Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40
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| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer International Publishing
2024
Cham Springer |
| Ausgabe: | 1st ed. 2024 |
| Schlagworte: | |
| Online-Zugang: | DE-B768 DE-634 DE-1043 DE-1046 DE-Aug4 DE-1050 DE-573 DE-M347 DE-92 DE-898 DE-859 DE-860 DE-861 DE-863 DE-862 DE-523 DE-91 DE-706 DE-29 Volltext |
| Beschreibung: | 1 Online-Ressource (XIII, 403 p. 196 illus., 171 illus. in color) |
| ISBN: | 9783031593611 |
| DOI: | 10.1007/978-3-031-59361-1 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV049818878 | ||
| 003 | DE-604 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 240813s2024 |||| o||u| ||||||eng d | ||
| 020 | |a 9783031593611 |c Online |9 978-3-031-59361-1 | ||
| 024 | 7 | |a 10.1007/978-3-031-59361-1 |2 doi | |
| 035 | |a (ZDB-2-ENG)9783031593611 | ||
| 035 | |a (OCoLC)1454747264 | ||
| 035 | |a (DE-599)BVBBV049818878 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-B768 |a DE-860 |a DE-523 |a DE-1043 |a DE-91 |a DE-859 |a DE-92 |a DE-Aug4 |a DE-634 |a DE-898 |a DE-1050 |a DE-573 |a DE-863 |a DE-1046 |a DE-M347 |a DE-861 |a DE-706 |a DE-862 |a DE-29 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 084 | |a ELT 000 |2 stub | ||
| 084 | |a MAS 000 |2 stub | ||
| 245 | 1 | 0 | |a Recent Advances in Microelectronics Reliability |b Contributions from the European ECSEL JU project iRel40 |c edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk |
| 250 | |a 1st ed. 2024 | ||
| 264 | 1 | |a Cham |b Springer International Publishing |c 2024 | |
| 264 | 1 | |a Cham |b Springer | |
| 300 | |a 1 Online-Ressource (XIII, 403 p. 196 illus., 171 illus. in color) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Electronic Circuits and Systems | |
| 650 | 4 | |a Electronics Design and Verification | |
| 650 | 4 | |a Electronic Devices | |
| 650 | 4 | |a Electronic circuits | |
| 650 | 4 | |a Electronic circuit design | |
| 650 | 4 | |a Solid state physics | |
| 700 | 1 | |a van Driel, Willem Dirk |4 edt | |
| 700 | 1 | |a Pressel, Klaus |4 edt | |
| 700 | 1 | |a Soyturk, Mujdat |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-59360-4 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-59362-8 |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-031-59363-5 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-031-59361-1 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_2024 | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-035159116 | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-B768 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-634 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-1043 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-1046 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-Aug4 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-1050 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-573 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-M347 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-92 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-898 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-859 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-860 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-861 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-863 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-862 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-523 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-91 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-706 |p ZDB-2-ENG |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-3-031-59361-1 |l DE-29 |p ZDB-2-ENG |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1809773987387932672 |
|---|---|
| adam_text | |
| any_adam_object | |
| author2 | van Driel, Willem Dirk Pressel, Klaus Soyturk, Mujdat |
| author2_role | edt edt edt |
| author2_variant | d w d v dwd dwdv k p kp m s ms |
| author_facet | van Driel, Willem Dirk Pressel, Klaus Soyturk, Mujdat |
| building | Verbundindex |
| bvnumber | BV049818878 |
| classification_tum | ELT 000 MAS 000 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)9783031593611 (OCoLC)1454747264 (DE-599)BVBBV049818878 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/978-3-031-59361-1 |
| edition | 1st ed. 2024 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nmm a2200000zc 4500</leader><controlfield tag="001">BV049818878</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">240813s2024 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783031593611</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-031-59361-1</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-031-59361-1</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9783031593611</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1454747264</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV049818878</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-B768</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-29</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Recent Advances in Microelectronics Reliability</subfield><subfield code="b">Contributions from the European ECSEL JU project iRel40</subfield><subfield code="c">edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2024</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2024</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIII, 403 p. 196 illus., 171 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics Design and Verification</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuit design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Solid state physics</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">van Driel, Willem Dirk</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Pressel, Klaus</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Soyturk, Mujdat</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-59360-4</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-59362-8</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-031-59363-5</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2024</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-035159116</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-B768</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-634</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-1043</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-1046</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-Aug4</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-1050</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-573</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-M347</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-92</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-898</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-859</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-860</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-861</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-863</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-862</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-523</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-91</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-706</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-031-59361-1</subfield><subfield code="l">DE-29</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV049818878 |
| illustrated | Not Illustrated |
| indexdate | 2024-09-10T04:22:50Z |
| institution | BVB |
| isbn | 9783031593611 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-035159116 |
| oclc_num | 1454747264 |
| open_access_boolean | |
| owner | DE-B768 DE-860 DE-523 DE-1043 DE-91 DE-BY-TUM DE-859 DE-92 DE-Aug4 DE-634 DE-898 DE-BY-UBR DE-1050 DE-573 DE-863 DE-BY-FWS DE-1046 DE-M347 DE-861 DE-706 DE-862 DE-BY-FWS DE-29 |
| owner_facet | DE-B768 DE-860 DE-523 DE-1043 DE-91 DE-BY-TUM DE-859 DE-92 DE-Aug4 DE-634 DE-898 DE-BY-UBR DE-1050 DE-573 DE-863 DE-BY-FWS DE-1046 DE-M347 DE-861 DE-706 DE-862 DE-BY-FWS DE-29 |
| physical | 1 Online-Ressource (XIII, 403 p. 196 illus., 171 illus. in color) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2024 |
| publishDate | 2024 |
| publishDateSearch | 2024 |
| publishDateSort | 2024 |
| publisher | Springer International Publishing Springer |
| record_format | marc |
| spellingShingle | Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 Electronic Circuits and Systems Electronics Design and Verification Electronic Devices Electronic circuits Electronic circuit design Solid state physics |
| title | Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 |
| title_auth | Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 |
| title_exact_search | Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 |
| title_full | Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk |
| title_fullStr | Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk |
| title_full_unstemmed | Recent Advances in Microelectronics Reliability Contributions from the European ECSEL JU project iRel40 edited by Willem Dirk van Driel, Klaus Pressel, Mujdat Soyturk |
| title_short | Recent Advances in Microelectronics Reliability |
| title_sort | recent advances in microelectronics reliability contributions from the european ecsel ju project irel40 |
| title_sub | Contributions from the European ECSEL JU project iRel40 |
| topic | Electronic Circuits and Systems Electronics Design and Verification Electronic Devices Electronic circuits Electronic circuit design Solid state physics |
| topic_facet | Electronic Circuits and Systems Electronics Design and Verification Electronic Devices Electronic circuits Electronic circuit design Solid state physics |
| url | https://doi.org/10.1007/978-3-031-59361-1 |
| work_keys_str_mv | AT vandrielwillemdirk recentadvancesinmicroelectronicsreliabilitycontributionsfromtheeuropeanecseljuprojectirel40 AT presselklaus recentadvancesinmicroelectronicsreliabilitycontributionsfromtheeuropeanecseljuprojectirel40 AT soyturkmujdat recentadvancesinmicroelectronicsreliabilitycontributionsfromtheeuropeanecseljuprojectirel40 |