Introduction to many-facet Rasch measurement:
Saved in:
Bibliographic Details
Main Author: Eckes, Thomas 1953- (Author)
Format: Book
Language:English
Published: Lausanne ; Berlin ; Bruxelles ; Chennai ; New York ; Oxford Peter Lang [2023]
Series:Peter Lang classics
Subjects:
Online Access:Inhaltsverzeichnis
Inhaltstext
https://www.peterlang.com/document/1353657
Physical Description:241 Seiten Illustrationen 22 cm, 387 g
ISBN:3631903049
9783631903049

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection! Indexes
Description