Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals: Experiments and Simulations
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Cham
Springer Nature Switzerland
2024
Cham Springer |
Ausgabe: | 1st ed. 2024 |
Schriftenreihe: | SpringerBriefs in Materials
|
Schlagworte: | |
Online-Zugang: | DE-634 DE-1028 DE-1050 Volltext |
Beschreibung: | 1 Online-Ressource (XIX, 115 p. 55 illus., 23 illus. in color) |
ISBN: | 9783031588501 |
ISSN: | 2192-1105 |
DOI: | 10.1007/978-3-031-58850-1 |
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Datensatz im Suchindex
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adam_text | |
any_adam_object | |
author | Sharopov, Utkirjon |
author_facet | Sharopov, Utkirjon |
author_role | aut |
author_sort | Sharopov, Utkirjon |
author_variant | u s us |
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bvnumber | BV049725249 |
classification_tum | CHE 000 |
collection | ZDB-2-CMS |
ctrlnum | (ZDB-2-CMS)9783031588501 (OCoLC)1437846508 (DE-599)BVBBV049725249 |
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dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 537 - Electricity and electronics |
dewey-raw | 537,622 |
dewey-search | 537,622 |
dewey-sort | 3537 3622 |
dewey-tens | 530 - Physics |
discipline | Physik Chemie |
doi_str_mv | 10.1007/978-3-031-58850-1 |
edition | 1st ed. 2024 |
format | Electronic eBook |
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id | DE-604.BV049725249 |
illustrated | Not Illustrated |
indexdate | 2024-07-20T07:34:53Z |
institution | BVB |
isbn | 9783031588501 |
issn | 2192-1105 |
language | English |
oclc_num | 1437846508 |
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owner | DE-1050 DE-1028 DE-634 |
owner_facet | DE-1050 DE-1028 DE-634 |
physical | 1 Online-Ressource (XIX, 115 p. 55 illus., 23 illus. in color) |
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publisher | Springer Nature Switzerland Springer |
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series2 | SpringerBriefs in Materials |
spelling | Sharopov, Utkirjon Verfasser aut Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations by Utkirjon Sharopov 1st ed. 2024 Cham Springer Nature Switzerland 2024 Cham Springer 1 Online-Ressource (XIX, 115 p. 55 illus., 23 illus. in color) txt rdacontent c rdamedia cr rdacarrier SpringerBriefs in Materials 2192-1105 Semiconductors Surfaces, Interfaces and Thin Film Characterization and Analytical Technique Materials for Energy and Catalysis Surfaces (Technology) Thin films Materials / Analysis Materials Catalysis Force and energy Erscheint auch als Druck-Ausgabe 978-3-031-58849-5 Erscheint auch als Druck-Ausgabe 978-3-031-58851-8 https://doi.org/10.1007/978-3-031-58850-1 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Sharopov, Utkirjon Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations Semiconductors Surfaces, Interfaces and Thin Film Characterization and Analytical Technique Materials for Energy and Catalysis Surfaces (Technology) Thin films Materials / Analysis Materials Catalysis Force and energy |
title | Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations |
title_auth | Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations |
title_exact_search | Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations |
title_full | Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations by Utkirjon Sharopov |
title_fullStr | Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations by Utkirjon Sharopov |
title_full_unstemmed | Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals Experiments and Simulations by Utkirjon Sharopov |
title_short | Surface Defects in Wide-Bandgap LiF, SiO2, and ZnO Crystals |
title_sort | surface defects in wide bandgap lif sio2 and zno crystals experiments and simulations |
title_sub | Experiments and Simulations |
topic | Semiconductors Surfaces, Interfaces and Thin Film Characterization and Analytical Technique Materials for Energy and Catalysis Surfaces (Technology) Thin films Materials / Analysis Materials Catalysis Force and energy |
topic_facet | Semiconductors Surfaces, Interfaces and Thin Film Characterization and Analytical Technique Materials for Energy and Catalysis Surfaces (Technology) Thin films Materials / Analysis Materials Catalysis Force and energy |
url | https://doi.org/10.1007/978-3-031-58850-1 |
work_keys_str_mv | AT sharopovutkirjon surfacedefectsinwidebandgaplifsio2andznocrystalsexperimentsandsimulations |