Thermal onboard detection of power semiconductor interconnection faults:
Gespeichert in:
1. Verfasser: | |
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Format: | Abschlussarbeit Buch |
Sprache: | English |
Veröffentlicht: |
Düren
Shaker Verlag
2024
|
Ausgabe: | 1. Auflage |
Schriftenreihe: | Berichte aus der Elektrotechnik
|
Schlagworte: | |
Beschreibung: | X, 147 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 239 g |
ISBN: | 9783844096194 3844096191 |
Internformat
MARC
LEADER | 00000nam a22000008c 4500 | ||
---|---|---|---|
001 | BV049881056 | ||
003 | DE-604 | ||
005 | 20250131 | ||
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015 | |a 24,N33 |2 dnb | ||
016 | 7 | |a 133819786X |2 DE-101 | |
020 | |a 9783844096194 |c : EUR 58.80 (DE), EUR 58.80 (AT), CHF 73.60 (freier Preis) |9 978-3-8440-9619-4 | ||
020 | |a 3844096191 |9 3-8440-9619-1 | ||
024 | 3 | |a 9783844096194 | |
035 | |a (DE-599)DNB133819786X | ||
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041 | 0 | |a eng | |
044 | |a gw |c XA-DE-NW | ||
049 | |a DE-83 | ||
084 | |a ZN 8340 |0 (DE-625)157614: |2 rvk | ||
100 | 1 | |a Jahn, Nils |d 1994- |e Verfasser |0 (DE-588)1341658686 |4 aut | |
245 | 1 | 0 | |a Thermal onboard detection of power semiconductor interconnection faults |c Nils Jahn |
263 | |a 202410 | ||
264 | 1 | |a Düren |b Shaker Verlag |c 2024 | |
300 | |a X, 147 Seiten |b Illustrationen, Diagramme |c 21 cm x 14.8 cm, 239 g | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Berichte aus der Elektrotechnik | |
502 | |b Dissertation |c Technische Universität Dortmund |d 2024 | ||
650 | 0 | 7 | |a Feldeffekttransistor |0 (DE-588)4131472-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Leistungshalbleiter |0 (DE-588)4167286-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a MOS-FET |0 (DE-588)4207266-9 |2 gnd |9 rswk-swf |
653 | |a Power Electronics | ||
653 | |a Condition Monitoring | ||
653 | |a Elektrotechnilk | ||
655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
689 | 0 | 0 | |a MOS-FET |0 (DE-588)4207266-9 |D s |
689 | 0 | 1 | |a Feldeffekttransistor |0 (DE-588)4131472-4 |D s |
689 | 0 | 2 | |a Leistungshalbleiter |0 (DE-588)4167286-0 |D s |
689 | 0 | |5 DE-604 | |
710 | 2 | |a Shaker Verlag |0 (DE-588)1064118135 |4 pbl | |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-035220411 |
Datensatz im Suchindex
_version_ | 1822762102639558656 |
---|---|
adam_text | |
any_adam_object | |
author | Jahn, Nils 1994- |
author_GND | (DE-588)1341658686 |
author_facet | Jahn, Nils 1994- |
author_role | aut |
author_sort | Jahn, Nils 1994- |
author_variant | n j nj |
building | Verbundindex |
bvnumber | BV049881056 |
classification_rvk | ZN 8340 |
ctrlnum | (DE-599)DNB133819786X |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | 1. Auflage |
format | Thesis Book |
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genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV049881056 |
illustrated | Illustrated |
indexdate | 2025-01-31T11:03:22Z |
institution | BVB |
institution_GND | (DE-588)1064118135 |
isbn | 9783844096194 3844096191 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-035220411 |
open_access_boolean | |
owner | DE-83 |
owner_facet | DE-83 |
physical | X, 147 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 239 g |
publishDate | 2024 |
publishDateSearch | 2024 |
publishDateSort | 2024 |
publisher | Shaker Verlag |
record_format | marc |
series2 | Berichte aus der Elektrotechnik |
spelling | Jahn, Nils 1994- Verfasser (DE-588)1341658686 aut Thermal onboard detection of power semiconductor interconnection faults Nils Jahn 202410 Düren Shaker Verlag 2024 X, 147 Seiten Illustrationen, Diagramme 21 cm x 14.8 cm, 239 g txt rdacontent n rdamedia nc rdacarrier Berichte aus der Elektrotechnik Dissertation Technische Universität Dortmund 2024 Feldeffekttransistor (DE-588)4131472-4 gnd rswk-swf Leistungshalbleiter (DE-588)4167286-0 gnd rswk-swf MOS-FET (DE-588)4207266-9 gnd rswk-swf Power Electronics Condition Monitoring Elektrotechnilk (DE-588)4113937-9 Hochschulschrift gnd-content MOS-FET (DE-588)4207266-9 s Feldeffekttransistor (DE-588)4131472-4 s Leistungshalbleiter (DE-588)4167286-0 s DE-604 Shaker Verlag (DE-588)1064118135 pbl |
spellingShingle | Jahn, Nils 1994- Thermal onboard detection of power semiconductor interconnection faults Feldeffekttransistor (DE-588)4131472-4 gnd Leistungshalbleiter (DE-588)4167286-0 gnd MOS-FET (DE-588)4207266-9 gnd |
subject_GND | (DE-588)4131472-4 (DE-588)4167286-0 (DE-588)4207266-9 (DE-588)4113937-9 |
title | Thermal onboard detection of power semiconductor interconnection faults |
title_auth | Thermal onboard detection of power semiconductor interconnection faults |
title_exact_search | Thermal onboard detection of power semiconductor interconnection faults |
title_full | Thermal onboard detection of power semiconductor interconnection faults Nils Jahn |
title_fullStr | Thermal onboard detection of power semiconductor interconnection faults Nils Jahn |
title_full_unstemmed | Thermal onboard detection of power semiconductor interconnection faults Nils Jahn |
title_short | Thermal onboard detection of power semiconductor interconnection faults |
title_sort | thermal onboard detection of power semiconductor interconnection faults |
topic | Feldeffekttransistor (DE-588)4131472-4 gnd Leistungshalbleiter (DE-588)4167286-0 gnd MOS-FET (DE-588)4207266-9 gnd |
topic_facet | Feldeffekttransistor Leistungshalbleiter MOS-FET Hochschulschrift |
work_keys_str_mv | AT jahnnils thermalonboarddetectionofpowersemiconductorinterconnectionfaults AT shakerverlag thermalonboarddetectionofpowersemiconductorinterconnectionfaults |