisher | CRC Press, Taylor & Francis Group |
| record_format | marc |
| series2 | Emerging materials and technologies |
| spelling | Atomic force microscopy for energy research edited by Cai Shen First edition Boca Raton ; London ; New York CRC Press, Taylor & Francis Group 2022 xiii, 441 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Emerging materials and technologies Includes bibliographical references and index Principles and basic modes of atomic force microscopy / Anyan Cui, Menghan Deng, Yan Ye, Xiang Wang, Zhigao Hu -- Advanced modes of electrostatic and kelvin probe force microscopy for energy applications / Martí Checa, Sabine M. Neumayer, Wan-Yu Tsai, Liam Collins -- Piezoresponse force microscopy and electrochemical strain microscopy / Qibin Zeng, Kaiyang Zeng -- Hybrid AFM technique : atomic force microscopy--scanning electrochemical microscopy / Shuang Cao, Tong Sun -- Scanning microwave impedance microscopy / Yongliang Yang, Nicholas Antoniou, Ravi Chintala -- Atomic force microscopy-based infrared microscopy for chemical nano-imaging and spectroscopy / Xiaoji G. Xu -- Application of AFM in lithium batteries research / Rui Wen, Shuang-Yan Lang, Zhen Zhen Shen, Jing Wan -- Application of AFM in solar cell research / Ahmed Touhami -- Application of AFM for analyzing the microstructure of ferroelectric polymer as an energy material / Dong Guoa, Kai Cai, Jingshu Xu -- Application of AFM in microbial energy systems / Xiaochun Tian -- Practical guidance of AFM operations for energy research / Yang Liu, Xin Guo, Yaolun Liu, Xin Wang, Chen Liu, Wenhui Pang, Fei Peng, Shurui Wang, Youjie Fan and Hao Sun. "Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"-- Rasterkraftmikroskop (DE-588)4333578-0 gnd rswk-swf Energietechnik (DE-588)4014725-3 gnd rswk-swf Atomic force microscopy Power resources / Research (DE-588)4143413-4 Aufsatzsammlung gnd-content Rasterkraftmikroskop (DE-588)4333578-0 s Energietechnik (DE-588)4014725-3 s DE-604 Shen, Cai (DE-588)1163691291 edt B:DE-89 V:DE-601 pdf/application https://www.gbv.de/dms/tib-ub-hannover/1788050924.pdf 2023-03-21 Inhaltsverzeichnis |
| spellingShingle | Atomic force microscopy for energy research Principles and basic modes of atomic force microscopy / Anyan Cui, Menghan Deng, Yan Ye, Xiang Wang, Zhigao Hu -- Advanced modes of electrostatic and kelvin probe force microscopy for energy applications / Martí Checa, Sabine M. Neumayer, Wan-Yu Tsai, Liam Collins -- Piezoresponse force microscopy and electrochemical strain microscopy / Qibin Zeng, Kaiyang Zeng -- Hybrid AFM technique : atomic force microscopy--scanning electrochemical microscopy / Shuang Cao, Tong Sun -- Scanning microwave impedance microscopy / Yongliang Yang, Nicholas Antoniou, Ravi Chintala -- Atomic force microscopy-based infrared microscopy for chemical nano-imaging and spectroscopy / Xiaoji G. Xu -- Application of AFM in lithium batteries research / Rui Wen, Shuang-Yan Lang, Zhen Zhen Shen, Jing Wan -- Application of AFM in solar cell research / Ahmed Touhami -- Application of AFM for analyzing the microstructure of ferroelectric polymer as an energy material / Dong Guoa, Kai Cai, Jingshu Xu -- Application of AFM in microbial energy systems / Xiaochun Tian -- Practical guidance of AFM operations for energy research / Yang Liu, Xin Guo, Yaolun Liu, Xin Wang, Chen Liu, Wenhui Pang, Fei Peng, Shurui Wang, Youjie Fan and Hao Sun. Rasterkraftmikroskop (DE-588)4333578-0 gnd Energietechnik (DE-588)4014725-3 gnd |
| subject_GND | (DE-588)4333578-0 (DE-588)4014725-3 (DE-588)4143413-4 |
| title | Atomic force microscopy for energy research |
| title_auth | Atomic force microscopy for energy research |
| title_exact_search | Atomic force microscopy for energy research |
| title_full | Atomic force microscopy for energy research edited by Cai Shen |
| title_fullStr | Atomic force microscopy for energy research edited by Cai Shen |
| title_full_unstemmed | Atomic force microscopy for energy research edited by Cai Shen |
| title_short | Atomic force microscopy for energy research |
| title_sort | atomic force microscopy for energy research |
| topic | Rasterkraftmikroskop (DE-588)4333578-0 gnd Energietechnik (DE-588)4014725-3 gnd |
| topic_facet | Rasterkraftmikroskop Energietechnik Aufsatzsammlung |
| url | https://www.gbv.de/dms/tib-ub-hannover/1788050924.pdf |
| work_keys_str_mv | AT shencai atomicforcemicroscopyforenergyresearch |