Reliability Prediction for Microelectronics:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Newark
John Wiley & Sons, Incorporated
2024
|
| Ausgabe: | 1st ed |
| Schriftenreihe: | Quality and Reliability Engineering Series
|
| Online-Zugang: | DE-91 |
| Beschreibung: | Description based on publisher supplied metadata and other sources |
| Beschreibung: | 1 Online-Ressource (186 pages) Illustrationen |
| ISBN: | 9781394210947 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV049830468 | ||
| 003 | DE-604 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 240823s2024 |||| o||u| ||||||eng d | ||
| 020 | |a 9781394210947 |9 978-1-394-21094-7 | ||
| 035 | |a (ZDB-30-PQE)EBC31151561 | ||
| 035 | |a (ZDB-30-PAD)EBC31151561 | ||
| 035 | |a (ZDB-89-EBL)EBL31151561 | ||
| 035 | |a (OCoLC)1422229439 | ||
| 035 | |a (DE-599)BVBBV049830468 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-91 | ||
| 082 | 0 | |a 621.381 | |
| 100 | 1 | |a Bernstein, Joseph B. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Reliability Prediction for Microelectronics |
| 250 | |a 1st ed | ||
| 264 | 1 | |a Newark |b John Wiley & Sons, Incorporated |c 2024 | |
| 264 | 4 | |c ©2024 | |
| 300 | |a 1 Online-Ressource (186 pages) |b Illustrationen | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Quality and Reliability Engineering Series | |
| 500 | |a Description based on publisher supplied metadata and other sources | ||
| 700 | 1 | |a Bensoussan, Alain |e Sonstige |4 oth | |
| 700 | 1 | |a Bender, Emmanuel |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a Bernstein, Joseph B. |t Reliability Prediction for Microelectronics |d Newark : John Wiley & Sons, Incorporated,c2024 |z 9781394210930 |
| 912 | |a ZDB-30-PQE | ||
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-035170446 | |
| 966 | e | |u https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=31151561 |l DE-91 |p ZDB-30-PQE |q TUM_PDA_PQE |x Aggregator |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1808228495602483200 |
|---|---|
| adam_text | |
| any_adam_object | |
| author | Bernstein, Joseph B. |
| author_facet | Bernstein, Joseph B. |
| author_role | aut |
| author_sort | Bernstein, Joseph B. |
| author_variant | j b b jb jbb |
| building | Verbundindex |
| bvnumber | BV049830468 |
| collection | ZDB-30-PQE |
| ctrlnum | (ZDB-30-PQE)EBC31151561 (ZDB-30-PAD)EBC31151561 (ZDB-89-EBL)EBL31151561 (OCoLC)1422229439 (DE-599)BVBBV049830468 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1st ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV049830468</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">240823s2024 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781394210947</subfield><subfield code="9">978-1-394-21094-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PQE)EBC31151561</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-30-PAD)EBC31151561</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-89-EBL)EBL31151561</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1422229439</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV049830468</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Bernstein, Joseph B.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability Prediction for Microelectronics</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Newark</subfield><subfield code="b">John Wiley & Sons, Incorporated</subfield><subfield code="c">2024</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">©2024</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (186 pages)</subfield><subfield code="b">Illustrationen</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Quality and Reliability Engineering Series</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Description based on publisher supplied metadata and other sources</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bensoussan, Alain</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bender, Emmanuel</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">Bernstein, Joseph B.</subfield><subfield code="t">Reliability Prediction for Microelectronics</subfield><subfield code="d">Newark : John Wiley & Sons, Incorporated,c2024</subfield><subfield code="z">9781394210930</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-30-PQE</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-035170446</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://ebookcentral.proquest.com/lib/munchentech/detail.action?docID=31151561</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-30-PQE</subfield><subfield code="q">TUM_PDA_PQE</subfield><subfield code="x">Aggregator</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV049830468 |
| illustrated | Not Illustrated |
| indexdate | 2024-08-24T00:57:53Z |
| institution | BVB |
| isbn | 9781394210947 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-035170446 |
| oclc_num | 1422229439 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | 1 Online-Ressource (186 pages) Illustrationen |
| psigel | ZDB-30-PQE ZDB-30-PQE TUM_PDA_PQE |
| publishDate | 2024 |
| publishDateSearch | 2024 |
| publishDateSort | 2024 |
| publisher | John Wiley & Sons, Incorporated |
| record_format | marc |
| series2 | Quality and Reliability Engineering Series |
| spelling | Bernstein, Joseph B. Verfasser aut Reliability Prediction for Microelectronics 1st ed Newark John Wiley & Sons, Incorporated 2024 ©2024 1 Online-Ressource (186 pages) Illustrationen txt rdacontent c rdamedia cr rdacarrier Quality and Reliability Engineering Series Description based on publisher supplied metadata and other sources Bensoussan, Alain Sonstige oth Bender, Emmanuel Sonstige oth Erscheint auch als Druck-Ausgabe Bernstein, Joseph B. Reliability Prediction for Microelectronics Newark : John Wiley & Sons, Incorporated,c2024 9781394210930 |
| spellingShingle | Bernstein, Joseph B. Reliability Prediction for Microelectronics |
| title | Reliability Prediction for Microelectronics |
| title_auth | Reliability Prediction for Microelectronics |
| title_exact_search | Reliability Prediction for Microelectronics |
| title_full | Reliability Prediction for Microelectronics |
| title_fullStr | Reliability Prediction for Microelectronics |
| title_full_unstemmed | Reliability Prediction for Microelectronics |
| title_short | Reliability Prediction for Microelectronics |
| title_sort | reliability prediction for microelectronics |
| work_keys_str_mv | AT bernsteinjosephb reliabilitypredictionformicroelectronics AT bensoussanalain reliabilitypredictionformicroelectronics AT benderemmanuel reliabilitypredictionformicroelectronics |